Method for checking the refresh function of an information memory
    21.
    发明授权
    Method for checking the refresh function of an information memory 失效
    检查信息存储器的刷新功能的方法

    公开(公告)号:US07437629B2

    公开(公告)日:2008-10-14

    申请号:US10607518

    申请日:2003-06-26

    IPC分类号: G11C29/00

    摘要: A method for checking the refresh function of a memory having a refresh device includes the steps of, first, ascertaining whether or not refresh request pulses are being produced on the information memory and, if so, at what intervals of time from one another these refresh request pulses are produced. Next, a control unit for the information memory is supplied with refresh test pulses produced outside of the information memory instead of being supplied with the refresh request pulses. Then, the refresh test pulses are used to check a refresh device situated on the information memory.

    摘要翻译: 一种用于检查具有刷新装置的存储器的刷新功能的方法,包括以下步骤:首先确定在信息存储器上是否正在产生刷新请求脉冲,如果是,则在彼此间隔多少时间间隔,刷新 产生请求脉冲。 接下来,用于信息存储器的控制单元被提供有在信息存储器外部产生的刷新测试脉冲,而不是被提供刷新请求脉冲。 然后,刷新测试脉冲用于检查位于信息存储器上的刷新设备。

    Methods of programming a memory cell and memory cell arrangements
    22.
    发明申请
    Methods of programming a memory cell and memory cell arrangements 审中-公开
    编程存储器单元和存储单元布置的方法

    公开(公告)号:US20080080252A1

    公开(公告)日:2008-04-03

    申请号:US11541401

    申请日:2006-09-29

    CPC分类号: G11C16/16

    摘要: A method of programming a memory cell is provided that includes determining whether the memory cell has been neutralized in accordance with a predefined program neutralizing criterion. If the memory cell has not been neutralized in accordance with the predefined program neutralizing criterion, the memory cell is neutralized in accordance with a selected program neutralizing process. Furthermore, the method includes programming the memory cell.

    摘要翻译: 提供一种编程存储器单元的方法,其包括根据预定的程序中和标准来确定存储器单元是否已被中和。 如果存储器单元未按照预定的程序中和标准被中和,则根据所选择的程序中和处理来中和存储单元。 此外,该方法包括对存储器单元进行编程。

    Semiconductor memory and method for operating a semiconductor memory comprising a plurality of memory cells
    24.
    发明授权
    Semiconductor memory and method for operating a semiconductor memory comprising a plurality of memory cells 有权
    用于操作包括多个存储单元的半导体存储器的半导体存储器和方法

    公开(公告)号:US07190605B1

    公开(公告)日:2007-03-13

    申请号:US11240659

    申请日:2005-09-30

    IPC分类号: G11C17/00

    CPC分类号: G11C16/3418

    摘要: A method for operating a semiconductor memory (M) including a plurality of memory cells (MC), wherein the memory cells (MC) are arranged adjacent to one another, the arrangement starts with a first memory cell (MF) and ends with a last memory cell (ML), each memory cell (MC) has a first side (S) and a second side (D), the memory cells (MC) are connected by a bitline (BL) on the first side (S) of the memory cell and connected by another bitline (BL) on the second side (D) of the memory cell, the first side (S) of a memory cell is connected to a same bitline (BL) as the second side (D) of an adjacent memory cell, each of the memory cells (MC) is connected by a same wordline (WL), including the steps of: selecting a memory cell (MC) for operation, applying a first potential (VS) to all the bitlines (BL) connected to memory cells (MC) arranged to the first side (S) of the memory cell, applying a second potential (VD) to all the bitlines (BL) connected to memory cells (MC) arranged to the second side (D) of the memory cell, and performing the desired operation on the memory cell (MC).

    摘要翻译: 一种用于操作包括多个存储单元(MC)的半导体存储器(M)的方法,其中所述存储单元(MC)彼此相邻布置,所述布置从第一存储单元(MF)开始并以最后一个结束 存储单元(ML),每个存储单元(MC)具有第一侧(S)和第二侧(D),存储单元(MC)通过位线(S)的第一侧(S)上的位线 存储单元并且通过存储单元的第二侧(D)上的另一位线(BL)连接,存储单元的第一侧(S)连接到与第一侧(D)相同的位线(BL) 每个存储器单元(MC)由相同的字线(WL)连接,包括以下步骤:选择用于操作的存储单元(MC),向所有位线(BL)施加第一电位(VS) )连接到被布置到存储器单元的第一侧(S)的存储器单元(MC),对连接到布置在存储单元(MC)的存储单元(MC)的所有位线施加第二电位(VD) (D),并且对存储单元(MC)执行所需的操作。

    X-ray examining device with automatic timer and film container for an
X-ray examining device
    25.
    发明授权
    X-ray examining device with automatic timer and film container for an X-ray examining device 失效
    具有X射线检查装置的自动计时器和胶片容器的X射线检查装置

    公开(公告)号:US4121104A

    公开(公告)日:1978-10-17

    申请号:US751473

    申请日:1976-12-16

    申请人: Detlev Richter

    发明人: Detlev Richter

    IPC分类号: G01N23/18 G03B42/02 G01J1/42

    CPC分类号: G03B42/02

    摘要: X-ray examination apparatus includes means for terminating an exposure at a dose determined, in part, by the value of the tube voltage and the characteristics of the intensifying screen in use. Means are provided to read screen-identifying markings on film cassettes and to adjust the turn-off dose level in response thereto.

    摘要翻译: X射线检查装置包括用于以部分确定的剂量终止曝光的装置,其中管道电压的值和使用中的增强屏幕的特性。 提供了用于读取胶片盒上的屏幕识别标记并响应于此调整关闭剂量水平的装置。