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公开(公告)号:US20240104164A1
公开(公告)日:2024-03-28
申请号:US18080545
申请日:2022-12-13
Applicant: Silicon Storage Technology, Inc.
Inventor: HIEU VAN TRAN , STEPHEN TRINH , STANLEY HONG , THUAN VU , DUC NGUYEN , HIEN HO PHAM
Abstract: Numerous examples are disclosed of verification circuitry and associated methods in an artificial neural network. In one example, a system comprises a vector-by-matrix multiplication array comprising a plurality of non-volatile memory cells arranged in rows and columns, the non-volatile memory cells respectively capable of storing one of N possible levels corresponding to one of N possible currents, and a plurality of output blocks to receive current from respective columns of the vector-by-matrix multiplication array and generate voltages during a verify operation of the vector-by-matrix multiplication and generate digital outputs during a read operation of the vector-by-matrix multiplication.
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12.
公开(公告)号:US20200176460A1
公开(公告)日:2020-06-04
申请号:US16208297
申请日:2018-12-03
Applicant: Silicon Storage Technology, Inc.
Inventor: CATHERINE DECOBERT , HIEU VAN TRAN , NHAN DO
IPC: H01L27/11521 , G11C16/26 , G11C16/16 , H01L29/423 , H01L29/08 , H01L29/10
Abstract: A memory device that includes source and drain regions formed in a semiconductor substrate, with a first channel region of the substrate extending there between. A floating gate is disposed over and insulated from the channel region, wherein the conductivity of the channel region is solely controlled by the floating gate. A control gate is disposed over and insulated from the floating gate. An erase gate is disposed over and insulated from the source region, wherein the erase gate includes a notch that faces and is insulated from an edge of the floating gate. Logic devices are formed on the same substrate. Each logic device has source and drain regions with a channel region extending there between, and a logic gate disposed over and controlling the logic device's channel region.
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公开(公告)号:US20190172529A1
公开(公告)日:2019-06-06
申请号:US16273337
申请日:2019-02-12
Applicant: Silicon Storage Technology, Inc.
Inventor: Nhan Do , XIAN LIU , VIPIN TIWARI , HIEU VAN TRAN
IPC: G11C11/419 , H01L29/788 , H01L29/66 , G11C16/14 , G11C16/04 , H01L29/423 , H01L21/28 , H01L27/11521
Abstract: A method of forming a memory device that includes forming on a substrate, a first insulation layer, a first conductive layer, a second insulation layer, a second conductive layer, a third insulation layer. First trenches are formed through third insulation layer, the second conductive layer, the second insulation layer and the first conductive layer, leaving side portions of the first conductive layer exposed. A fourth insulation layer is formed at the bottom of the first trenches that extends along the exposed portions of the first conductive layer. The first trenches are filled with conductive material. Second trenches are formed through the third insulation layer, the second conductive layer, the second insulation layer and the first conductive layer. Drain regions are formed in the substrate under the second trenches. A pair of memory cells results, with a single continuous channel region extending between drain regions for the pair of memory cells.
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公开(公告)号:US20240112003A1
公开(公告)日:2024-04-04
申请号:US18077993
申请日:2022-12-08
Applicant: Silicon Storage Technology, Inc.
Inventor: HIEU VAN TRAN , STEPHEN TRINH , STANLEY HONG , THUAN VU , NGHIA LE , HIEN PHAM
Abstract: Numerous examples are disclosed of output circuitry and associated methods in an artificial neural network. In one example, a system comprises an array of non-volatile memory cells arranged into rows and columns, an output block to convert current from columns of the array into a first digital output during a first time period and a second digital output during a second time period, a first output register to store the first digital output during the first time period and to output the stored first digital output during the second time period, and a second output register to store the second digital output during the second time period and to output the stored second digital output during a third time period.
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公开(公告)号:US20220147794A1
公开(公告)日:2022-05-12
申请号:US17580862
申请日:2022-01-21
Inventor: FARNOOD MERRIKH BAYAT , XINJIE GUO , DMITRI STRUKOV , NHAN DO , HIEU VAN TRAN , VIPIN TIWARI , MARK REITEN
Abstract: An artificial neural network device that utilizes one or more non-volatile memory arrays as the synapses. The synapses are configured to receive inputs and to generate therefrom outputs. Neurons are configured to receive the outputs. The synapses include a plurality of memory cells, wherein each of the memory cells includes spaced apart source and drain regions formed in a semiconductor substrate with a channel region extending there between, a floating gate disposed over and insulated from a first portion of the channel region and a non-floating gate disposed over and insulated from a second portion of the channel region. Each of the plurality of memory cells is configured to store a weight value corresponding to a number of electrons on the floating gate. The plurality of memory cells are configured to multiply the inputs by the stored weight values to generate the outputs.
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公开(公告)号:US20210358551A1
公开(公告)日:2021-11-18
申请号:US17082956
申请日:2020-10-28
Applicant: Silicon Storage Technology, Inc.
Inventor: HIEU VAN TRAN , STANLEY HONG , STEPHEN TRINH , THUAN VU , STEVEN LEMKE , VIPIN TIWARI , NHAN DO
Abstract: Numerous embodiments of analog neural memory arrays are disclosed. Two or more physical memory cells are grouped together to form a logical cell that stores one of N possible levels. Within each logical cell, the memory cells can be programmed using different mechanisms. For example, one or more of the memory cells in a logical cell can be programmed using a coarse programming mechanism, one or more of the memory cells can be programmed using a fine mechanism, and one or more of the memory cells can be programmed using a tuning mechanism. This achieves extreme programming accuracy and programming speed.
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公开(公告)号:US20210295907A1
公开(公告)日:2021-09-23
申请号:US17024410
申请日:2020-09-17
Applicant: Silicon Storage Technology, Inc.
Inventor: HIEU VAN TRAN , THUAN VU , STEPHEN TRINH , STANLEY HONG , ANH LY , STEVEN LEMKE , VIPIN TIWARI , NHAN DO
Abstract: Numerous embodiments for performing tuning of a page or a word of non-volatile memory cells in an analog neural memory are disclosed. High voltage circuits used to generate high voltages applied to terminals of the non-volatile memory cells during the precision tuning process are also disclosed. Programming sequences for the application of the voltages to the terminals to minimize the occurrence of disturbances during tuning are also disclosed.
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18.
公开(公告)号:US20210257023A1
公开(公告)日:2021-08-19
申请号:US17199243
申请日:2021-03-11
Applicant: Silicon Storage Technology, Inc.
Inventor: HIEU VAN TRAN , ANH LY , THUAN VU , STANLEY HONG , FENG ZHOU , XIAN LIU , NHAN DO
Abstract: Numerous embodiments of circuitry for a set-while-verify operation and a reset-while verify operation for resistive random access memory cells are disclosed. In one embodiment, a set-while-verify circuit for performing a set operation on a selected RRAM cell in the array applies a combination of voltages or current to a bit line, word line, and source line associated with the selected RRAM cell and stops said applying when the set operation is complete. In another embodiment, a reset-while-verify circuit for performing a reset operation on a selected RRAM cell in the array applies a combination of voltages or current to a bit line, word line, and source line associated with the selected RRAM cell and stops said applying when the reset operation is complete.
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公开(公告)号:US20210232893A1
公开(公告)日:2021-07-29
申请号:US17233006
申请日:2021-04-16
Inventor: FARNOOD MERRIKH BAYAT , XINJIE GUO , DMITRI STRUKOV , NHAN DO , HIEU VAN TRAN , VIPIN TIWARI , MARK REITEN
Abstract: Numerous embodiments are disclosed for verifying a weight programmed into a selected non-volatile memory cell in a neural memory. In one embodiment, a circuit for verifying a weight programmed into a selected non-volatile memory cell in a neural memory comprises a converter for converting a target weight into a target current and a comparator for comparing the target current to an output current from the selected non-volatile memory cell during a verify operation. In another embodiment, a circuit for verifying a weight programmed into a selected non-volatile memory cell in a neural memory comprises a digital-to-analog converter for converting a target weight comprising digital bits into a target voltage, a current-to-voltage converter for converting an output current from the selected non-volatile memory cell during a verify operation into an output voltage, and a comparator for comparing the output voltage to the target voltage during a verify operation.
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公开(公告)号:US20210167762A1
公开(公告)日:2021-06-03
申请号:US16838847
申请日:2020-04-02
Applicant: Silicon Storage Technology, Inc.
Inventor: Ryan Mei , XIAOZHOU QIAN , HIEU VAN TRAN , CLAIRE ZHU
IPC: H03K3/356 , H03K19/0185 , H03K19/003 , H03K19/185
Abstract: An improved level shifter is disclosed. The level shifter is able to achieve a switching time below 1 ns using a relatively low voltage for VDDL, such as 0.75V. The improved level shifter comprises a coupling stage and a level-switching stage. A related method of level shifting is also disclosed.
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