Abstract:
The invention relates to the internal exhaust-gas recirculation in an internal combustion engine with gas exchange valves periodically controlled by a camshaft (22) in accordance with the four-stroke principle, in which, during the gas exchange exhausting of exhaust gas from the respective cylinder (1) into the exhaust duct (5), an intake valve (2) associated with the respective cylinder (1) is open in a crank angle range after top dead center of the ignition of the gas mixture present in the cylinder (1), in order to exhaust part of the exhaust gas into an intake duct (3), so that during the next gas exchange intake both fresh gas and exhaust gas are taken in from the intake duct (3), the respective intake valve (2) being actuated during the gas exchange exhausting independently of the periodic gas exchange intake, and the additional opening of the respective intake valve (2) being carried out in the range from 110 to 150% of the opening angle of the start of opening of the exhaust duct (5) by the exhaust valve (4).
Abstract:
A circuit configuration for generating control signals for testing high-frequency synchronous digital circuits, especially memory chips, is described. A p-stage shift register which is clocked at a clock frequency corresponding to the high clock frequency of the digital circuit to be tested has connected to its parallel loading inputs p logical gates which logically combine a static control word with a dynamic n-position test word. The combined logical value is loaded into the shift register at a low-frequency loading clock rate so that a control signal, the value of which depends on the information loaded into the shift register in each clock cycle of the clock frequency of the latter is generated at the serial output of the shift register.
Abstract:
A connection element in an integrated circuit having a layer structure disposed between two conductive structures. The layer structure is formed by an insulating layer, which can be destroyed by application of a predetermined voltage, and a silicon layer. The insulating layer adjoins a first conductive structure made of tungsten.
Abstract:
A motor vehicle brake system having a hydraulic cable, via which a wheel brake module can be pressurized by a brake medium using brake pressure from a brake cylinder and to which a low pressure accumulator is connected for temporarily receiving excess brake medium, wherein the low pressure accumulator is connected to the hydraulic cable via a backflow line and a return pump interposed in the return line in order to return temporarily stored brake medium, the return pump being cyclically actuated for adjusting the pump capacity such that an activation occurs within each braking cycle during a portion of pump cycles that corresponds to the pump capacity, is intended to provide particularly high operational safety while also providing a comfortable pedal sensation.
Abstract:
The invention relates to an illuminating device for microscopes, wherein the light source has, in particular, a white light illumination having total daylight spectrum and/or an excitation light source for fluorescent colors. The inventive illuminating device for a microscope consists of surface or spatially arranged light sources, which are connected to a control unit for generating any desired illuminating patterns and illuminating spectrums, and an illuminating optic to image these illuminating patterns on the object to be examined. The light sources consist of LEDs (11) which excite at least one luminescence color (14) which is adapted to the wavelength which is emitted by the LEDs (11). The LEDs (11) are arranged concentrically to the optical axis of the illuminating device, preferably, in or in the vicinity of the aperture diaphragm plane. The microscope illumination enables realization of flexible illumination structures and illumination spectrums for bright field, dark field, fluorescence, inclined and/or annularly-shaped illumination, and also white light illuminations having total daylight spectrum. Due to the advantages of the LEDs (economical, low power consumption, long service life and easy to control), such illumination devices are particularly suitable for use in the field, for example, in archaeology, geology and in protecting the environment.
Abstract:
A correction method in which characteristic curves and/or correction values are produced, by way of which the drive current for one or more electrically activated hydraulic values operated in an analog fashion is measured during a pressure regulation in such a way that, during the operation of an anti-lock regulation, one or a respective characteristic curve is first prescribed and then the prescribed characteristic curve is corrected, particularly in a learning process, wherein, after a pressure build-up phase, the current pressure model value (Pmod) is compared to and/or analyzed using a model locking pressure level (Pmax).
Abstract:
A system and a method for testing fast synchronous digital circuit with an additional built outside self test semiconductor chip disposed between a test device and circuit under test. The chip has a switching/detection unit that tests the chip based on external criteria between a first normal operating mode in which the chip tests the circuit to be tested, and a second operating mode in which programmable registers of the register unit of a receiver of the chip are programmed by the external test device. The registers store constants and variables for generating the test signals and for evaluating them. The chip generates test signals and transceiver for sending the test signals and receiving response signals generated thereby.
Abstract:
A method and a configuration for driving one-time operable isolation elements on a semiconductor chip store an item of isolation information for each isolation element to be operated on the chip. In which case, as soon as the isolation information item is present for an isolation element, a one-time operation on the isolation element is begun.
Abstract:
The novel address counter can be used in combination with an existing test unit—serving for testing digital circuits—for addressing synchronous high-frequency digital circuits, in particular fast memory devices. Address offset values are provided in programmable offset registers, with a multiplexer circuit and a selection and combination circuit, on the basis of input signals which are fed in at low frequency and in parallel by the test unit. Simple address changes and address jumps can be realized at a high clock frequency in a very flexible manner.
Abstract:
A test configuration for testing a plurality of integrated circuits, in particular fast semiconductor memory modules located on a wafer, in parallel. The test configuration includes a carrier board for bringing up electrical signal lines belonging to a test system, contact-making needles for producing electrical connections with contact areas on the circuits to be tested, and a plurality of active modules that are arranged on the carrier board. The active modules are each assigned to one of the circuits to be tested in parallel, and are each case inserted into the signal path between the test system and the associated circuit to be tested. In a preferred embodiment, the active modules are arranged at least partly overlapping, based on a direction at right angles to the plane of the carrier board.