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    DETECTOR FOR X-RAYS WITH HIGH SPATIAL AND HIGH SPECTRAL RESOLUTION
    22.
    发明申请
    DETECTOR FOR X-RAYS WITH HIGH SPATIAL AND HIGH SPECTRAL RESOLUTION 审中-公开
    具有高空间和高光谱分辨率的X射线探测器

    公开(公告)号：US20170052128A1

    公开(公告)日：2017-02-23

    申请号：US15240972

    申请日：2016-08-18

    Applicant: SIGRAY, INC.

    Inventor： Wenbing Yun ,  Sylvia Jia Yun Lewis ,  Janos Kirz ,  Benjamin Donald Stripe

    IPC: G01N23/22 ,  G01N23/223 ,  G01N23/20

    CPC classification number: G01N23/223 ,  G01N23/04 ,  G01N23/20058 ,  G01N2223/052 ,  G01N2223/056 ,  G01N2223/076

    Abstract: An x-ray spectrometer system comprising an x-ray imaging system with at least one achromatic imaging x-ray optic and an x-ray detection system. The optical train of the imaging system is arranged so that its object focal plane partially overlaps an x-ray emitting volume of an object. An image of a portion of the object is formed with a predetermined image magnification at the x-ray detection system. The x-ray detection system has both high spatial and spectral resolution, and converts the detected x-rays to electronic signals. In some embodiments, the detector system may have a small aperture placed in the image plane, and use a silicon drift detector to collect x-rays passing through the aperture. In other embodiments, the detector system has an energy resolving pixel array x-ray detector. In other embodiments, wavelength dispersive elements may be used in either the optical train or the detector system.

    Abstract translation: 一种X射线光谱仪系统，包括具有至少一个消色差成像x射线光学元件和x射线检测系统的x射线成像系统。 成像系统的光学系列被布置成使得其物体焦平面部分地与物体的x射线发射体积重叠。 物体的一部分的图像在x射线检测系统处以预定的图像倍率形成。 x射线检测系统具有高空间和光谱分辨率，并将检测到的x射线转换为电子信号。 在一些实施例中，检测器系统可以具有放置在图像平面中的小孔，并且使用硅漂移检测器来收集穿过孔的x射线。 在其他实施例中，检测器系统具有能量分辨像素阵列x射线检测器。 在其他实施例中，波长色散元件可以用于光学列车或检测器系统中。

    DIVERGING X-RAY SOURCES USING LINEAR ACCUMULATION
    23.
    发明申请
    DIVERGING X-RAY SOURCES USING LINEAR ACCUMULATION 审中-公开
    使用线性累积的DIVERGING X射线源

    公开(公告)号：US20160351370A1

    公开(公告)日：2016-12-01

    申请号：US15166274

    申请日：2016-05-27

    Applicant: Sigray, Inc.

    Inventor： Wenbing Yun ,  Sylvia Jia Yun Lewis ,  Janos Kirz ,  Alan Francis Lyon ,  David Charles Reynolds

    IPC: H01J35/10 ,  H01J35/18 ,  H01J35/06

    CPC classification number: H01J35/08 ,  G21K1/06 ,  H01J2235/081 ,  H01J2235/086 ,  H01J2235/1204

    Abstract: A compact source for high brightness x-ray generation is disclosed. The higher brightness is achieved through electron beam bombardment of multiple regions aligned with each other to achieve a linear accumulation of x-rays. This may be achieved through the use of x-ray targets that comprise microstructures of x-ray generating materials fabricated in close thermal contact with a substrate with high thermal conductivity. This allows heat to be more efficiently drawn out of the x-ray generating material, and allows bombardment of the x-ray generating material with higher electron density and/or higher energy electrons, leading to greater x-ray brightness. The orientation of the microstructures allows the use of a take-off angle at or near 0°, allowing the accumulation of x-rays from several microstructures to be aligned and be used to form a beam in the shape of an annular cone.

    Abstract translation: 公开了用于高亮度x射线产生的紧凑源。 通过彼此对准的多个区域的电子束轰击实现较高的亮度，以实现x射线的线性积累。 这可以通过使用包括与具有高导热性的基板紧密热接触制造的x射线产生材料的微结构的x射线靶来实现。 这使得能够更有效地从X射线产生材料中引出热量，并且允许以较高电子密度和/或更高能量的电子轰击x射线产生材料，导致更大的x射线亮度。 微结构的方向允许使用在0°或接近0°的起飞角度，允许来自几个微结构的X射线的积聚被对准并且用于形成环形锥形的束。

    X-RAY TECHNIQUES USING STRUCTURED ILLUMINATION
    24.
    发明申请
    X-RAY TECHNIQUES USING STRUCTURED ILLUMINATION 审中-公开
    使用结构照明的X射线技术

    公开(公告)号：US20160320320A1

    公开(公告)日：2016-11-03

    申请号：US15173711

    申请日：2016-06-05

    Applicant: Sigray, Inc.

    Inventor： Wenbing Yun ,  Sylvia Jia Yun Lewis ,  Janos Kirz

    IPC: G01N23/20

    CPC classification number: G01N23/20075 ,  A61B6/4007 ,  A61B6/4291 ,  A61B6/484 ,  A61B6/508 ,  G01N23/201 ,  G01N23/223 ,  G21K1/02 ,  G21K2207/005 ,  H01J35/08 ,  H01J2235/086 ,  H01J2235/1291

    Abstract: This invention discloses a method and apparatus for x-ray techniques using structured x-ray illumination for examining material properties of an object. In particular, an object with one or more regions of interest (ROIs) having a particular shape, size, and pattern may be illuminated with an x-ray beam whose cross sectional beam profile corresponds to the shape, size and pattern of the ROIs, so that the x-rays of the beam primarily interact only with the ROIs. This allows a greater x-ray flux to be used, enhancing the signal from the ROI itself, while reducing unwanted signals from regions not in the ROI, improving signal-to-noise ratios and/or measurement throughputThis may be used with a number of x-ray measurement techniques, including x-ray fluorescence (XRF), x-ray diffraction (XRD), small angle x-ray scattering (SAXS), x-ray absorption fine-structure spectroscopy (XAFS), x-ray near edge absorption spectroscopy, and x-ray emission spectroscopy.

    Abstract translation: 这可以与许多x射线测量技术一起使用，包括x射线荧光（XRF），x射线衍射（XRD），小角度X射线散射（SAXS），x射线吸收精细结构光谱学 XAFS），x射线近边缘吸收光谱和X射线发射光谱。

    X-RAY INTERFEROMETRIC IMAGING SYSTEM
    25.
    发明申请
    X-RAY INTERFEROMETRIC IMAGING SYSTEM 审中-公开
    X射线干涉成像系统

    公开(公告)号：US20160066870A1

    公开(公告)日：2016-03-10

    申请号：US14943445

    申请日：2015-11-17

    Applicant: Sigray, Inc.

    Inventor： Wenbing Yun ,  Sylvia Jia Yun Lewis ,  Janos Kirz ,  Alan Francis Lyon

    IPC: A61B6/00

    CPC classification number: A61B6/484 ,  A61B6/032 ,  A61B6/035 ,  A61B6/4007 ,  A61B6/4035 ,  A61B6/4291 ,  A61B6/502 ,  A61B6/508 ,  G21K2207/005 ,  H01J35/08 ,  H01J35/12

    Abstract: An x-ray interferometric imaging system in which the x-ray source comprises a target having a plurality of structured coherent sub-sources of x-rays embedded in a thermally conducting substrate. The structures may be microstructures with lateral dimensions measured on the order of microns, and in some embodiments, the structures are arranged in a regular array.The system additionally comprises a beam-splitting grating G1 that establishes a Talbot interference pattern, which may be a π or π/2 phase-shifting grating, an x-ray detector to convert two-dimensional x-ray intensities into electronic signals, and in some embodiments, also comprises an additional analyzer grating G2 that may be placed in front of the detector to form additional interference fringes. Systems may also include a means to translate and/or rotate the relative positions of the x-ray source and the object under investigation relative to the beam splitting grating and/or the analyzer grating for tomography applications.

    Abstract translation: 一种X射线干涉成像系统，其中x射线源包括具有嵌入在导热衬底中的多个X射线结构化相干子源的靶。 该结构可以是具有在微米数量级上测量的横向尺寸的微结构，并且在一些实施例中，结构以正规阵列排列。 该系统还包括分束光栅G1，其形成Talbot干涉图案，其可以是“ 或＆pgr / / 2移相光栅，X射线检测器将二维x射线强度转换为电子信号，并且在一些实施例中还包括可以放置在检测器前面的附加分析器光栅G2 形成额外的干涉条纹。 系统还可以包括相对于用于层析成像应用的分束光栅和/或分析器光栅来平移和/或旋转x射线源和被研究对象的相对位置的装置。

    HIGH BRIGHTNESS X-RAY ABSORPTION SPECTROSCOPY SYSTEM
    26.
    发明申请
    HIGH BRIGHTNESS X-RAY ABSORPTION SPECTROSCOPY SYSTEM 有权
    高亮度X射线吸收光谱系统

    公开(公告)号：US20150357069A1

    公开(公告)日：2015-12-10

    申请号：US14636994

    申请日：2015-03-03

    Applicant: Sigray, Inc.

    Inventor： Wenbing Yun ,  Sylvia Jia Yun Lewis ,  Janos Kirz

    IPC: G21K1/06 ,  G21K1/02 ,  G01N23/207

    CPC classification number: G01N23/2076 ,  G01N23/085 ,  G21K2201/061 ,  G21K2201/062 ,  G21K2201/064 ,  H01J35/08 ,  H01J35/14 ,  H01J2235/081 ,  H01J2235/086

    Abstract: This disclosure presents systems for x-ray absorption fine structure (XAFS) measurements that have x-ray flux and flux density several orders of magnitude greater than existing compact systems. These are useful for laboratory or field applications of x-ray absorption near-edge spectroscopy (XANES) or extended x-ray fine absorption structure (EXFAS) spectroscopy.The higher brightness is achieved by using designs for x-ray targets that comprise a number of aligned microstructures of x-ray generating materials fabricated in close thermal contact with a substrate having high thermal conductivity. This allows for bombardment with higher electron density and/or higher energy electrons, leading to greater x-ray brightness and high flux.The high brightness x-ray source is then coupled to an x-ray reflecting optical system to collimate the x-rays, and a monochromator, which selects the exposure energy. Absorption spectra of samples using the high flux monochromatic x-rays can be made using standard detection techniques.

    Abstract translation: 本公开提供了x射线吸收精细结构（XAFS）测量的系统，其具有比现有紧凑系统大几个数量级的x射线通量和通量密度。 这些对于x射线吸收近边缘光谱（XANES）或扩展X射线精细吸收结构（EXFAS）光谱的实验室或现场应用是有用的。 通过使用X射线靶的设计来实现更高的亮度，所述X射线靶包括与具有高导热性的基底紧密热接触制造的x射线产生材料的多个对准微结构。 这允许用更高电子密度和/或更高能量的电子进行轰击，导致更大的x射线亮度和高通量。 然后将高亮度x射线源耦合到X射线反射光学系统以准直x射线，以及选择曝光能量的单色仪。 使用高通量单色x射线的样品的吸收光谱可以使用标准检测技术进行。

    X-RAY SURFACE ANALYSIS AND MEASUREMENT APPARATUS
    27.
    发明申请
    X-RAY SURFACE ANALYSIS AND MEASUREMENT APPARATUS 有权
    X射线表面分析和测量装置

    公开(公告)号：US20150247811A1

    公开(公告)日：2015-09-03

    申请号：US14634834

    申请日：2015-03-01

    Applicant: Sigray, Inc.

    Inventor： Wenbing Yun ,  Sylvia Jia Yun Lewis ,  Janos Kirz

    IPC: G01N23/223 ,  G01B15/02

    CPC classification number: G01N23/223 ,  G01B15/02 ,  G01N23/085 ,  G01N23/2076 ,  G21K1/06 ,  G21K2201/061 ,  G21K2201/064 ,  H01J35/08 ,  H01J35/14 ,  H01J2235/081 ,  H01J2235/086

    Abstract: This disclosure presents systems for total reflection x-ray fluorescence measurements that have x-ray flux and x-ray flux density several orders of magnitude greater than existing x-ray technologies. These may therefore useful for applications such as trace element detection and/or for total-reflection fluorescence analysis.The higher brightness is achieved in part by using designs for x-ray targets that comprise a number of microstructures of one or more selected x-ray generating materials fabricated in close thermal contact with a substrate having high thermal conductivity. This allows for bombardment of the targets with higher electron density or higher energy electrons, which leads to greater x-ray brightness and therefore greater x-ray flux.The high brightness/high flux source may then be coupled to an x-ray reflecting optical system, which can focus the high flux x-rays to a spots that can be as small as one micron, leading to high flux density.

    Abstract translation: 本公开提供了具有x射线通量和x射线通量密度比现有x射线技术大几个数量级的全反射x射线荧光测量的系统。 因此，这些可用于诸如微量元素检测和/或全反射荧光分析的应用。 较高的亮度部分地通过使用x射线靶的设计来实现，所述X射线靶包括与具有高导热性的衬底紧密热接触制造的一个或多个选定的x射线产生材料的多个微结构。 这允许用更高电子密度或更高能量电子轰击靶，这导致更大的x射线亮度和因此更大的x射线通量。 然后，高亮度/高通量源可以耦合到x射线反射光学系统，其可将高通量x射线聚焦到可以小至1微米的点，导致高通量密度。

    HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY SOURCE
    29.
    发明公开
    HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY SOURCE 审中-公开

    公开(公告)号：US20230384245A1

    公开(公告)日：2023-11-30

    申请号：US18311558

    申请日：2023-05-03

    Applicant: Sigray, Inc.

    Inventor： David Vine ,  Wenbing Yun ,  Janos Kirz ,  Sheraz Gul ,  Sylvia Jia Yun Lewis ,  Richard Ian Spink

    IPC: G01N23/046 ,  G01N23/083

    CPC classification number: G01N23/046 ,  G01N2223/204 ,  G01N2223/309 ,  G01N23/083

    Abstract: A three-dimensional x-ray imaging system includes at least one detector and an x-ray source including an x-ray transmissive vacuum window. The x-ray source is configured to produce diverging x-rays emerging from the vacuum window and propagating along an x-ray propagation axis extending through a region of interest of an object to the at least one detector. The diverging x-rays have propagation paths within an angular divergence angle greater than 1 degree centered on the x-ray propagation axis. The system further includes at least one sample motion stage configured to rotate the object about a rotation axis. The system further includes a sample mount configured to hold the object and comprises a first portion in the propagation paths of at least some of the diverging x-rays and having an x-ray transmission greater than 30% for x-rays having energies greater than 50% of a maximum x-ray energy of an x-ray spectrum of the diverging x-rays.

    X-RAY SEQUENTIAL ARRAY WAVELENGTH DISPERSIVE SPECTROMETER
    30.
    发明公开
    X-RAY SEQUENTIAL ARRAY WAVELENGTH DISPERSIVE SPECTROMETER 审中-公开

    公开(公告)号：US20230349842A1

    公开(公告)日：2023-11-02

    申请号：US18309021

    申请日：2023-04-28

    Applicant: Sigray, Inc.

    Inventor： Wenbing Yun ,  Ruimin Qiao ,  Sylvia Jia Yun Lewis ,  Srivatsan Seshadri ,  Janos Kirz ,  Benjamin Donald Stripe

    IPC: G01N23/20008

    CPC classification number: G01N23/20008 ,  G01N2223/316

    Abstract: An apparatus is configured to receive x-rays propagating from an x-ray source. The apparatus includes first and second x-ray diffractors, the second x-ray diffractor downstream from the first x-ray diffractor and first and second x-ray detectors. The first x-ray diffractor is configured to receive the x-rays, to diffract a first spectral band of the x-rays to the first x-ray detector, and to transmit at least 2% of the received x-rays to the second x-ray diffractor. The second x-ray diffractor is configured to receive the transmitted x-rays from the first x-ray diffractor and to diffract a second spectral band of the x-rays to the second x-ray detector. The first x-ray detector is configured to measure a first spectrum of the first spectral band of the x-rays and the second x-ray detector is configured to measure a second spectrum of the second spectral band of the x-rays.

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