Apparatus and method for a bandgap reference

    公开(公告)号:US11526190B2

    公开(公告)日:2022-12-13

    申请号:US16868799

    申请日:2020-05-07

    Inventor: Antonino Conte

    Abstract: An apparatus includes a current mirror coupled to an output of an amplifier through control switches, a plurality of capacitors, each of which is coupled to a common node of a leg of the current mirror and a corresponding control switch, a first dipole coupled to a first input of an amplifier, a second dipole coupled to a second input of the amplifier, a third dipole coupled to an output of the apparatus configured to generate the bandgap reference voltage, and groups of switches coupled between the current mirror and the dipoles.

    Sense structure based on multiple sense amplifiers with local regulation of a biasing voltage

    公开(公告)号:US09679618B2

    公开(公告)日:2017-06-13

    申请号:US14703173

    申请日:2015-05-04

    Abstract: A sense structure may include sense amplifiers each having measuring and reference terminals for receiving a measuring and a reference current, respectively, output circuitry for providing an output voltage based upon the measuring and reference currents, and voltage regulating circuitry in cascode configuration for regulating a voltage at the measuring and reference terminals. The regulating circuitry may include measuring and regulating transistors and a reference regulating transistor having a first conduction terminal coupled with the measuring terminal and with the reference terminal, respectively, a second conduction terminal coupled with the output circuitry and a control terminal coupled with a biasing terminal. Biasing circuitry is for providing a biasing voltage to the biasing terminal, and common regulating circuitry is for regulating the biasing voltage. Each sense amplifier may also include local regulating circuitry for regulating the biasing voltage applied to the biasing terminal.

    Level shifter circuit, corresponding device and method

    公开(公告)号:US12212320B2

    公开(公告)日:2025-01-28

    申请号:US18296325

    申请日:2023-04-05

    Abstract: A level-shifter circuit receives one or more input signals in an input level domain and includes provides at an output node an output signal in an output level domain shifted with respect to the input level domain. The circuit includes output circuitry including a first drive node and a second drive node that receive first and second logical signals so that the output signal has a first output level or a second output level in the output level domain as a function of at least one of the first and second logical signals. The circuit includes first and second shift capacitors coupled to the first and second drive nodes as well as capacitor refresh circuitry.

    Non-volatile phase-change memory device including a distributed row decoder with n-channel MOSFET transistors and related row decoding method

    公开(公告)号:US11908514B2

    公开(公告)日:2024-02-20

    申请号:US17667080

    申请日:2022-02-08

    CPC classification number: G11C13/0028 G11C13/003 G11C13/0004 G11C2213/79

    Abstract: In an embodiment, a non-volatile memory device includes a memory array including a plurality of memory portions, each memory portion having a respective plurality of memory cells arranged in rows and columns, wherein the memory portions are arranged in groups, each group of memory portions having a plurality of respective memory portions arranged in a row and a plurality of respective wordlines that extend through the respective memory portions, and wherein the memory cells of the memory portions of the group are coupled to the respective wordlines and a row decoder including a pre-decoding stage configured to execute a selection, in which it selects a wordline that extends through a group of memory portions and deselects other wordlines that extend through the group of memory portions, and a subsequent deselection, in which it deselects all the wordlines that extend through the group of memory portions, wherein the row decoder further includes, for each group of memory portions, a shared pull-up stage configured to decouple from or couple to a node at a first reference potential each wordline that extends through the group of memory portions, when the wordline is respectively selected or deselected, so as to impose on each wordline, when deselected, a deselection voltage, a plurality of pull-down stages distributed along the group of memory portions, each pull-down stage being configured to locally couple each wordline that extends through the group of memory portions, when selected, to a node at a second reference potential, so as to impose locally a selection voltage on the wordline, wherein each pull-down stage is further configured to locally decouple from the node at the second reference potential each wordline that extends through the group of memory portions, when deselected; and a number of local pull-up stages distributed along the group of memory portions, each local pull-up stage having, for each wordline that extends through the group of memory portions, a corresponding local pull-up transistor of an NMOS type.

    Ring oscillator circuit
    27.
    发明授权

    公开(公告)号:US11641191B2

    公开(公告)日:2023-05-02

    申请号:US17830864

    申请日:2022-06-02

    Abstract: In an embodiment a ring oscillator circuit includes a chain of cascade-coupled inverter stages coupled between an oscillator supply voltage node and a reference voltage node, the oscillator supply voltage node configured to provide an oscillator supply voltage, a current generator circuit coupled between the oscillator supply voltage node and a system supply voltage node configured to provide a system supply voltage, the current generator circuit being configured to inject a current into the oscillator supply voltage node and a biasing circuit including a first bias control transistor and a second bias control transistor coupled in series between the reference voltage node and the oscillator supply voltage node, wherein the first bias control transistor is configured to selectively couple the reference voltage node and the oscillator supply voltage node in response to the oscillator control signal being indicative that the ring oscillator circuit is in an inactive operation state.

    DRIVER CIRCUIT FOR PHASE-CHANGE MEMORY CELLS AND METHOD OF DRIVING PHASE-CHANGE MEMORY CELLS

    公开(公告)号:US20230021601A1

    公开(公告)日:2023-01-26

    申请号:US17814442

    申请日:2022-07-22

    Abstract: In an embodiment a circuit includes a plurality of memory cells, wherein each memory cell includes a phase-change memory storage element coupled in series with a respective current-modulating transistor between a supply voltage node and a reference voltage node, the current-modulating transistors being configured to receive a drive signal at a control terminal and to inject respective programming currents into the respective phase-change memory storage element as a function of the drive signal, a driver circuit configured to produce the drive signal at a common control node, wherein the common control node is coupled to the control terminals of the current-modulating transistors, the drive signal modulating the programming currents to produce SET programming current pulses and RESET programming current pulses and at least one current generator circuit configured to inject a compensation current into the common control node in response to the current-modulating transistors injecting the programming currents into the respective phase-change memory storage elements.

    Reading circuit and method for a non-volatile memory device

    公开(公告)号:US10593410B2

    公开(公告)日:2020-03-17

    申请号:US16145734

    申请日:2018-09-28

    Abstract: A sense-amplifier circuit can be used with a non-volatile memory device having a memory array with memory cells arranged in word lines and bit lines and coupled to respective source lines. The circuit has a first circuit branch and a second circuit branch, which receive on a respective first comparison input and second comparison input, during a reading step of a datum stored in a memory cell, a cell current from the bit line associated to the memory cell and a reference current, from a reference bit line in a differential reading operation or from a current-reference generator in a single-ended reading operation. The first and second circuit branches generate, during the datum-reading step, a first output voltage and a second output voltage, as a function of the difference between the cell current and the reference current.

    Phase-change memory with selectors in BJT technology and differential-reading method thereof

    公开(公告)号:US10573382B2

    公开(公告)日:2020-02-25

    申请号:US16133097

    申请日:2018-09-17

    Inventor: Antonino Conte

    Abstract: A phase-change memory device includes a memory array including a first memory cell and a second memory cell, each comprising a phase-change element and a selector, connected respectively to a first local bitline and a second local bitline, which are in turn connected, respectively, to a first main bitline and a second main bitline. The parasitic capacitance of the main bitlines is precharged at a supply voltage. When the local bitlines are selected to access a respective logic datum stored in the phase-change element, the parasitic capacitance of the local bitlines is first charged using the charge previously stored in the parasitic capacitance of the main bitlines and then discharged through the respective phase-change elements. Reading of the logic datum is made by comparing the discharge times.

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