-
11.
公开(公告)号:US20210134345A1
公开(公告)日:2021-05-06
申请号:US16903055
申请日:2020-06-16
Applicant: Samsung Electronics Co., Ltd.
Inventor: Youngcheon Kwon , Sanghyuk Kwon , Kyomin Sohn , Jaeyoun Youn , Haesuk Lee
IPC: G11C11/406 , G11C11/408
Abstract: A memory device according to some aspects of the inventive concepts includes a memory cell array including a plurality of banks, at least one Processing Element (PE) connected to at least one bank selected from the plurality of banks, and a control logic configured to control an active operation in which wordlines included in each of the plurality of banks is activated, and configured to control a refresh operation in which at least one bank is refreshed, based on a PE enable signal configured to selectively enable the at least one PE.
-
公开(公告)号:US12001699B2
公开(公告)日:2024-06-04
申请号:US18145186
申请日:2022-12-22
Applicant: Samsung Electronics Co., Ltd.
Inventor: Youngcheon Kwon , Jaesan Kim , Jemin Ryu , Jaeyoun Youn , Haesuk Lee
CPC classification number: G06F3/0634 , G06F3/0604 , G06F3/0659 , G06F3/0673 , G11C7/1069 , G11C7/222 , H01L25/18
Abstract: A memory device according to an aspect may include a memory cell array including a first bank region and a second bank region each including a plurality of banks; an operation logic including one or more first processing elements (PEs) corresponding to the first bank region and one or more second PEs corresponding to the second bank region; a control logic configured to control modes of the first bank region and the second bank region based on externally sourced setting information; first and second mode signal generators configured to control enabling the first PEs, wherein the first mode signal generator is configured to output the first mode signal to enable the first PEs and the second mode signal generator is configured to output the second mode signal to disable the second PEs responsive to the first bank region being set to an operation mode and the second bank region being set to a normal mode.
-
公开(公告)号:US11869571B2
公开(公告)日:2024-01-09
申请号:US17899141
申请日:2022-08-30
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Youngcheon Kwon , Jaeyoun Youn , Namsung Kim , Kyomin Sohn , Seongil O , Sukhan Lee
IPC: G11C11/406 , G11C11/408 , G11C7/10 , G11C11/4076
CPC classification number: G11C11/40618 , G11C7/1045 , G11C7/1048 , G11C11/408 , G11C11/4076 , G11C11/40622
Abstract: A memory device including: a plurality of pins for receiving control signals from an external device; a first bank having first memory cells, wherein the first bank is activated in a first operation mode and a second operation mode; a second bank having second memory cells, wherein the second bank is deactivated in the first operation mode and activated in the second operation mode; a processing unit configured to perform an operation on first data, output from the first memory cells, and second data, output from the second memory cells, in the second operation mode; and a processing-in-memory (PIM) mode controller configured to select mode information, indicating one of the first operation mode and the second operation mode, in response to the control signals and to control at least one memory parameter, at least one mode register set (MRS) value, or a refresh mode according to the mode information.
-
公开(公告)号:US11604693B2
公开(公告)日:2023-03-14
申请号:US17388243
申请日:2021-07-29
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Yesin Ryu , Sunggi Ahn , Jaeyoun Youn
IPC: G06F11/10
Abstract: A memory device including: a memory cell array including a plurality of memory cells disposed at intersections of wordlines and bitlines; an error correction circuit configured to read data from the memory cell array and to correct an error in the read data; and an error check and scrub (ECS) circuit configured to perform a scrubbing operation on the memory cell array, wherein the ECS circuit includes: a first register configured to store an error address obtained in the scrubbing operation; and a second register configured to store a page offline address received from an external device.
-
公开(公告)号:US20220197739A1
公开(公告)日:2022-06-23
申请号:US17388243
申请日:2021-07-29
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Yesin RYU , Sunggi Ahn , Jaeyoun Youn
IPC: G06F11/10
Abstract: A memory device including: a memory cell array including a plurality of memory cells disposed at intersections of wordlines and bitlines; an error correction circuit configured to read data from the memory cell array and to correct an error in the read data; and an error check and scrub (ECS) circuit configured to perform a scrubbing operation on the memory cell array, wherein the ECS circuit includes: a first register configured to store an error address obtained in the scrubbing operation; and a second register configured to store a page offline address received from an external device.
-
16.
公开(公告)号:US11335392B2
公开(公告)日:2022-05-17
申请号:US16903055
申请日:2020-06-16
Applicant: Samsung Electronics Co., Ltd.
Inventor: Youngcheon Kwon , Sanghyuk Kwon , Kyomin Sohn , Jaeyoun Youn , Haesuk Lee
IPC: G11C11/406 , G11C11/408
Abstract: A memory device according to some aspects of the inventive concepts includes a memory cell array including a plurality of banks, at least one Processing Element (PE) connected to at least one bank selected from the plurality of banks, and a control logic configured to control an active operation in which wordlines included in each of the plurality of banks is activated, and configured to control a refresh operation in which at least one bank is refreshed, based on a PE enable signal configured to selectively enable the at least one PE.
-
公开(公告)号:US20220139433A1
公开(公告)日:2022-05-05
申请号:US17574174
申请日:2022-01-12
Applicant: Samsung Electronics Co., Ltd.
Inventor: Youngcheon Kwon , Jemin Ryu , Jaeyoun Youn , Haesuk Lee , Jihyun Choi
Abstract: A method of operating a memory device including row pins and column pins includes receiving a first active command through the row pins during 1.5 cycles of a clock signal, receiving a first read command or a first write command through the column pins during 1 cycle of the clock signal, receiving a first precharge command through the row pins during a 0.5 cycle of the clock signal corresponding to a rising edge of the clock signal, receiving a second active command through the row pins during the 1.5 cycles of the clock signal, receiving a second read command or a second write command through the column pins during the 1 cycle of the clock signal, and receiving a second precharge command through the row pins during the 0.5 cycle of the clock signal corresponding to a falling edge of the clock signal.
-
公开(公告)号:US12117901B2
公开(公告)日:2024-10-15
申请号:US18096053
申请日:2023-01-12
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Yesin Ryu , Sunggi Ahn , Jaeyoun Youn
IPC: G06F11/10
CPC classification number: G06F11/106
Abstract: A memory device including: a memory cell array including a plurality of memory cells disposed at intersections of wordlines and bitlines; an error correction circuit configured to read data from the memory cell array and to correct an error in the read data; and an error check and scrub (ECS) circuit configured to perform a scrubbing operation on the memory cell array, wherein the ECS circuit includes: a first register configured to store an error address obtained in the scrubbing operation; and a second register configured to store a page offline address received from an external device.
-
公开(公告)号:US11561711B2
公开(公告)日:2023-01-24
申请号:US17335307
申请日:2021-06-01
Applicant: Samsung Electronics Co., Ltd.
Inventor: Youngcheon Kwon , Jaesan Kim , Jemin Ryu , Jaeyoun Youn , Haesuk Lee
Abstract: A memory device according to an aspect may include a memory cell array including a first bank region and a second bank region each including a plurality of banks; an operation logic including one or more first processing elements (PEs) corresponding to the first bank region and one or more second PEs corresponding to the second bank region; a control logic configured to control modes of the first bank region and the second bank region based on externally sourced setting information; first and second mode signal generators configured to control enabling the first PEs, wherein the first mode signal generator is configured to output the first mode signal to enable the first PEs and the second mode signal generator is configured to output the second mode signal to disable the second PEs responsive to the first bank region being set to an operation mode and the second bank region being set to a normal mode.
-
20.
公开(公告)号:US11301399B2
公开(公告)日:2022-04-12
申请号:US16934497
申请日:2020-07-21
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Sang-Hyuk Kwon , Nam Sung Kim , Kyomin Sohn , Jaeyoun Youn
IPC: G06F13/38 , G06F13/16 , H01L25/065 , G11C8/10 , G11C7/10
Abstract: A memory device includes a buffer die configured to receive a first broadcast command and a second broadcast command from an external device; and a plurality of core dies stacked on the buffer die. The plurality of core dies include: a first core die including a first processing circuit, a first memory cell array, a first command decoder configured to decode the first broadcast command, and a first data input/output circuit configured to output data of the first memory cell array to a common data input/output bus under control of the first command decoder; and a second core die including a second processing circuit, a second memory cell array, a second command decoder configured to decode the second broadcast command, and a second data input/output circuit configured to receive the data of the first memory cell array through the common data input/output bus under control of the second command decoder.
-
-
-
-
-
-
-
-
-