Abstract:
The present disclosure relates to a content addressable memory (CAM), and more particularly, to an algorithmic ternary content addressable memory (TCAM) that instantiates multiple copies of X-Y TCAMs. The structure includes a content addressable memory (CAM) and an array which instantiates multiple replicated copies of the CAM in a row direction and a column direction of the array.
Abstract:
Disclosed is a method wherein selective voltage binning and leakage power screening of integrated circuit (IC) chips are performed. Additionally, pre-test power-optimized bin reassignments are made on a chip-by-chip basis. Specifically, a leakage power measurement of an IC chip selected from a voltage bin can is compared to a bin-specific leakage power screen value of the next slower voltage bin. If the leakage power measurement is higher, the IC chip will be left in the voltage bin to which it is currently assigned. If the leakage power measurement is lower, the IC chip will be reassigned to that next slower voltage bin. These processes can be iteratively repeated until no slower voltage bins are available or the IC chip cannot be reassigned. IC chips can subsequently be tested according to testing parameters, including the minimum test voltages, associated with the voltage bins to which they are finally assigned.
Abstract:
Approaches for an integrated circuit ternary content addressable memory (TCAM) are provided. A system includes an array of XY TCAM cells and respective translation circuits connected to respective pairs of the XY TCAM cells. The system also includes a memory controller structured to provide control signals to the respective translation circuits. The memory controller and respective translation circuits are structured to control the array of XY TCAM cells to perform single cycle update and single cycle search operations.
Abstract:
The present disclosure relates to a structure including a first delay path circuit which is configured to receive an input signal and is connected to a complement transistor of a twin cell transistor pair through a complement bitline signal, a second delay path circuit which is configured to receive the input signal and is connected to a true transistor of the twin cell transistor pair through a true bitline signal, and a logic circuit which is configured to receive a first output of the first delay path circuit and a second output of the second delay path circuit and output a data output signal.
Abstract:
Systems and methods for optimizing timing/power risk SVB using a customer-supplied, non-linear voltage slope. Chips are manufactured according to an integrated circuit design. The minimum operating voltage and hardware variations for each device in the design is determined and a process distribution for the chips is divided into process windows. Vmax and Vmin to support system frequency are determined for each process window. Vmin vs. process-bin mean and sigma sensitivity is calculated using information about specific devices. The voltage for each process window that generates Vmin for specific devices is identified. Power at the slow end and fast end of each process window is evaluated using the voltage to support system frequency. Pmax is determined. Vmax for each process window that generates Pmax is determined. A voltage is identified between Vmin and Vmax that maximizes the timing margin for system frequency while minimizing risk for Pmax. The chips are sorted into different process windows, based on the voltage identified.
Abstract:
Words of data are maintained in content-addressable memory cells arranged in rows. Two of the rows are timing reference rows, and the remainder of the rows are data rows that maintain the words of data. The data rows form individual matchlines. A first of the reference rows forms a precharge reference matchline, and a second of the reference rows forms an evaluation reference matchline. The timing for the individual matchlines to precharge is based on the time to precharge the precharge reference matchline, and timing for the individual matchlines to evaluate a search word is based on the time for the evaluation reference matchline to evaluate the search word.
Abstract:
The present disclosure relates to content addressable memories (CAM), and more particularly, to a searchable CAM structure having self-reference matchline precharge and local feedback control and method of use. The present disclosure includes a structure which includes: a sense line connected to a sensing device; a feedback line connected to the sense line at a tap point between a first end and a second end of the sense line; and a local precharge controller connected to the tap point by the feedback line to control precharging of the sense line according to a state of the feedback line.
Abstract:
The present disclosure relates to semiconductor structures and, more particularly, to sensing circuit for a memory and methods of use. The memory includes a self-referenced sense amp that is structured to calibrate its individual pre-charge based on a trip-point, with autonomous pre-charge activation circuitry that starts pre-charging a sense-line on each unique entry as soon as a sense has been performed or completed.
Abstract:
The present disclosure relates to a content addressable memory (CAM), and more particularly, to an algorithmic ternary content addressable memory (TCAM) that instantiates multiple copies of X-Y TCAMs. The structure includes a content addressable memory (CAM) and an array which instantiates multiple replicated copies of the CAM in a row direction and a column direction of the array.
Abstract:
The present disclosure relates to memory structures and, more particularly, to double bandwidth algorithmic memory array structures and methods of use. The memory array includes: a plurality of memory banks each of which includes addressable storage units; a redundant array of independent disks (RAID) bank which stores parity bits corresponding to data written into any of the plurality of memory banks at a same address; and a plurality of XOR gates in which data written into any of the plurality of memory banks is cascaded therethrough to refresh the parity bits in the RAID bank.