ADDRESS FAULT DETECTION IN A MEMORY SYSTEM
    217.
    发明公开

    公开(公告)号:US20230162794A1

    公开(公告)日:2023-05-25

    申请号:US17588198

    申请日:2022-01-28

    Inventor: Hieu Van Tran

    CPC classification number: G11C16/08 G11C16/0425 G11C16/26 H01L27/11521

    Abstract: Various examples of memory systems comprising an address fault detection system are disclosed. The memory system comprises a first memory array, a row decoder, and an address fault detection system comprising a second array, wherein the row decoder decodes row addresses into word lines, each word line coupled to a row of cells in the first array and a row of cells in the second array. The second array contains digital bits and/or analog values that are used to identify address faults.

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