Detector device, inspection apparatus and method
    11.
    发明授权
    Detector device, inspection apparatus and method 有权
    检测装置,检测装置及方法

    公开(公告)号:US09086361B2

    公开(公告)日:2015-07-21

    申请号:US13581427

    申请日:2011-03-11

    CPC classification number: G01N23/087

    Abstract: A detector device is described comprising an x-ray detector structure having a detection surface defining at least one separately addressable region for detecting incident x-ray radiation intensity thereon, wherein the separately addressable region is divided into a plurality of sub-regions provided on the detection surface each provided with a filter layer on the detection surface, the filter layers of a given separately addressable region comprising discrete and different materials with discrete defined and spectroscopically spaced x-ray absorption edges. A method of device manufacture, and an apparatus and method for the inspection and characterization of materials employing such a detector device, are also described.

    Abstract translation: 描述了一种检测器装置,其包括具有限定用于检测入射X射线辐射强度的至少一个单独可寻址区域的检测表面的X射线检测器结构,其中该单独可寻址区域被分成多个子区域 检测表面,每个在检测表面上设置有过滤层,给定的可单独寻址区域的过滤层包括具有离散限定和光谱间隔的x射线吸收边缘的离散和不同材料。 还描述了一种器件制造方法,以及用于检查和表征采用这种检测器件的材料的装置和方法。

    Method and System for Identification and Authentication of Objects
    12.
    发明申请
    Method and System for Identification and Authentication of Objects 审中-公开
    对象识别和认证方法与系统

    公开(公告)号:US20130051529A1

    公开(公告)日:2013-02-28

    申请号:US13580441

    申请日:2011-03-11

    Abstract: A method and system for facilitating the identification and/or authentication of objects, and to a method and system for the marking of objects with an identity and/or as of authentic origin, and a set of objects marked to facilitate subsequent identification and/or authentication are described. The marking comprises incorporating into an object or part thereof or onto a tag mechanically engaged therewith a marker material exhibiting a characteristic radiation interaction response to incident high-energy ionizing radiation from a test source that is known to vary spectroscopically across the spectrum of the source. The presence or otherwise of the marker material may be determined by subsequent interrogation of an object with a suitable radiation source and detector to infer whether an object is of marked identity or origin.

    Abstract translation: 一种用于促进对象的识别和/或认证的方法和系统,以及用于标识具有身份和/或真实来源的对象的方法和系统,以及标记为便于随后识别和/或 描述认证。 该标记包括将物体或其部分结合到与其机械接合的标签上,标记材料表现出对来自测试源的入射高能电离辐射的特征辐射相互作用响应,所述测量源已知在源于光谱的光谱上变化。 标记材料的存在或其它可以通过用适当的辐射源和检测器随后询问物体来确定物体是否具有标记的身份或来源来确定。

    Detector Device, Inspection Apparatus and Method
    13.
    发明申请
    Detector Device, Inspection Apparatus and Method 有权
    检测装置,检测装置及方法

    公开(公告)号:US20130051521A1

    公开(公告)日:2013-02-28

    申请号:US13581427

    申请日:2011-03-11

    CPC classification number: G01N23/087

    Abstract: A detector device is described comprising an x-ray detector structure having a detection surface defining at least one separately addressable region for detecting incident x-ray radiation intensity thereon, wherein the separately addressable region is divided into a plurality of sub-regions provided on the detection surface each provided with a filter layer on the detection surface, the filter layers of a given separately addressable region comprising discrete and different materials with discrete defined and spectroscopically spaced x-ray absorption edges. A method of device manufacture, and an apparatus and method for the inspection and characterisation of materials employing such a detector device, are also described.

    Abstract translation: 描述了一种检测器装置,其包括具有限定用于检测入射X射线辐射强度的至少一个单独可寻址区域的检测表面的X射线检测器结构,其中该单独可寻址区域被分成多个子区域 检测表面,每个在检测表面上设置有过滤层,给定的可单独寻址区域的过滤层包括具有离散限定和光谱间隔的x射线吸收边缘的离散和不同材料。 还描述了一种器件制造方法,以及用于检查和表征采用这种检测器件的材料的装置和方法。

    Semiconductor device with a bulk single crystal on a substrate
    14.
    发明授权
    Semiconductor device with a bulk single crystal on a substrate 有权
    在衬底上具有大块单晶的半导体器件

    公开(公告)号:US08093671B2

    公开(公告)日:2012-01-10

    申请号:US12880458

    申请日:2010-09-13

    CPC classification number: H01L31/115 H01L31/1828 Y02E10/543

    Abstract: Device and method of forming a device in which a substrate (10) is fabricated with at least part of an electronic circuit for processing signals. A bulk single crystal material (14) is formed on the substrate, either directly on the substrate (10) or with an intervening thin film layer or transition region (12). A particular application of the device is for a radiation detector.

    Abstract translation: 制造其中用至少部分用于处理信号的电子电路的衬底(10)制造的器件的装置和方法。 在衬底上,直接在衬底(10)上或与中间的薄膜层或过渡区(12)形成体积单晶材料(14)。 该设备的特定应用是用于辐射检测器。

    SEMICONDUCTOR DEVICE STRUCTURE AND METHOD OF MANUFACTURE THEREOF
    16.
    发明申请
    SEMICONDUCTOR DEVICE STRUCTURE AND METHOD OF MANUFACTURE THEREOF 审中-公开
    半导体器件结构及其制造方法

    公开(公告)号:US20100133584A1

    公开(公告)日:2010-06-03

    申请号:US12452313

    申请日:2008-06-30

    CPC classification number: H01L31/0336 H01L31/03529 H01L31/1828 Y02E10/543

    Abstract: A semiconductor device structure comprising a first bulk crystal semiconductor material and a second bulk crystal semiconductor material provided on a surface of the first bulk crystal semiconductor material with or without a deliberate intermediate region, the second bulk crystal semiconductor material being a Group II-VI material dissimilar to the first bulk crystal semiconductor material, wherein portions of the first and/or second bulk crystal semiconductor material have been selectively removed to produce a patterned area of reduced thickness of the first and/or second bulk crystal semiconductor and preferably to expose a patterned area of the said surface of the first and/or second bulk crystal semiconductor material.

    Abstract translation: 一种半导体器件结构,包括第一体晶半导体材料和第二体晶半导体材料,所述第一体晶半导体材料设置在具有或不具有有意中间区域的第一块状半导体材料的表面上,所述第二体晶半导体材料为II-VI族材料 不同于第一块体晶体半导体材料,其中第一和/或第二块状半导体材料的部分已被选择性地去除以产生第一和/或第二块状半导体的厚度减小的图案化区域,并且优选地暴露图案化 第一和/或第二块体半导体材料的所述表面的面积。

    Method and apparatus for inspection of materials
    17.
    发明授权
    Method and apparatus for inspection of materials 有权
    材料检验方法和装置

    公开(公告)号:US07693261B2

    公开(公告)日:2010-04-06

    申请号:US12152863

    申请日:2008-05-16

    CPC classification number: G01N23/04 G01N23/2076 G01V5/0016

    Abstract: A method and apparatus for obtaining radiation transmission data including providing a radiation source, e.g., x-ray or gamma-ray source, and a radiation detector system, e.g., x-ray or gamma-ray detection system, spaced therefrom to define a scanning zone therebetween, the detector system capable of detecting and collecting spectroscopically resolvable information about incident radiation. Collecting a dataset of information about radiation incident including transmissivity of an object in the scanning zone at at least one scanning position from radiation transmitted through the object and received at the detector system. Resolving each dataset spectroscopically across a plurality of frequency bands within the spectrum of the source; at least one of the frequency bands corresponding to a characteristically scattered wavelength of a target species to be identified. The absence of or substantial reduction in a transmitted signal intensity at the frequency band is interpreted as the presence of the said target species.

    Abstract translation: 一种用于获得辐射传输数据的方法和装置,包括提供辐射源,例如x射线或γ射线源,以及辐射检测器系统,例如与其间隔开的x射线或γ射线检测系统,以限定扫描 区域,检测器系统能够检测和收集关于入射辐射的光谱可分辨的信息。 收集关于辐射入射的信息的数据集,其中包括在扫描区域中的物体在至少一个扫描位置处的透射率,从辐射透射通过物体并在检测器系统处接收。 在光谱范围内的多个频带内光谱地分解每个数据集; 至少一个频带对应于待识别的目标物种的特征散射波长。 在频带处的传输信号强度的不存在或实质上的减少被解释为所述目标物种的存在。

    Semiconductor Device with a Bulk Single Crystal on a Substrate
    18.
    发明申请
    Semiconductor Device with a Bulk Single Crystal on a Substrate 有权
    在基板上具有大块单晶的半导体器件

    公开(公告)号:US20080315342A1

    公开(公告)日:2008-12-25

    申请号:US12158111

    申请日:2006-12-21

    CPC classification number: H01L31/115 H01L31/1828 Y02E10/543

    Abstract: Device and method of forming a device in which a substrate (10) is fabricated with at least part of an electronic circuit for processing signals. A bulk single crystal material (14) is formed on the substrate, either directly on the substrate (10) or with an intervening thin film layer or transition region (12). A particular application of the device is for a radiation detector.

    Abstract translation: 制造其中用至少部分用于处理信号的电子电路的衬底(10)制造的器件的装置和方法。 在衬底上,直接在衬底(10)上或与中间的薄膜层或过渡区(12)形成体积单晶材料(14)。 该设备的特定应用是用于辐射检测器。

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