公开(公告)号：US20070213863A1

公开(公告)日：2007-09-13

申请号：US11370649

申请日：2006-03-08

申请人： Yung-Cheng Chang ,  Hsieh-Shyh Fu

发明人： Yung-Cheng Chang ,  Hsieh-Shyh Fu

IPC分类号： G06F19/00

CPC分类号： G06Q10/06 ,  G06Q20/203 ,  G06Q20/401 ,  Y10S707/99932

摘要： A system comprises a parser operable to receive a log file containing detailed processing tool transactional data and generate an operation journal containing a subset of the detailed processing tool transactional data arranged in a known format, a comparator operable to receive automated material tracking data, and compare with the operation journal data, and an automatic correction module operable to automatically correct the automated material tracking data in response to a discrepancy between the automated material tracking data and the operation journal data.

摘要翻译： 系统包括解析器，其可操作以接收包含详细处理工具事务数据的日志文件，并生成包含以已知格式布置的详细处理工具事务数据的子集的操作日志，可操作以接收自动化材料跟踪数据的比较器，以及比较 以及自动校正模块，其可操作以响应于自动材料跟踪数据和操作日志数据之间的差异来自动校正自动材料跟踪数据。

公开(公告)号：US06929962B1

公开(公告)日：2005-08-16

申请号：US10811190

申请日：2004-03-26

申请人： Yung-Cheng Chang

发明人： Yung-Cheng Chang

IPC分类号： G01R31/26 ,  G01R31/28 ,  G05B19/418 ,  H01L21/00

CPC分类号： G05B19/41875 ,  G01R31/2894 ,  G05B2219/32201 ,  Y02P90/18 ,  Y02P90/22

摘要： A system for WAT (Wafer Acceptance Test) configuration. The system comprises an input/output device, a storage device, and a processor. The input/output device receives a first WAT model and qualification criteria. The storage device stores a preset WAT model and qualification criteria. The processor modifies the preset WAT model according to the first WAT model to generate a second WAT model, and modifies the preset qualification criteria according to the first qualification criteria to generate second qualification criteria.

摘要翻译： WAT（晶圆验收测试）配置系统。 该系统包括输入/​​输出设备，存储设备和处理器。 输入/输出设备接收第一WAT模型和资格标准。 存储设备存储预设的WAT模型和资格标准。 处理器根据第一WAT模型修改预设WAT模型以产生第二WAT模型，并根据第一资格标准修改预设的资格标准以产生第二资格标准。

公开(公告)号：US09002498B2

公开(公告)日：2015-04-07

申请号：US13364503

申请日：2012-02-02

申请人： Yung-Cheng Chang

发明人： Yung-Cheng Chang

IPC分类号： G05B13/02 ,  G06F19/00 ,  G05B19/418 ,  H01L21/66

CPC分类号： G05B19/41875 ,  G05B2219/45031 ,  H01L22/12 ,  Y02P90/12 ,  Y02P90/14 ,  Y02P90/22

摘要： The present disclosure relates to a process tool system that utilizes tool sensor data and an embedded or built-in tool model to facilitate semiconductor fabrication. The process tool system includes a sensor data component, the tool model, and an execution system. The sensor data component is configured to provide the tool sensor data. The tool model is built in a process tool and is configured to generate model outputs based on model inputs. The manufacturing execution system is configured to provide tool process data, including actual metrology and previous process data, to the sensor data component. Additionally, the execution system provides the model inputs to the tool model and receives the model outputs from the tool model. The execution system provides one or more execution system outputs based on the sensor data and the model outputs. The sensor data can include measured semiconductor device characteristics.

摘要翻译： 本公开涉及一种利用工具传感器数据和嵌入式或内置工具模型以便于半导体制造的工艺工具系统。 过程工具系统包括传感器数据组件，工具模型和执行系统。 传感器数据组件被配置为提供刀具传感器数据。 工具模型内置在过程工具中，并配置为基于模型输入生成模型输出。 制造执行系统被配置为向传感器数据组件提供包括实际度量和先前过程数据的工具过程数据。 此外，执行系统将模型输入提供给工具模型，并从工具模型接收模型输出。 执行系统基于传感器数据和模型输出提供一个或多个执行系统输出。 传感器数据可以包括测量的半导体器件特性。

公开(公告)号：US08772895B2

公开(公告)日：2014-07-08

申请号：US13305069

申请日：2011-11-28

申请人： Shou-Shu Lu ,  Hsun-Ying Huang ,  Hsin-Jung Huang ,  Chun-Mao Chiu ,  Chia-Chi Hsiao ,  Yung-Cheng Chang

发明人： Shou-Shu Lu ,  Hsun-Ying Huang ,  Hsin-Jung Huang ,  Chun-Mao Chiu ,  Chia-Chi Hsiao ,  Yung-Cheng Chang

IPC分类号： H01L27/146 ,  H01L31/0232 ,  H01L31/18

CPC分类号： H01L27/14687 ,  H01L27/14618 ,  H01L27/1462 ,  H01L27/14621 ,  H01L27/14627 ,  H01L27/14632 ,  H01L27/14636 ,  H01L27/1464 ,  H01L27/14683 ,  H01L27/14685 ,  H01L31/028 ,  H01L2924/0002 ,  H01L2924/00

摘要： Provided is a semiconductor image sensor device that includes a non-scribe-line region and a scribe-line region. The image sensor device includes a first substrate portion disposed in the non-scribe-line region. The first substrate portion contains a doped radiation-sensing region. The image sensor device includes a second substrate portion disposed in the scribe-line region. The second substrate portion has the same material composition as the first substrate portion. Also provided is a method of fabricating an image sensor device. The method includes forming a plurality of radiation-sensing regions in a substrate. The radiation-sensing regions are formed in a non-scribe-line region of the image sensor device. The method includes forming an opening in a scribe-line region of the image sensor device by etching the substrate in the scribe-line region. A portion of the substrate remains in the scribe-line region after the etching. The method includes filling the opening with an organic material.

摘要翻译： 提供了包括非划线区域和划线区域的半导体图像传感器装置。 图像传感器装置包括设置在非划线区域中的第一基板部分。 第一衬底部分包含掺杂的辐射感测区域。 图像传感器装置包括设置在划线区域中的第二基板部分。 第二基板部分具有与第一基板部分相同的材料组成。 还提供了一种制造图像传感器装置的方法。 该方法包括在衬底中形成多个辐射感测区域。 辐射感测区域形成在图像传感器装置的非划线区域中。 该方法包括通过在划线区域中蚀刻基板来在图像传感器装置的划线区域中形成开口。 在蚀刻之后，衬底的一部分保留在划线区域中。 该方法包括用有机材料填充开口。

公开(公告)号：US08593609B2

公开(公告)日：2013-11-26

申请号：US12980347

申请日：2010-12-29

申请人： Wen-Chun Wang ,  Hsi-Rong Han ,  Yung-Cheng Chang ,  Ming-Chang Yu ,  Wan-Jen Tsai ,  Fa-Chen Wu

发明人： Wen-Chun Wang ,  Hsi-Rong Han ,  Yung-Cheng Chang ,  Ming-Chang Yu ,  Wan-Jen Tsai ,  Fa-Chen Wu

IPC分类号： G02F1/1345 ,  G02F1/1335 ,  H01L31/036

CPC分类号： G02F1/1345 ,  G02F1/133512 ,  G02F2001/13456

摘要： A display panel includes a first substrate, a conductive light-shielding pattern, color filter patterns, a second substrate, scan lines, data lines, pixel structures, third pads and fourth pads. The conductive light-shielding pattern disposed on the first substrate defines conductive matrix pattern, first pads, and second pads. Each first pad is electrically connected to one corresponding second pad through the conductive matrix pattern and insulated with other second pads. The color filter patterns are disposed on the first substrate and a portion of each color filter pattern overlaps the conductive light-shielding pattern. The third pads are one-to-one electrically to the first pads while the fourth pads are one-to-one electrically connected to the second pads. Each fourth pad is electrically connected to one of the scan lines and one of the data lines.

摘要翻译： 显示面板包括第一基板，导电遮光图案，滤色器图案，第二基板，扫描线，数据线，像素结构，第三焊盘和第四焊盘。 设置在第一基板上的导电遮光图案限定导电矩阵图案，第一垫片和第二垫片。 每个第一焊盘通过导电矩阵图案电连接到一个对应的第二焊盘，并与其他第二焊盘绝缘。 滤色器图案设置在第一基板上，并且每个滤色器图案的一部分与导电遮光图案重叠。 第三焊盘与第一焊盘电一对一，而第四焊盘与第二焊盘电连接。 每个第四焊盘电连接到扫描线之一和数据线之一。

公开(公告)号：US08482703B2

公开(公告)日：2013-07-09

申请号：US12835145

申请日：2010-07-13

申请人： Wen-Chun Wang ,  Ming-Chang Yu ,  Yung-Cheng Chang

发明人： Wen-Chun Wang ,  Ming-Chang Yu ,  Yung-Cheng Chang

IPC分类号： G02F1/1335

CPC分类号： G02F1/133555 ,  G02F2001/134318

摘要： A transflective liquid crystal display is provided which includes a color-filter substrate, an active matrix substrate, and a liquid crystal layer interposed between them. The active matrix substrate includes a first transparent substrate and includes a plurality of switching devices, a plurality of transparent pixel electrodes and a plurality of reflective pixel electrodes formed on the first transparent substrate. The color-filter substrate includes a second transparent substrate, a first and second transparent conducting layers and a dielectric layer. The first transparent conducting layer is interposed between the second transparent substrate and the second transparent conducting layer, and the dielectric layer is interposed between the first and second transparent conducting layers. The second transparent conducting layer in each pixel area has at least one opening. The openings positionally correspond to the reflective pixel electrodes.

摘要翻译： 提供一种半透射型液晶显示器，其包括滤色器基板，有源矩阵基板和插入它们之间的液晶层。 有源矩阵基板包括第一透明基板，并且包括形成在第一透明基板上的多个开关元件，多个透明像素电极和多个反射像素电极。 滤色器基板包括第二透明基板，第一和第二透明导电层和电介质层。 第一透明导电层插入在第二透明基板和第二透明导电层之间，并且电介质层介于第一和第二透明导电层之间。 每个像素区域中的第二透明导电层具有至少一个开口。 开口位置对应于反射像素电极。

公开(公告)号：US20130084660A1

公开(公告)日：2013-04-04

申请号：US13335817

申请日：2011-12-22

申请人： Shou Shu Lu ,  Hsun-Ying Huang ,  I-Chang Lin ,  Chia-Chi Hsiao ,  Yung-Cheng Chang

发明人： Shou Shu Lu ,  Hsun-Ying Huang ,  I-Chang Lin ,  Chia-Chi Hsiao ,  Yung-Cheng Chang

IPC分类号： H01L21/66 ,  H01L31/02

CPC分类号： H01L31/1864 ,  H01L22/12 ,  H01L22/20 ,  H01L27/1463 ,  H01L27/1464 ,  H01L27/14643 ,  H01L27/14687 ,  H01L27/14689 ,  H01L27/14698

摘要： A method of forming an image sensor device includes forming a light sensing region at a front surface of a silicon substrate and a patterned metal layer there over. Thereafter, the method also includes performing an ion implantation process to the back surface of the silicon substrate and performing a green laser annealing process to the implanted back surface of the silicon substrate. The green laser annealing process uses an annealing temperature greater than or equal to about 1100° C. for a duration of about 100 to about 400 nsec. After performing the green laser annealing process, a silicon polishing process is performed on the back surface of the silicon substrate.

摘要翻译： 形成图像传感器装置的方法包括在硅衬底的前表面上形成感光区域，并在其上形成图案化的金属层。 此后，该方法还包括对硅衬底的背面进行离子注入工艺，并对硅衬底的注入背面进行绿色激光退火处理。 绿色激光退火工艺使用大于或等于约1100℃的退火温度约100至约400纳秒的持续时间。 在进行绿色激光退火处理之后，在硅衬底的背面进行硅研磨处理。

公开(公告)号：US20130009894A1

公开(公告)日：2013-01-10

申请号：US13542603

申请日：2012-07-05

申请人： Po-Hsien Wang ,  Wen-Chun Wang ,  Yung-Cheng Chang

发明人： Po-Hsien Wang ,  Wen-Chun Wang ,  Yung-Cheng Chang

IPC分类号： G06F3/041

CPC分类号： G06F3/041 ,  G06F2203/04103 ,  G06F2203/04111

摘要： A touch-sensitive display panel including a first panel, a second panel and a spacer layer is provided. The first panel has a touch-sensitive area. The second panel, parallel to the first panel, has a display area correspondingly located below the touch-sensitive area. The spacer layer is disposed between the first panel and the second panel and includes a plurality of conductive spacers for electrically connecting the first panel and the second panel.

摘要翻译： 提供了包括第一面板，第二面板和间隔层的触敏显示面板。 第一个面板具有触摸敏感区域。 平行于第一面板的第二面板具有相应地位于触敏区域下方的显示区域。 间隔层设置在第一面板和第二面板之间，并且包括用于电连接第一面板和第二面板的多个导电间隔件。

公开(公告)号：US20100060837A1

公开(公告)日：2010-03-11

申请号：US12555887

申请日：2009-09-09

申请人： Wen-Chun Wang ,  I-Fang Wang ,  Ming-Chang Yu ,  Yung-Cheng Chang

发明人： Wen-Chun Wang ,  I-Fang Wang ,  Ming-Chang Yu ,  Yung-Cheng Chang

IPC分类号： G02F1/1343 ,  G02F1/1337

CPC分类号： G02F1/134336 ,  G02F1/133707 ,  G02F2001/134345

摘要： A color washout reducing LCD panel including a first substrate, a second substrate and a liquid crystal layer sealed between the first and second substrates is provided. The first substrate includes several thin film transistors (TFTs) arranged in an array and several pixel electrodes each electrically connected to one TFT. Each pixel electrode has a first and a second electrode blocks. The first electrode block has several first slits, wherein a first interval of the first electrode block is perpendicular to the first slits, and a first width of the first electrode block is between any two neighboring first slits. The second electrode block has several second slits, wherein a second interval of the second electrode block is perpendicular to the second slit and not equal to the first interval, and a second width of the second electrode block is between any two neighboring second slits.

摘要翻译： 提供了包括第一基板，第二基板和密封在第一和第二基板之间的液晶层的彩色冲洗减少LCD面板。 第一衬底包括排列成阵列的几个薄膜晶体管（TFT）和每个电连接到一个TFT的几个像素电极。 每个像素电极具有第一和第二电极块。 第一电极块具有多个第一狭缝，其中第一电极块的第一间隔垂直于第一狭缝，第一电极块的第一宽度在任何两个相邻的第一狭缝之间。 第二电极块具有几个第二狭缝，其中第二电极块的第二间隔垂直于第二狭缝而不等于第一间隔，并且第二电极块的第二宽度在任何两个相邻的第二狭缝之间。

公开(公告)号：US20060293780A1

公开(公告)日：2006-12-28

申请号：US11168608

申请日：2005-06-28

申请人： Yung-Cheng Chang ,  H. Fu ,  Hades Lee ,  Yi-Ping Huang

发明人： Yung-Cheng Chang ,  H. Fu ,  Hades Lee ,  Yi-Ping Huang

IPC分类号： G06F19/00

CPC分类号： H01L21/67276 ,  G05B19/41875 ,  G05B2219/32181 ,  G05B2219/45031 ,  Y02P90/22

摘要： A system for tool monitoring is provided. The system comprises a first cassette, a second cassette, a processing tool, a first metrology tool, and a second metrology tool. The first cassette contains a first control wafer used for a first metrology process. The second cassette contains a second control wafer used for a second metrology process. The processing tool receives the first cassette and processes the first control wafer, and receives the second cassette and processes the second control wafer. The first metrology tool receives the first cassette from the processing tool, and performs the first metrology process on the first control wafer processed by the processing tool. The second metrology tool receives the second cassette from the processing tool, and performs the second metrology process on the second control wafer processed by the processing tool.

摘要翻译： 提供了一种用于工具监控的系统。 该系统包括第一盒，第二盒，处理工具，第一计量工具和第二计量工具。 第一盒包含用于第一计量过程的第一控制晶片。 第二盒包含用于第二计量过程的第二控制晶片。 处理工具接收第一盒并处理第一控制晶片，并接收第二盒并处理第二控制晶片。 第一计量工具从处理工具接收第一盒，并且在由处理工具处理的第一控制晶片上执行第一计量过程。 第二计量工具从处理工具接收第二盒，并且在由处理工具处理的第二控制晶片上执行第二计量处理。