Abstract:
An EEPROM includes a floating gate transistor having a source region, a channel region and a drain region. A first capa implant zone on a drain-side of the floating gate transistor has a first dopant concentration level. A second capa implant zone in the first capa implant zone adjacent the drain region has a second dopant concentration level that is greater than the first dopant concentration level. A gate oxide region insulates the floating gate electrode from the channel region, first capa implant zone and second capa implant zone. A thickness of the gate oxide region is thinner at the second capa implant zone than at the channel region and first capa implant zone.
Abstract:
A value representative of a duration of the low state of a synchronization signal on a bus is measured and then compared with a threshold value. The threshold value is stored in a memory and the measured value represents, in a first comparison, a longest duration of the low states of the synchronization signal.
Abstract:
A method of controlling a cycle for writing at least one data item to at least one memory slot of the electrically programmable and erasable read-only memory type disposed in an electronic circuit supplied by a supply voltage includes a controlled increase of the duration of the write cycle in the presence of a decrease in the supply voltage.
Abstract:
A communication system includes an I2C bus interconnecting at least one first device and one second device. At least one direct data link, other than the I2C bus, interconnects the first and second devices. The system is configurable to operate in: a first operating mode providing for data only transmission between the first and second devices over the I2C bus; and a second operating mode providing for simultaneous data transmission between the first and second devices over both the I2C bus and said data link.
Abstract:
A method is provided for managing the operation of a circuit operating in a slave mode. The circuit is connected to a bus having at least two of wires and a priority logic level. The slave circuit imposes the priority logic level on a first wire of the bus. While imposing, the slave circuit detects a possible conflict on the first wire resulting from a forcing, external to the slave circuit, of the first wire to another logic level. Upon detecting a conflict, the slave circuit is placed in a state stopping the sending by the circuit of any data over the bus while leaving the circuit listening to the bus.
Abstract:
A method for erasing a page-erasable EEPROM-type memory includes: the memory receiving a command associated with a set of addresses of pages of the memory to be erased, each page comprising several memory cell groups each forming a word, for each address of the set of addresses, selecting a word line corresponding to a page of the memory, and triggering the simultaneous erasing of all the selected word lines.
Abstract:
Method for processing a non-volatile memory designed to store words containing data bits and control bits allowing an error correction with an error correction code, the method comprising the storage of information in the memory plane comprising an operation for writing in the memory plane at least one digital word modified with respect to at least one initial digital word not having any erroneous bit, said at least one modified digital word containing a bit having a modified value with respect to the value of this bit in said at least one initial digital word, the other bits of the modified digital word having values identical to those of these same bits in the initial digital word, the position of the modified bit in said at least one modified digital word defining the value of the digital information.
Abstract:
A method for managing a non-volatile memory may include a first phase of writing data to a first bank of a memory plane of the non-volatile memory, and then a second phase of writing the same data to a second bank of the same memory plane of the non-volatile memory in the case of success of the first writing phase.
Abstract:
A low pass filter comprises a filter input node configured to receive a first logic signal, a filter output node configured to supply a second logic signal, a resistive element comprising a first terminal coupled to the input node and a second terminal coupled to the output node, and a capacitive element comprising a first terminal coupled to the output node and a second terminal. The filter further comprises an inverting gate having a first terminal coupled to the input node and a second terminal coupled to the second terminal of the capacitive element.
Abstract:
A test circuit and a method for testing an integrated circuit are provided. The integrated circuit includes a test circuit. The test circuit includes a conductive track extending over at least a portion of the periphery of the integrated circuit, at least one component and an activation circuit adapted to deviating an input data signal into the conductive track during a test mode, and to transmitting the input data signal to the at least one component during a normal operating mode.