公开(公告)号：US20180315685A1

公开(公告)日：2018-11-01

申请号：US16020353

申请日：2018-06-27

Applicant: RENESAS ELECTRONICS CORPORATION

Inventor： Atsushi NISHIKIZAWA ,  Yuichi YATO ,  Hiroi OKA ,  Tadatoshi DANNO ,  Hiroyuki NAKAMURA

IPC: H01L23/495 ,  H01L21/56 ,  H01L21/48 ,  H01L23/31 ,  H01L23/00

CPC classification number: H01L23/49513 ,  H01L21/4825 ,  H01L21/565 ,  H01L23/3107 ,  H01L23/3114 ,  H01L23/4952 ,  H01L23/49562 ,  H01L23/49568 ,  H01L23/49575 ,  H01L24/06 ,  H01L2224/05554 ,  H01L2224/32245 ,  H01L2224/45144 ,  H01L2224/48137 ,  H01L2224/48247 ,  H01L2224/73265 ,  H01L2224/83192 ,  H01L2224/92247 ,  H01L2924/181 ,  H01L2924/00012 ,  H01L2924/00

Abstract: In a resin sealing type semiconductor device, a semiconductor chip CP2 is mounted over a die pad DP having conductivity via a bonding member BD2 having insulation property, and a semiconductor chip CP1 is mounted over the die pad DP via a bonding member BD1 having conductivity. A first length of a portion, in a first side formed by an intersection of a first side surface and a second side surface of the semiconductor chip CP2, covered with the bonding member BD2 is larger than a second length of a portion, in a second side formed by an intersection of a third side surface and a fourth side surface of the semiconductor chip CP1, covered with the bonding member BD1.

公开(公告)号：US20140084440A1

公开(公告)日：2014-03-27

申请号：US14090295

申请日：2013-11-26

Applicant: HITACHI HOKKAI SEMICONDUCTOR LTD. ,  RENESAS ELECTRONICS CORPORATION

Inventor： Hajime HASEBE ,  Tadatoshi DANNO ,  Yukihiro SATOU

IPC: H01L23/49

CPC classification number: H01L23/49503 ,  H01L21/4853 ,  H01L21/563 ,  H01L23/3107 ,  H01L23/3121 ,  H01L23/49 ,  H01L23/4952 ,  H01L23/49548 ,  H01L24/29 ,  H01L24/32 ,  H01L24/45 ,  H01L24/48 ,  H01L24/49 ,  H01L24/73 ,  H01L24/97 ,  H01L2224/26175 ,  H01L2224/27013 ,  H01L2224/29339 ,  H01L2224/32057 ,  H01L2224/32245 ,  H01L2224/32257 ,  H01L2224/45144 ,  H01L2224/48091 ,  H01L2224/48095 ,  H01L2224/48247 ,  H01L2224/48253 ,  H01L2224/48257 ,  H01L2224/484 ,  H01L2224/48463 ,  H01L2224/48599 ,  H01L2224/48639 ,  H01L2224/49171 ,  H01L2224/73265 ,  H01L2224/83051 ,  H01L2224/83101 ,  H01L2224/83385 ,  H01L2224/85439 ,  H01L2224/92 ,  H01L2224/92247 ,  H01L2224/97 ,  H01L2924/00014 ,  H01L2924/01004 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01014 ,  H01L2924/01015 ,  H01L2924/01023 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01039 ,  H01L2924/01047 ,  H01L2924/01067 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/01087 ,  H01L2924/014 ,  H01L2924/15151 ,  H01L2924/15747 ,  H01L2924/181 ,  H01L2924/351 ,  Y10T29/49121 ,  H01L2224/85 ,  H01L2924/00012 ,  H01L2924/3512 ,  H01L2924/00 ,  H01L2224/05599

Abstract: In a non-leaded type semiconductor device, a tab, tab suspension leads, and other leads are exposed to one surface of a seal member. A semiconductor element is positioned within the seal member and fixed to a surface of the tab with an adhesive. The tab is formed larger than the semiconductor element so that outer peripheral edges of the tab are positioned outside outer peripheral edges of the semiconductor element. A groove is formed in the tab surface portion positioned between the area to which the semiconductor element is fixed and wire connection areas to which the wires are connected, the groove being formed so as to surround the semiconductor element fixing area, thereby preventing peeling-off between the tab to which the semiconductor element is fixed and the resin which constitutes the package.

Abstract translation: 在非引线型半导体器件中，突片，突片悬挂引线和其它引线暴露于密封构件的一个表面。 半导体元件被定位在密封构件内并用粘合剂固定到突片的表面。 突片形成为比半导体元件大，使得突片的外周边缘位于半导体元件的外周边缘的外侧。 在位于半导体元件固定的区域与电线连接的电线连接区域之间的突片表面部分中形成有沟槽，该沟槽形成为围绕半导体元件固定区域，从而防止剥离 在半导体元件固定的突片与构成封装的树脂之间。

公开(公告)号：US20140054759A1

公开(公告)日：2014-02-27

申请号：US14070676

申请日：2013-11-04

Applicant: Renesas Electronics Corporation

Inventor： Tadatoshi DANNO ,  Hiroyoshi TAYA ,  Yoshiharu SHIMIZU

IPC: H01L23/495

CPC classification number: H01L23/562 ,  H01L21/4825 ,  H01L21/4842 ,  H01L21/565 ,  H01L21/67144 ,  H01L21/6715 ,  H01L21/78 ,  H01L23/3107 ,  H01L23/3114 ,  H01L23/49503 ,  H01L23/4952 ,  H01L23/49524 ,  H01L23/49548 ,  H01L23/544 ,  H01L24/32 ,  H01L24/45 ,  H01L24/48 ,  H01L24/49 ,  H01L24/73 ,  H01L24/83 ,  H01L2223/54486 ,  H01L2224/05554 ,  H01L2224/32014 ,  H01L2224/32245 ,  H01L2224/45144 ,  H01L2224/48091 ,  H01L2224/48247 ,  H01L2224/484 ,  H01L2224/48599 ,  H01L2224/49171 ,  H01L2224/73265 ,  H01L2924/01004 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01046 ,  H01L2924/01047 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/014 ,  H01L2924/12042 ,  H01L2924/157 ,  H01L2924/181 ,  H01L2924/3025 ,  H01L2924/3512 ,  H01L2924/3701 ,  H01L2924/00014 ,  H01L2924/00012 ,  H01L2924/00

Abstract: A non-leaded semiconductor device comprises a sealing body for sealing a semiconductor chip, a tab in the interior of the sealing body, suspension leads for supporting the tab, leads having respective surfaces exposed to outer edge portions of a back surface of the sealing body, and wires connecting pads formed on the semiconductor chip and the leads. End portions of the suspension leads positioned in an outer periphery portion of the sealing body are unexposed to the back surface of the sealing body, but are covered with the sealing body. Stand-off portions of the suspending leads are not formed in resin molding. When cutting the suspending leads, corner portions of the back surface of the sealing body are supported by a flat portion of a holder portion in a cutting die having an area wider than a cutting allowance of the suspending leads, whereby chipping of the resin is prevented.

Abstract translation: 非铅半导体器件包括用于密封半导体芯片的密封体，密封体内部的突片，用于支撑突片的悬挂引线，具有暴露于密封体的后表面的外边缘部分的各个表面的引线 以及形成在半导体芯片和引线上的焊盘连接焊盘。 位于密封体的外周部的悬架引线的端部未被暴露在密封体的背面，而被密封体覆盖。 悬挂引线的分离部分不会在树脂模制中形成。 当切割悬挂引线时，密封体的后表面的角部由切割模具中的保持器部分的平坦部分支撑，该切割模具的面积大于悬挂引线的切割余量，从而防止树脂碎裂 。