摘要:
The present invention intends to provide a shower of a large diameter MOCVD reactor, and the difficulty for manufacturing the shower does not obviously increase when its size increases. The shower of a large diameter MOCVD reactor of the present invention comprises III group chamber, V group chamber and a cooling water chamber, and it is characterized in that, III group chamber, V group chamber and cooling water chamber are all separated as N chambers, wherein N is a natural number greater than or equal to 2 and each chamber is an individual unity.
摘要:
Provided is a substrate treatment apparatus. The substrate treatment apparatus includes a process chamber, a support unit disposed within the process chamber to support a substrate, and a nozzle unit disposed within the process chamber to spray gas. The nozzle unit includes a first nozzle spraying process gas, and a second nozzle spraying blocking gas onto an inner wall of the process chamber or an area adjacent to the support unit to prevent the process gas from being deposited on the inner wall of the process chamber or the support unit.
摘要:
A film-forming apparatus capable of discharging a feedstock gas and a reactive gas to an inner side of the vacuum chamber by more effectively cooling the gases without mixing them in comparison with the conventional art. A discharge plate having a first face exposed inside the vacuum chamber is provided with a plurality of feedstock gas introduction holes and a plurality of reactive gas introduction holes penetrating the discharge plate. A plurality of grooves having the feedstock gas introduction holes located on the bottom face are formed in the second face opposite to the first face of the discharge plate, a top plate that covers the groove is arranged over the second face, and the feedstock gas through-hole formed in the top plate and the feedstock gas introduction hole are connected to each other with the first auxiliary pipe.
摘要:
A temperature controlled showerhead for chemical vapor deposition (CVD) chambers enhances heat dissipation to enable accurate temperature control with an electric heater. Heat dissipates by conduction through a showerhead stem and fluid passageway and radiation from a back plate. A temperature control system includes one or more temperature controlled showerheads in a CVD chamber with fluid passageways serially connected to a heat exchanger.
摘要:
An area S (m2) of a facing surface of each of injectors which faces a glass ribbon is set so as to satisfy: S≦(0.0116×P×Cg×T)/{ε×F×σ(Tgla4−Tinj4)}, wherein P is an output (ton/day) of the glass ribbon; Cg is a specific heat (J/(kg·° C.)) of the glass; T is an acceptable temperature drop (° C.); ε is radiation factor; F is a surface-to-surface view factor; σ is Boltzmann's constant; Tgla is a temperature (K) of the glass ribbon represented by K=(Tin+Tout)/2 where Tin and Tout are measured values of the glass ribbon at the inlet and outlet of the injector, respectively; and Tinj is a temperature (K) of the facing surface of the injector.
摘要:
Substrate processing apparatus and gas distribution apparatus are provided herein. In some embodiments, a gas distribution apparatus includes a first quartz layer having a plurality of openings disposed through the first quartz layer; a second quartz layer coupled to the first quartz layer; a first plenum fluidly coupled to a first set of the plurality of openings and disposed between the first quartz layer and the second quartz layer; a second plenum fluidly coupled to a second set of the plurality of openings and disposed between the first quartz layer and the second quartz layer; and one or more outlets disposed on a side of the gas distribution apparatus opposite the plurality of openings disposed through the first quartz layer to provide a gas to the side of the gas distribution apparatus opposite the first quartz layer.
摘要:
In a coating apparatus, a distributor plate 104 is disposed upstream of a silicon wafer 101 relative to the direction of flow of reactive gas. The distributor plate 104 has therein first through-holes 104a and second through-holes 104b arranged so as not to meet the first through-holes 104a. The reactive gas passes through the first through-holes 104a and flows down toward the silicon wafer 101. Further, a cooling gas passes through the second through-holes 104b.
摘要:
A showerhead for chemical vapor deposition (CVD) includes a head storing reaction gas flowing thereinto and feeding the stored reaction gas to a reaction chamber, and at least one support member passing through and coupled with the head and the reaction chamber so as to support the head.
摘要:
A method and apparatus for processing a substrate is provided. In one embodiment, the apparatus is in the form of a processing chamber that includes a chamber body having a processing volume defined therein. A substrate support, a gas delivery tube assembly and a plasma line source are disposed in the processing volume. The gas delivery tube assembly includes an inner tube is disposed in an outer tube. The inner tube has a passage for flowing a cooling fluid therein. The outer tube has a plurality of gas distribution apertures for providing processing gas into the processing volume.
摘要:
Embodiments of the present invention generally provide a showerhead assembly made of multiple plates fastened together. The showerhead assembly includes a gas manifold defined by a top and middle plate and a diverter plate defined by the middle plate and a bottom, heat exchange plate. A first processing gas enters the gas manifold and is diverted by the diverter plate through the bottom plate. A second processing gas enters the gas manifold and is diverted by the diverter plate through the bottom plate such that the second and first processing gases do not mix prior to exiting the showerhead. In one embodiment, the first processing gas can be distributed through central and outer regions of the showerhead at different flow rates and/or pressures. In addition, the second processing gas can be distributed through the central and outer regions of the showerhead at different flow rates and/or pressures.