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21.
公开(公告)号:US11067628B2
公开(公告)日:2021-07-20
申请号:US16577267
申请日:2019-09-20
Applicant: Micron Technology, Inc.
Inventor: Chiaki Dono , Chikara Kondo , Ryo Fujimaki
IPC: G01R31/00 , G01R31/3177 , G11C29/12 , H01L25/18 , G11C11/4093
Abstract: Disclosed herein are systems, methods, and devices that enable access to a first interface control circuit via test probes of a second interface. In some embodiments a memory device includes a first interface including first ports that are inaccessible to a test probe. The memory device also includes a first interface control circuit configured to control operation of the first interface. The memory device further includes a second interface including second ports. At least a portion of the second ports include test pads that are accessible to the test probe. In addition, the memory device includes a multiplexer configured to operably couple the first interface and at least a portion of the second interface to the first interface control circuit. The multiplexer is configured to selectively enable test probe access to the first interface control circuit via the test pads.
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22.
公开(公告)号:US20210088583A1
公开(公告)日:2021-03-25
申请号:US16577267
申请日:2019-09-20
Applicant: Micron Technology, Inc.
Inventor: Chiaki Dono , Chikara Kondo , Ryo Fujimaki
IPC: G01R31/3177 , G11C11/4093 , H01L25/18 , G11C29/12
Abstract: Disclosed herein are systems, methods, and devices that enable access to a first interface control circuit via test probes of a second interface. In some embodiments a memory device includes a first interface including first ports that are inaccessible to a test probe. The memory device also includes a first interface control circuit configured to control operation of the first interface. The memory device further includes a second interface including second ports. At least a portion of the second ports include test pads that are accessible to the test probe. In addition, the memory device includes a multiplexer configured to operably couple the first interface and at least a portion of the second interface to the first interface control circuit. The multiplexer is configured to selectively enable test probe access to the first interface control circuit via the test pads.
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公开(公告)号:US10943625B2
公开(公告)日:2021-03-09
申请号:US16721515
申请日:2019-12-19
Applicant: Micron Technology, Inc.
Inventor: Chikara Kondo , Tomoyuki Shibata , Chiaki Dono , Seiji Narui , Minehiko Uehara , Taihei Shido , Homare Sato
Abstract: Apparatuses and methods for transmitting data between a plurality of chips are described. An example apparatus includes: a first chip, wherein the first chip includes a receiver that receives a data strobe signal and further generates an internal strobe signal responsive, at least in part, to the data strobe signal, the internal strobe signal including a first edge and a second edge following the first edge; a buffer circuit coupled to a set of input terminals and captures first data at the set of input terminals responsive, at least in part, to the first edge of the internal strobe signal and further captures second data at the set of input terminals responsive, at least in part, to the second edge of the internal strobe signal; a driver coupled between the buffer circuit and a set of data terminals and configured to be activated to provide the first and second data from the buffer circuit to the set of data terminals responsive, at least in part, to a control signal; and a width expanding circuit that provides the control signal responsive, at least in part, to the internal strobe signal.
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公开(公告)号:US10915487B2
公开(公告)日:2021-02-09
申请号:US16553552
申请日:2019-08-28
Applicant: Micron Technology, Inc.
Inventor: Akinori Funahashi , Chikara Kondo
Abstract: Apparatus and methods structured with respect to a data bus having a number of data lines and a number of shield lines can be implemented in a variety of applications. Such apparatus and methods can include driver and receiver circuits that operate to generate and/or decode a data bit inversion signal associated with data propagated on data lines of the data bus. The driver and receiver circuits may be arranged to operate on a two bit basis to interface with the data bus having data lines grouped with respect to the two bits with shield lines for the respective two bit data lines.
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25.
公开(公告)号:US20200211617A1
公开(公告)日:2020-07-02
申请号:US16811738
申请日:2020-03-06
Applicant: Micron Technology, Inc.
Inventor: Yuan He , Chikara Kondo , Daigo Toyama
IPC: G11C11/4074 , G11C11/406 , G11C11/4093 , G11C11/4096 , G11C5/14
Abstract: Disclosed herein is an apparatus that includes a first semiconductor chip including a memory cell array having a volatile memory cell and an access control circuit configured to perform a refresh operation on the volatile memory cell, and a second semiconductor chip including a power generator configured to supply a first power supply voltage to the first semiconductor chip. The access control circuit is configured to activate a first enable signal during the refresh operation. The second semiconductor chip is configured to change a capability of the power generator based on the first enable signal.
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26.
公开(公告)号:US20200066324A1
公开(公告)日:2020-02-27
申请号:US16107998
申请日:2018-08-21
Applicant: Micron Technology, Inc.
Inventor: Yuan He , Chikara Kondo , Daigo Toyama
IPC: G11C11/4074 , G11C5/14 , G11C11/406 , G11C11/4093 , G11C11/4096
Abstract: Disclosed herein is an apparatus that includes a first semiconductor chip including a memory cell array having a volatile memory cell and an access control circuit configured to perform a refresh operation on the volatile memory cell, and a second semiconductor chip including a power generator configured to supply a first power supply voltage to the first semiconductor chip. The access control circuit is configured to activate a first enable signal during the refresh operation. The second semiconductor chip is configured to change a capability of the power generator based on the first enable signal.
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公开(公告)号:US20190122708A1
公开(公告)日:2019-04-25
申请号:US16225303
申请日:2018-12-19
Applicant: Micron Technology, Inc.
Inventor: Chikara Kondo , Tomoyuki Shibata , Chiaki Dono , Seiji Narui , Minehiko Uehara , Taihei Shido , Homare Sato
Abstract: Apparatuses and methods for transmitting data between a plurality of chips are described. An example apparatus includes: a first chip, wherein the first chip includes a receiver that receives a data strobe signal and further generates an internal strobe signal responsive, at least in part, to the data strobe signal, the internal strobe signal including a first edge and a second edge following the first edge; a buffer circuit coupled to a set of input terminals and captures first data at the set of input terminals responsive, at least in part, to the first edge of the internal strobe signal and further captures second data at the set of input terminals responsive, at least in part, to the second edge of the internal strobe signal; a driver coupled between the buffer circuit and a set of data terminals and configured to be activated to provide the first and second data from the buffer circuit to the set of data terminals responsive, at least in part, to a control signal; and a width expanding circuit that provides the control signal responsive, at least in part, to the internal strobe signal.
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公开(公告)号:US20180341575A1
公开(公告)日:2018-11-29
申请号:US15606956
申请日:2017-05-26
Applicant: Micron Technology, Inc.
Inventor: Seiji Narui , Homare Sato , Chikara Kondo
IPC: G06F12/02 , H01L23/522
CPC classification number: G06F12/02 , G06F2212/1016 , G06F2212/1028 , H01L23/5226
Abstract: An example apparatus includes a first semiconductor chip and a second semiconductor chip; and a first via and a plurality of second vias coupling the first semiconductor chip and the second semiconductor chip. The first semiconductor chip provides a first timing signal to the first via and further provides first data responsive to the first timing signal to the plurality of second vias. The second semiconductor chip receives the first timing signal from the first via and the first data from the plurality of second vias and further provides the first data responsive to the first timing signal, when the first semiconductor chip is designated, and provides a second timing signal and further provides second data responsive to the second timing signal, when the second semiconductor chip is designated.
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公开(公告)号:US20170365356A1
公开(公告)日:2017-12-21
申请号:US15183654
申请日:2016-06-15
Applicant: Micron Technology, Inc.
Inventor: Tomoyuki Shibata , Chikara Kondo , Hiroyuki Tanaka
CPC classification number: G11C29/38 , G11C5/025 , G11C29/1201 , G11C29/14 , G11C29/36 , G11C29/42 , G11C29/44 , G11C29/4401 , G11C29/48 , G11C29/78 , G11C29/846 , G11C2029/0407 , G11C2029/1208 , G11C2029/3602 , G11C2029/4402
Abstract: Apparatuses and methods of sharing error correction memory on an interface chip are described. An example apparatus includes: at least one memory chip having a plurality of first memory cells and an interface chip coupled to the at least one memory chip and having a control circuit and a storage area. The control circuit detects one or more defective memory cells of the first memory cells of the at least one memory chip. The control circuit further stores first defective address information of the one or more defective memory cells of the first memory cells into the storage area. The interface chip responds to the first defective address information and an access request to access the storage area in place of the at least one memory chip when the access request has been provided with respect to the one or more defective memory cells of the first memory cells.
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公开(公告)号:US20150213860A1
公开(公告)日:2015-07-30
申请号:US14607858
申请日:2015-01-28
Applicant: Micron Technology, Inc.
Inventor: Seiji Narui , Chikara Kondo
IPC: G11C7/22 , H01L25/065 , G11C7/10 , G11C5/02 , G11C5/06
CPC classification number: G11C7/22 , G11C5/02 , G11C5/063 , G11C7/10 , G11C11/4097 , H01L25/0657 , H01L2224/11 , H01L2924/0002 , H01L2924/00
Abstract: A semiconductor device disclosed in this disclosure includes a first terminal formed above a first surface of a semiconductor substrate, a second terminal formed above a second surface of the semiconductor substrate opposite to the first surface, a first through substrate via (TSV) penetrating the semiconductor substrate, and a first-in first-out (FIFO) circuit, wherein the first TSV and the FIFO circuit are coupled in series between the first terminal and the second terminal.
Abstract translation: 本公开中公开的半导体器件包括形成在半导体衬底的第一表面上的第一端子,形成在与第一表面相对的半导体衬底的第二表面上方的第二端子,穿过半导体的第一贯穿衬底通孔(TSV) 基板和先进先出(FIFO)电路,其中第一TSV和FIFO电路串联耦合在第一端子和第二端子之间。
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