-
11.
公开(公告)号:US20230402087A1
公开(公告)日:2023-12-14
申请号:US18239140
申请日:2023-08-29
Applicant: Kioxia Corporation
Inventor: Hiroshi MAEJIMA
IPC: G11C11/4091 , G11C11/4094 , G11C5/06 , G11C11/4074 , G11C11/408 , G11C16/24 , G11C16/26 , G11C16/04
CPC classification number: G11C11/4091 , G11C11/4094 , G11C5/06 , G11C11/4074 , G11C11/4085 , G11C16/24 , G11C16/26 , G11C16/0483 , G11C5/063 , H10B43/10
Abstract: A memory device includes a first memory cell provided above a substrate; a first bit line coupled to the first memory cell and extending in a first direction; a first sense amplifier configured to sense a voltage of the first bit line; a second memory cell provided above the substrate; a second bit line adjacent to the first bit line and extending in the first direction, the second bit line being coupled to the second memory cell; a second sense amplifier configured to sense a voltage of the second bit line; and a third memory cell provided above the substrate. A third bit line not adjacent to the second bit line extends in the first direction, and is coupled to the third memory cell; and a third sense amplifier is configured to sense a voltage of the third bit line. The first and second sense amplifiers belong to a first sense amplifier group, are adjacent to each other and are arranged in a second direction intersecting the first direction. The third sense amplifier belongs to a second sense amplifier group. The first and second sense amplifier groups are adjacent to each other and are arranged in the first direction.
-
12.
公开(公告)号:US20230165010A1
公开(公告)日:2023-05-25
申请号:US18100615
申请日:2023-01-24
Applicant: Kioxia Corporation
Inventor: Naohito MOROZUMI , Hiroshi MAEJIMA
IPC: H10B43/40 , G11C16/16 , G11C16/26 , G11C16/08 , G11C16/24 , H01L23/00 , G11C7/06 , H10B43/10 , H10B43/35
CPC classification number: H10B43/40 , G11C16/16 , G11C16/26 , G11C16/08 , G11C16/24 , H01L24/20 , H01L24/05 , G11C7/06 , H10B43/10 , H10B43/35 , H01L2924/1438
Abstract: A semiconductor memory device including a substrate having a first region and a second region; a plurality of first transistors provided in the first region; a plurality of second transistors provided in the second region, the plurality of second transistors being electrically coupled to the plurality of first transistors, respectively, and a breakdown-voltage of the second transistor being lower than a breakdown-voltage of the first transistor. A plurality of joint metals are provided above the first region, the plurality of joint metals being electrically coupled to the plurality of first transistors, respectively. A plurality of bit lines are provided in an upper layer of the plurality of joint metals, the plurality of bit lines being coupled to the plurality of joint metals, respectively; and a plurality of memory cells are provided in an upper layer of the plurality of bit lines, the plurality of memory cells being coupled to the plurality of bit lines, respectively.
-
公开(公告)号:US20230074030A1
公开(公告)日:2023-03-09
申请号:US17984959
申请日:2022-11-10
Applicant: KIOXIA CORPORATION
Inventor: Hiroshi MAEJIMA , Toshifumi HASHIMOTO , Takashi MAEDA , Masumi SAITOH , Tetsuaki UTSUMI
IPC: H01L25/065 , H01L25/18 , H01L23/00
Abstract: A semiconductor memory device includes a memory chip. The memory chip includes a first region including a plurality of first memory cells and second memory cells, a second region different from the first region, a plurality of first word lines stacked apart from each other in a first direction in the first and second regions, a first pillar including a first semiconductor layer extending through the first word lines, and a first insulator layer provided between the first semiconductor layer and the first word lines, in the first region, the first memory cells being located at intersections of the first pillar with the first word lines, a first bonding pad in the second region, and a first transistor between the first word lines and the first bonding pad, and connected between one of the first word lines and the first bonding pad, in the second region.
-
公开(公告)号:US20220036951A1
公开(公告)日:2022-02-03
申请号:US17502573
申请日:2021-10-15
Applicant: KIOXIA CORPORATION
Inventor: Hiroshi MAEJIMA
Abstract: A semiconductor memory device includes a memory cell array having memory strings that include memory cells and first and second selection transistors. During a read operation, a controller applies a first voltage higher than ground to a source line, and a second voltage to a first and second selection gate lines that are connected to a selected memory string. The second voltage is also applied to the first selection gate lines connected to non-selected memory strings during a first period of the read operation. A third voltage higher than ground and lower than the second voltage is applied to the first selection gate lines connected to non-selected memory strings during a second period of the read operation subsequent to the first period.
-
公开(公告)号:US20210158876A1
公开(公告)日:2021-05-27
申请号:US17016580
申请日:2020-09-10
Applicant: Kioxia Corporation
Inventor: Hiroshi MAEJIMA , Hidehiro SHIGA , Masaki KONDO
IPC: G11C16/26 , H01L27/11556 , H01L27/11582 , G11C16/04 , G11C16/34
Abstract: A semiconductor memory device includes separate first and second word lines respectively facing first and second portions of a semiconductor and sandwiching the semiconductor; and first and second cell transistors respectively located in the first and second portions and respectively coupled to the first and second word lines. In a first operation, a first read is executed on the second cell transistor while a first voltage and a higher second voltage are being respectively applied to the first and second word lines. In a second operation, a second read is executed on the first cell transistor while a third voltage between the first and second voltages is being applied to the second word line.
-
公开(公告)号:US20200335513A1
公开(公告)日:2020-10-22
申请号:US16795763
申请日:2020-02-20
Applicant: KIOXIA CORPORATION
Inventor: Naohito MOROZUMI , Hiroshi MAEJIMA
IPC: H01L27/11573 , H01L27/11565 , H01L27/1157 , G11C16/16 , G11C16/26 , G11C7/06 , G11C16/08 , G11C16/24 , H01L23/00
Abstract: A semiconductor memory device according to an embodiment includes a memory chip and a circuit chip. The memory chip includes first and second joint metals. The circuit chip includes first and second sense amplifiers, and third and fourth joint metals facing the first and second joint metals, respectively. The first sense amplifier includes first and second active regions. The first active region includes a first transistor coupled between the third joint metal and the second active region. The second amplifier includes third and fourth active region. The third active region includes a second transistor coupled between the fourth joint metal and the fourth active region. The third and fourth joint metals overlap the first and third active regions, respectively.
-
公开(公告)号:US20240304602A1
公开(公告)日:2024-09-12
申请号:US18669679
申请日:2024-05-21
Applicant: KIOXIA CORPORATION
Inventor: Tomoya SANUKI , Hiroshi MAEJIMA , Tetsuaki UTSUMI
IPC: H01L25/065 , H01L23/00 , H01L25/18
CPC classification number: H01L25/0657 , H01L24/08 , H01L25/18 , H01L2224/08145 , H01L2225/06524 , H01L2225/06593 , H01L2225/06596 , H01L2924/1431 , H01L2924/14511
Abstract: According to one embodiment, a semiconductor memory device includes a memory cell, a first voltage generator and a second voltage generator. The memory cell is provided above a substrate. The first voltage generator is provided between the substrate and the memory cell. The first voltage generator is configured to generate a first voltage to be supplied to the memory cell. The second voltage generator is provided between the substrate and the memory cell. The second voltage generator is configured to generate the first voltage and have a circuit configuration equivalent to the first voltage generator.
-
公开(公告)号:US20240296888A1
公开(公告)日:2024-09-05
申请号:US18653785
申请日:2024-05-02
Applicant: Kioxia Corporation
Inventor: Hiroshi MAEJIMA
IPC: G11C16/04 , G11C5/06 , G11C7/06 , G11C16/08 , G11C16/26 , H01L23/522 , H01L23/528 , H10B43/10 , H10B43/27 , H10B43/35 , H10B43/40
CPC classification number: G11C16/0483 , G11C5/063 , G11C7/06 , G11C16/08 , G11C16/26 , H01L23/5226 , H01L23/528 , H10B43/10 , H10B43/27 , H10B43/35 , H10B43/40
Abstract: A semiconductor storage device includes word lines extending in first and second directions, and separated from each other in a third direction, sense amplifier circuits that partially overlap the word lines in the third direction, memory strings intersecting the word lines and extending in the third direction, memory-side bit lines extending in the first direction, separated from each other in the second direction, and including first and second adjacent memory-side bit lines, circuit-side bit lines between the word lines and the sense amplifier circuits and partially overlapping the respective memory-side bit lines in the third direction, and contact plugs extending in the third direction and respectively connecting the memory-side bit lines and the circuit-side bit lines. The contact plugs include first and second contract plugs that are electrically connected to the first and second memory-side bit lines, respectively, and are not aligned along the first or second direction.
-
公开(公告)号:US20240257883A1
公开(公告)日:2024-08-01
申请号:US18336043
申请日:2023-06-16
Applicant: Kioxia Corporation
Inventor: Hiroshi MAEJIMA
CPC classification number: G11C16/26 , G11C16/0483 , G11C16/08 , H01L24/08 , H01L25/0657 , H01L25/18 , H10B80/00 , H01L2224/08145 , H01L2924/1431 , H01L2924/14511
Abstract: According to one embodiment, a memory device includes a substrate, a memory layer, and a circuit layer. The memory layer includes first to third regions arranged in a first direction. The circuit layer includes first and second transfer regions, and first and second sense amplifier regions. The first and second transfer regions are shifted in the first direction and arranged in a second direction. In a third direction, the first sense amplifier region overlaps the first region, and the second sense amplifier region overlaps the second region. The first sense amplifier region and the first transfer region are arranged in the first direction, and the second sense amplifier region and the second transfer region are arranged in the first direction.
-
公开(公告)号:US20230032500A1
公开(公告)日:2023-02-02
申请号:US17962302
申请日:2022-10-07
Applicant: KIOXIA CORPORATION
Inventor: Hiroshi MAEJIMA
Abstract: A semiconductor storage device includes memory cells, select transistors, memory strings, first and second blocks, word lines, and select gate lines. In the memory string, the current paths of plural memory cells are connected in series. When data are written in a first block, after a select gate line connected to the gate of a select transistor of one of the memory strings in the first block is selected, the data are sequentially written in the memory cells in the memory string connected to the selected select gate line. When data are written in the second block, after a word line connected to the control gates of memory cells of different memory strings in the second block is selected, the data are sequentially written in the memory cells of the different memory strings in the second block which have their control gates connected to the selected word line.
-
-
-
-
-
-
-
-
-