摘要:
A method for checking the refresh function of a memory having a refresh device includes the steps of, first, ascertaining whether or not refresh request pulses are being produced on the information memory and, if so, at what intervals of time from one another these refresh request pulses are produced. Next, a control unit for the information memory is supplied with refresh test pulses produced outside of the information memory instead of being supplied with the refresh request pulses. Then, the refresh test pulses are used to check a refresh device situated on the information memory.
摘要:
A method of programming a memory cell is provided that includes determining whether the memory cell has been neutralized in accordance with a predefined program neutralizing criterion. If the memory cell has not been neutralized in accordance with the predefined program neutralizing criterion, the memory cell is neutralized in accordance with a selected program neutralizing process. Furthermore, the method includes programming the memory cell.
摘要:
A memory system includes a plurality of resistive memory cell fields including at least a first resistive memory cell field and a second resistive memory cell field, the first resistive memory cell field formed with a plurality of resistive memory cells storing data at a first data storage speed, the second resistive memory cell field formed with a plurality of resistive memory cells storing data at a second data storage speed lower than the first data storage speed, and a controller controlling data transfer between the plurality of resistive memory cell fields.
摘要:
A method for operating a semiconductor memory (M) including a plurality of memory cells (MC), wherein the memory cells (MC) are arranged adjacent to one another, the arrangement starts with a first memory cell (MF) and ends with a last memory cell (ML), each memory cell (MC) has a first side (S) and a second side (D), the memory cells (MC) are connected by a bitline (BL) on the first side (S) of the memory cell and connected by another bitline (BL) on the second side (D) of the memory cell, the first side (S) of a memory cell is connected to a same bitline (BL) as the second side (D) of an adjacent memory cell, each of the memory cells (MC) is connected by a same wordline (WL), including the steps of: selecting a memory cell (MC) for operation, applying a first potential (VS) to all the bitlines (BL) connected to memory cells (MC) arranged to the first side (S) of the memory cell, applying a second potential (VD) to all the bitlines (BL) connected to memory cells (MC) arranged to the second side (D) of the memory cell, and performing the desired operation on the memory cell (MC).
摘要:
X-ray examination apparatus includes means for terminating an exposure at a dose determined, in part, by the value of the tube voltage and the characteristics of the intensifying screen in use. Means are provided to read screen-identifying markings on film cassettes and to adjust the turn-off dose level in response thereto.
摘要:
A memory system having a plurality of memory cells for storing payload data and redundancy data. The memory system having a read-out circuit configured to read-out a status of the plurality of memory cells, the read-out status having payload data, redundancy data and associated reliability information. Moreover, the memory system has a data processor configured to derive the payload data from the read-out status using the reliability information.
摘要:
In an embodiment, an integrated circuit having a memory cell arrangement is provided. The memory cell arrangement may include a memory cell block having a plurality of memory cells, a storage portion configured to store information about a quality characteristic of the memory cells of the memory cell block, and a controller configured to control a read operation, and to change the information about the quality characteristic depending on a quality of a read operation.
摘要:
Embodiments of the invention relate generally to an integrated circuit having a memory cell arrangement and a method for reading a memory cell state using a plurality of partial readings. In an embodiment of the invention, an integrated circuit having a memory cell arrangement is provided. The memory cell arrangement may include at least one memory cell, the memory cell being capable of storing a plurality of memory cell states being distinguishable by a predefined number of memory cell threshold values, and a controller configured to read a memory cell state of the at least one memory cell using a number of reference levels that is higher than the predefined number of memory cell threshold values, wherein the reading includes a first partial reading using a first set of a plurality of reference levels and a second partial reading using a second set of a plurality of reference levels, wherein the second set of a plurality of reference levels includes at least one reference level which is different from the reference levels of the first set of a plurality of reference levels.
摘要:
In an embodiment of the invention, a method of operating an integrated circuit for reading the logical state of a selected one of a plurality of memory cells included within a memory cell string in the integrated circuit is provided.
摘要:
Embodiments of the invention relate to a method for accessing a memory cell in an integrated circuit, a method of determining a set of word line voltage identifiers in an integrated circuit, a method for classifying memory cells in an integrated circuit, a method for determining a word line voltage for accessing a memory cell in an integrated circuit and integrated circuits. In an embodiment, a method of accessing a memory cell in an integrated circuit, wherein the integrated circuit has a memory cell field including a plurality of memory cells. The method includes selecting a word line voltage identifier from a pre-stored set of word line voltage identifiers, each one of the pre-stored set of word line voltage identifiers being assigned to at least one of the memory cells in the memory cell field and accessing the memory cell using a word line voltage being dependent on the selected word line voltage identifier.