Dynamic random access memories and method for testing performance of the same
    11.
    发明申请
    Dynamic random access memories and method for testing performance of the same 有权
    动态随机存取存储器及其性能测试方法

    公开(公告)号:US20060203590A1

    公开(公告)日:2006-09-14

    申请号:US11341717

    申请日:2006-01-30

    IPC分类号: G11C7/00

    摘要: The present invention enables screening of the so-called variable retention time (VRT) failure, namely a retention failure occurring in a DRAM due to fluctuation of a data retention time like a random telegraph noise. A pause/refresh test for checking a data retention function is repeated at all memory cells of a chip so that memory cells at which the retention failure due to random fluctuation of the data retention capability over time may occur is subjected to screening.

    摘要翻译: 本发明能够筛选所谓的可变保留时间(VRT)故障,即由于诸如随机电报噪声的数据保留时间的波动而在DRAM中发生的保留故障。 在芯片的所有存储单元上重复用于检查数据保留功能的暂停/刷新测试,使得可能发生由于数据保留能力的随机波动而发生的保留故障的存储单元被进行筛选。

    Light-emitting device
    13.
    发明授权
    Light-emitting device 有权
    发光装置

    公开(公告)号:US08710737B2

    公开(公告)日:2014-04-29

    申请号:US12294850

    申请日:2007-03-28

    IPC分类号: H01J1/62

    摘要: To improve the luminance of light emitted by a light-emitting device, the light-emitting device includes a base (1) that has an opening part (1p) constituted by a light-reflecting surface (1r) and a bottom surface (1u), a light-emitting chip (2) that is mounted on the bottom surface (1u) of the opening part (1p), a transparent member (3) that covers the light-emitting chip (2), and an optical member (4) that is disposed on the transparent member (3). The transparent member (3) is disposed on the bottom surface (1u) of the opening part (1p) in a state where the transparent member (3) is spaced away from the light-reflecting surface (1r) of the opening part (1p).

    摘要翻译: 为了提高发光装置发出的光的亮度,发光装置包括具有由光反射面(1r)和底面(1u)构成的开口部(1p)的基体(1) ,安装在开口部(1p)的底面(1u)上的发光芯片(2),覆盖发光芯片(2)的透明部件(3)和光学部件 ),其设置在透明构件(3)上。 在透明构件(3)与开口部(1p)的光反射面(1r)隔开的状态下,透明构件(3)设置在开口部(1p)的底面(1u) )。

    Light emitting device and illumination device
    14.
    发明授权
    Light emitting device and illumination device 有权
    发光装置及照明装置

    公开(公告)号:US08529089B2

    公开(公告)日:2013-09-10

    申请号:US12810769

    申请日:2008-12-26

    IPC分类号: F21S4/00

    摘要: A light emitting device includes a base, a sub-mount substrate, and a frame member. The light emitting device further includes a light emitting element and a wavelength converting member. The sub-mount substrate is disposed on the base, and has an upper surface made of a ceramic sintered body. The frame member has a light reflecting portion made of porous ceramics, is disposed on the base, and surrounds the sub-mount substrate. The light emitting element is mounted on the sub-mount substrate. The wavelength converting member covers the light emitting element and the light reflecting portion of the frame member.

    摘要翻译: 发光装置包括基座,副安装基板和框架构件。 发光装置还包括发光元件和波长转换构件。 副安装基板设置在基座上,具有由陶瓷烧结体构成的上表面。 框架构件具有由多孔陶瓷制成的光反射部分,设置在基座上并且包围副安装基板。 发光元件安装在副安装基板上。 波长转换部件覆盖框架部件的发光元件和光反射部。

    Package for light-emitting device, light-emitting apparatus, and illuminating apparatus
    17.
    发明授权
    Package for light-emitting device, light-emitting apparatus, and illuminating apparatus 有权
    发光装置,发光装置和照明装置的封装

    公开(公告)号:US08029152B2

    公开(公告)日:2011-10-04

    申请号:US11909592

    申请日:2006-03-23

    IPC分类号: F21V9/16

    摘要: A package includes a base body having a mounting portion for mounting a light-emitting device, a frame-shaped first reflection member attached to the upper surface of the base body, an inner peripheral surface of which is shaped into a first light reflecting surface and surrounds the mounting portion, and a frame-shaped second reflection member attached to the upper surface of the base body, with a spacing secured between an inner peripheral surface of the second reflection member and an outer peripheral surface of the first reflection member, the inner peripheral surface surrounding the first reflection member and having a second light reflecting surface at a location above an upper end of the first reflection member.

    摘要翻译: 一种包装体,包括具有用于安装发光装置的安装部的基体,安装在基体的上表面的框状的第一反射构件,其内周面成形为第一光反射面, 围绕安装部的框状的第二反射构件和安装在基体的上表面的框状的第二反射构件,其间隔固定在第二反射构件的内周面与第一反射构件的外周面之间, 围绕第一反射构件的周边表面,并且在第一反射构件的上端上方的位置具有第二光反射表面。

    Light Emitting Device and Illumination Device
    18.
    发明申请
    Light Emitting Device and Illumination Device 有权
    发光装置和照明装置

    公开(公告)号:US20110096526A1

    公开(公告)日:2011-04-28

    申请号:US12810769

    申请日:2008-12-26

    IPC分类号: F21V9/16

    摘要: A light emitting device includes a base, a sub-mount substrate, and a frame member. The light emitting device further includes a light emitting element and a wavelength converting member. The sub-mount substrate is disposed on the base, and has an upper surface made of a ceramic sintered body. The frame member has a light reflecting portion made of porous ceramics, is disposed on the base, and surrounds the sub-mount substrate. The light emitting element is mounted on the sub-mount substrate. The wavelength converting member covers the light emitting element and the light reflecting portion of the frame member.

    摘要翻译: 发光装置包括基座,副安装基板和框架构件。 发光装置还包括发光元件和波长转换构件。 副安装基板设置在基座上,具有由陶瓷烧结体构成的上表面。 框架构件具有由多孔陶瓷制成的光反射部分,设置在基座上并且包围副安装基板。 发光元件安装在副安装基板上。 波长转换部件覆盖框架部件的发光元件和光反射部。

    Dynamic random access memories and method for testing performance of the same
    20.
    发明授权
    Dynamic random access memories and method for testing performance of the same 有权
    动态随机存取存储器及其性能测试方法

    公开(公告)号:US07450458B2

    公开(公告)日:2008-11-11

    申请号:US11341717

    申请日:2006-01-30

    IPC分类号: G11C11/34

    摘要: The present invention enables screening of the so-called variable retention time (VRT) failure, namely a retention failure occurring in a DRAM due to fluctuation of a data retention time like a random telegraph noise. A pause/refresh test for checking a data retention function is repeated at all memory cells of a chip so that memory cells at which the retention failure due to random fluctuation of the data retention capability over time may occur is subjected to screening.

    摘要翻译: 本发明能够筛选所谓的可变保留时间(VRT)故障,即由于诸如随机电报噪声的数据保留时间的波动而在DRAM中发生的保留故障。 在芯片的所有存储单元上重复用于检查数据保留功能的暂停/刷新测试,使得可能发生由于数据保留能力的随机波动而发生的保留故障的存储单元被进行筛选。