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公开(公告)号：US10542898B2
公开(公告)日：2020-01-28
申请号：US14829261
申请日：2015-08-18
Applicant: Samsung Electronics Co., Ltd.
Inventor： Jae-Hong Kim , Jea-Hyuck Lee , Jin-Hong Min , Jae-Geol Cho
IPC: A61B5/0408 , A61B5/00 , A61B5/044 , A61B5/04
Abstract: A biometric information measurement device is provided. The device includes a substrate unit including components required for operation of the biometric information measurement device, and electrodes for measuring biometric information. The components and the electrodes are disposed on a single side of the substrate unit. The device also includes a case having a first surface and a second surface. The first surface is attached to an attachment pad for attaching the biometric information measurement device to a body, and the second surface faces the single side of the substrate unit. The electrodes are each exposed through respective openings in the first surface.
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12.发明授权公开(公告)号：US10061647B2
公开(公告)日：2018-08-28
申请号：US15237111
申请日：2016-08-15
Applicant: Samsung Electronics Co., Ltd.
Inventor： Young-Seop Shim , Jae-Hong Kim , Sang-Soo Cha , Jin-Man Han
IPC: G11C29/00 , G06F11/10 , G11C29/52 , G11C16/10 , G11C16/34 , G11C16/20 , G11C16/26 , G11C29/02 , G11C29/04 , G11C29/50
CPC classification number: G06F11/1068 , G06F11/1048 , G11C16/10 , G11C16/20 , G11C16/26 , G11C16/349 , G11C16/3495 , G11C29/025 , G11C29/028 , G11C29/52 , G11C2029/0407 , G11C2029/0409 , G11C2029/0411 , G11C2029/5004
Abstract: In a method of operating a nonvolatile memory device, a plurality of pages of a first memory block of a plurality of memory blocks of a memory cell array are programmed. After programming, a dummy pulse is applied to at least some of the plurality of memory blocks at least once before a read operation on is performed on one of the plurality of pages.
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公开(公告)号：US09859023B2
公开(公告)日：2018-01-02
申请号：US15176618
申请日：2016-06-08
Applicant: Samsung Electronics Co., Ltd.
Inventor： Dong-Wook Kim , Jae-Hong Kim , Jun-Ki Jeong
CPC classification number: G11C29/56008 , G11C29/26 , G11C2029/1802 , G11C2029/2602 , G11C2029/5604
Abstract: A memory test system may include a tester and N memory devices, where N is a positive integer greater than 1. The tester may generate test signals. A K-th memory device of the N memory devices includes a plurality of K-th memory banks and a K-th decoder, where K is each positive integer equal to or smaller than N. The K-th memory banks may be configured to operate based on first internal signals and each of the K-th memory banks includes a plurality of unit blocks. The K-th decoder may be configured to convert the test signals corresponding to the first test to the first internal signals based on a K-th conversion relation and update the K-th conversion relation based on a result of the first test with respect to the K-th memory device.
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公开(公告)号：US20140232890A1
公开(公告)日：2014-08-21
申请号：US14105594
申请日：2013-12-13
Applicant: Samsung Electronics Co., Ltd.
Inventor： Kwi-Sung Yoo , Yu-Jin Park , Jae-Hong Kim , Jin-Ho Seo , Wun-Ki Jung , Han-Kook Cho , Seog-Heon Ham , Min-Ji Hwang
IPC: H04N5/232
CPC classification number: H04N5/23245 , H04N5/378
Abstract: An image sensor includes a pixel array and an analog-to-digital (A/D) conversion unit. The pixel array generates an analog signal by sensing an incident light. The A/D conversion unit generates a digital signal in a first operation mode by performing a sigma-delta A/D conversion and a cyclic A/D conversion with respect to the analog signal and generates the digital signal in a second operation mode by performing a single-slope A/D conversion with respect to the analog signal. The image sensor provides a high-quality image in a still image photography mode and a dynamic image video mode.
Abstract translation: 图像传感器包括像素阵列和模数（A / D）转换单元。 像素阵列通过感测入射光产生模拟信号。 A / D转换单元通过对模拟信号执行Σ-ΔA/ D转换和循环A / D转换，以第一操作模式产生数字信号，并通过执行第二操作模式生成数字信号 相对于模拟信号的单斜率A / D转换。 图像传感器在静态图像拍摄模式和动态图像视频模式中提供高质量的图像。
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公开(公告)号：US11836038B2
公开(公告)日：2023-12-05
申请号：US17532575
申请日：2021-11-22
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Jae-Hun Lee , Myung-Sun Kim , Ayush Jain , Tae-Ho Hwang , Jae-Hong Kim , Hye-Jung Cho
IPC: G06F11/07
CPC classification number: G06F11/079 , G06F11/0709 , G06F11/0727 , G06F11/0751 , G06F11/0778
Abstract: A method performed by a managing server includes: receiving, from an electronic device, operation data of the electronic device; identifying, by using artificial intelligence (AI), a device usage pattern of the electronic device; identifying, by using the AI, information related to a failure or an abnormal operation of the electronic device and a solution to the failure or the abnormal operation based on the device usage pattern and the operation data received from the electronic device; and transmitting, to a user terminal, the information related to the failure or the abnormal operation of the electronic device and the solution to the failure or the abnormal operation.
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Patent Agency Ranking
公开(公告)号：US11201758B2
公开(公告)日：2021-12-14
申请号：US16065588
申请日：2016-12-23
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Jae-Hong Kim , Kyoung-Jin Moon , Jae-Ho Jung
Abstract: The present disclosure relates to a control apparatus and method for a device that has been made intelligent through combination with Internet of Things (IoT) technology. The present disclosure may be applied to intelligent service (for example, smart home, smart building, smart city, smart car or connected car, health care, digital education, small retailers, security and safety-related service, etc.) which is based on IoT-related technology. A method for controlling a first device at the first device according to some embodiments of the present disclosure may comprise the steps of: receiving control state information on a second device from the second device; acquiring a control signal for the first device; on the basis of at least one of the received control state information and the acquired control signal, selecting one from among at least one or more stored control rules; and executing a control operation for the first device on the basis of the selected control rule.
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公开(公告)号：US10942216B2
公开(公告)日：2021-03-09
申请号：US15958387
申请日：2018-04-20
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Sung-Yeol Kim , Jae-Hong Kim , Kyung-Min Lee , Mee-Hyun Lim
Abstract: An interconnect circuit testing apparatus including: an electric signal generating circuit for generating an electric signal; a first electrode arranged at a first region of a substrate, wherein the substrate includes an interconnect circuit, an upper surface and a lower surface; a second electrode arranged at a second region of the substrate; and a sensor for detecting an electric field emitted from the first region or the second region when the electric signal is applied to the substrate through the first electrode and the second electrode.
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公开(公告)号：US10575741B2
公开(公告)日：2020-03-03
申请号：US14829261
申请日：2015-08-18
Applicant: Samsung Electronics Co., Ltd.
Inventor： Jae-Hong Kim , Jea-Hyuck Lee , Jin-Hong Min , Jae-Geol Cho
IPC: A61B5/0408 , A61B5/00 , A61B5/044 , A61B5/04 , A61B5/024
Abstract: A biometric information measurement device is provided. The device includes a substrate unit including components required for operation of the biometric information measurement device, and electrodes for measuring biometric information. The components and the electrodes are disposed on a single side of the substrate unit. The device also includes a case having a first surface and a second surface. The first surface is attached to an attachment pad for attaching the biometric information measurement device to a body, and the second surface faces the single side of the substrate unit. The electrodes are each exposed through respective openings in the first surface.
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公开(公告)号：US20160372185A1
公开(公告)日：2016-12-22
申请号：US15055186
申请日：2016-02-26
Applicant: Samsung Electronics Co., Ltd.
Inventor： Young-Seop Shim , Jae-Hong Kim , Jin-Man Han
CPC classification number: G11C11/5635 , G11C11/5628 , G11C16/0483 , G11C16/3445 , G11C16/3459 , G11C2211/5621
Abstract: A method of operating a non-volatile memory device includes receiving program data and a program address. Memory cells that correspond to the program address are selected from among memory cells in an erased state. The selected memory cells are programmed based on the program data such that each of the selected memory cells is programmed to one of a plurality of programmed states, where threshold voltage distributions of the programmed states are different from each other and are higher than a threshold voltage distribution associated with the erased state. By programming all or a portion of the memory cells corresponding to the erased state to have positive threshold voltages, degradation of the data retention capability of the memory cells may be reduced.
Abstract translation: 操作非易失性存储器件的方法包括接收程序数据和程序地址。 从擦除状态的存储单元中选择与程序地址对应的存储单元。 所选择的存储器单元基于程序数据被编程，使得每个选择的存储器单元被编程为多个编程状态中的一个，其中编程状态的阈值电压分布彼此不同并且高于阈值电压 分配与擦除状态相关联。 通过将与擦除状态对应的存储单元的全部或一部分编程为具有正阈值电压，可以降低存储单元的数据保留能力的劣化。
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公开(公告)号：US20150311912A1
公开(公告)日：2015-10-29
申请号：US14692787
申请日：2015-04-22
Applicant: Samsung Electronics Co., Ltd. , Industry-Academic Cooperation Foundation, Yonsei University
Inventor： Jae-Hong Kim , Youngcheol Chae , Seungwoo Song , Woojin Jo , Hyunseok Hwang
CPC classification number: H03M3/462 , H03M1/0626 , H03M1/123 , H03M3/344 , H03M3/466
Abstract: An analog-to-digital converter includes a modulator, a controller, and a digital filter. The modulator generates a modulated signal based on an analog signal. The controller generates a weight control signal. The digital filter includes a weight signal generator and a first integrator. The weight signal generator generates a weight signal based on the weight control signal. The first integrator generates a digital signal corresponding to the analog signal by integrating the weight signal in response to the modulated signal. The weight control signal corresponds to a type and an order of the digital filter.
Abstract translation: 模数转换器包括调制器，控制器和数字滤波器。 调制器基于模拟信号产生调制信号。 控制器产生加权控制信号。 数字滤波器包括权重信号发生器和第一积分器。 权重信号发生器基于权重控制信号产生加权信号。 第一积分器响应于调制信号对加权信号进行积分而产生对应于模拟信号的数字信号。 权重控制信号对应于数字滤波器的类型和顺序。
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