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公开(公告)号:US20160284387A1
公开(公告)日:2016-09-29
申请号:US14670241
申请日:2015-03-26
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Yen-Huei CHEN , Hung-Jen LIAO , Chih-Yu LIN , Jonathan Tsung-Yung CHANG , Wei-Cheng WU
CPC classification number: G11C8/08 , G11C11/418
Abstract: An electronic device is disclosed that includes memory cells, a word line, a selection unit and a self-boosted driver. The memory cells are configured to store data. The word line is coupled to the memory cells. The selection unit is disposed at a first terminal of the word line, and is configured to transmit a selection signal to activate the word line according to one of a read command and a write command. The self-boosted driver is disposed at a second terminal of the word line, and is configured to pull up a voltage level of the word line according to a voltage level of the word line and a control signal.
Abstract translation: 公开了一种包括存储器单元,字线,选择单元和自增强驱动器的电子设备。 存储单元配置为存储数据。 字线耦合到存储单元。 选择单元设置在字线的第一端子处,并且被配置为根据读取命令和写入命令之一发送选择信号以激活字线。 自升压驱动器设置在字线的第二端子处,并且被配置为根据字线的电压电平和控制信号上拉字线的电压电平。
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公开(公告)号:US20160163380A1
公开(公告)日:2016-06-09
申请号:US15016172
申请日:2016-02-04
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Tzu-Kuei LIN , Hung-Jen LIAO , Yen-Huei CHEN
IPC: G11C11/419
CPC classification number: G11C11/419 , G11C7/14
Abstract: A device includes memory cells, reference memory cells, and a sensing unit. The reference memory cells are configured to store first bit data, second bit data, third bit data, and fourth bit data, in which the first bit data and the fourth bit data are configured to be a high logic state, and the second bit data and the third bit data are configured to be a low logic state. The sensing unit is configured to read bit data stored in one of the memory cells according to the first bit data, the second bit data, the third bit data, and the fourth bit data.
Abstract translation: 一种设备包括存储单元,参考存储单元和感测单元。 参考存储单元被配置为存储第一位数据和第四位数据被配置为高逻辑状态的第一位数据,第二位数据,第三位数据和第四位数据,并且第二位数据 并且第三位数据被配置为低逻辑状态。 感测单元被配置为根据第一位数据,第二位数据,第三位数据和第四位数据读取存储在一个存储器单元中的位数据。
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公开(公告)号:US20240203488A1
公开(公告)日:2024-06-20
申请号:US18590490
申请日:2024-02-28
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Hidehiro FUJIWARA , Chih-Yu LIN , Sahil Preet Singh , Hsien-Yu PAN , Yen-Huei CHEN , Hung-Jen LIAO
IPC: G11C11/419 , G11C5/14 , G11C7/12 , G11C11/412 , G11C11/418 , H03K19/013
CPC classification number: G11C11/419 , G11C5/147 , G11C7/12 , G11C11/412 , G11C11/418 , H03K19/0136
Abstract: The present disclosure describes embodiments of a write assist circuit. The write assist circuit can include a control circuit and a voltage generator. The control circuit can be configured to receive memory address information associated with a memory write operation for memory cells. The voltage generator can be configured to provide a reference voltage to one or more bitlines coupled to the memory cells. The voltage generator can include two capacitive elements, where during the memory write operation, (i) one of the capacitive elements can be configured to couple the reference voltage to a first negative voltage, and (ii) based on the memory address information, both capacitive elements can be configured to cumulatively couple the reference voltage to a second negative voltage that is lower than the first negative voltage.
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公开(公告)号:US20210200452A1
公开(公告)日:2021-07-01
申请号:US17201931
申请日:2021-03-15
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Yu-Hao HSU , Cheng Hung LEE , Chen-Lin YANG , Chiting CHENG , Fu-An WU , Hung-Jen LIAO , Jung-Ping YANG , Jonathan Tsung-Yung CHANG , Wei Min CHAN , Yen-Huei CHEN , Yangsyu LIN , Chien-Chen LIN
Abstract: Various embodiments for configurable memory storage systems are disclosed. The configurable memory storages selectively choose an operational voltage signal from among multiple operational voltage signals to dynamically control various operational parameters. For example, the configurable memory storages selectively choose a maximum operational voltage signal from among the multiple operational voltage signals to maximize read/write speed. As another example, the configurable memory storages selectively choose a minimum operational voltage signal from among the multiple operational voltage signals to minimize power consumption.
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公开(公告)号:US20200005858A1
公开(公告)日:2020-01-02
申请号:US16376640
申请日:2019-04-05
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Hidehiro FUJIWARA , Hung-Jen LIAO , Hsien-Yu PAN , Chih-Yu LIN , Yen-Huei CHEN , Sahil Preet SINGH
IPC: G11C11/419 , G11C11/412
Abstract: A read assist circuit is disclosed that selectively provides read assistance to a number of memory cells during a read operation of the number of memory cells. The read assist circuit includes a voltage divider circuit and a number of write line driver circuits. The voltage divider circuit is configured to voltage-divide a power supply voltage and provide a source write line voltage at an output of the voltage divider circuit to the number of write line driver circuits. Each write line driver circuit is configured to receive the source write line voltage and selectively apply the source write line voltage to a corresponding write line according to a corresponding individual enable signal that controls each write driver circuit. Further, each write line driver circuit is coupled to a corresponding memory cell of the number of memory cells via the corresponding write line so that the corresponding write line provides a corresponding write line voltage to provide read assistance during the read operation.
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公开(公告)号:US20170264276A1
公开(公告)日:2017-09-14
申请号:US15065166
申请日:2016-03-09
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Mahmut Sinangil , Hsin-Hsin KO , Chiting CHENG , Yen-Huei CHEN , Hung-Jen LIAO , Jonathan Tsung-Yung CHANG
IPC: H03K3/356 , H03K19/0185
CPC classification number: H03K3/356113 , H03K19/018521
Abstract: A level shifter circuit is provided that uses a boosting circuit. The boosting circuit is configured to improve the operation of the level shifter circuit when the high voltages of voltage domains across the level shifter circuit are widely separated. A circuit apparatus includes a core level shifter circuit that changes a first voltage of an input signal to a second voltage of an output signal. The circuit apparatus further includes a first boosting circuit that is coupled to the core level shifter circuit and generates a first transient voltage applied to the core level shifter circuit when the input signal transitions from a low value to a high value. The circuit apparatus also includes a second boosting circuit that is coupled to the core level shifter circuit and generates a second transient voltage applied to the core level shifter circuit when the input signal transitions from a high value to a low value.
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公开(公告)号:US20170162232A1
公开(公告)日:2017-06-08
申请号:US15438567
申请日:2017-02-21
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Jonathan Tsung-Yung CHANG , Cheng-Hung LEE , Chi-Ting CHENG , Hung-Jen LIAO , Jhon-Jhy LIAW , Yen-Huei CHEN
CPC classification number: G11C5/02 , G11C5/025 , G11C5/14 , G11C7/10 , G11C7/1069 , G11C7/1096 , G11C7/12 , G11C7/22 , G11C11/417
Abstract: A device includes a first strap cell, a first data line, and a second data line. The first strap cell is arranged between a first row of memory cells and a second row of memory cells in a memory array. A first portion of the first data line is configured to transmit data to or from a first memory cell in the first row of memory cells. The second data line and a second portion of the first data line are configured to transmit data to or from a second memory cell in the second row of memory cells.
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公开(公告)号:US20170110461A1
公开(公告)日:2017-04-20
申请号:US15186446
申请日:2016-06-18
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Hidehiro FUJIWARA , Wei-Min CHAN , Chih-Yu LIN , Yen-Huei CHEN , Hung-Jen LIAO
IPC: H01L27/11 , H01L21/768 , H01L21/321 , H01L23/528
CPC classification number: H01L27/1104 , H01L21/321 , H01L21/76838 , H01L23/5283
Abstract: A device is disclosed that includes a memory bit cell, a first word line, a pair of metal islands and a pair of connection metal lines. The first word line is disposed in a first metal layer and is electrically coupled to the memory bit cell. The pair of metal islands are disposed in the first metal layer at opposite sides of the word line and are electrically coupled to a power supply. The pair of connection metal lines are disposed in a second metal layer and are configured to electrically couple the metal islands to the memory bit cell respectively.
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公开(公告)号:US20160322098A1
公开(公告)日:2016-11-03
申请号:US14700135
申请日:2015-04-29
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Mohammed HASAN TAUFIQUE , Hidehiro FUJIWARA , Hung-Jen LIAO , Yen-Huei CHEN
IPC: G11C11/419
CPC classification number: G11C11/419 , G11C7/12 , G11C7/22 , G11C11/412
Abstract: A memory device includes a first inverter, a second inverter cross-coupled with the first inverter, an accessing unit, and a switching unit. The accessing unit is configured to discharge an output of the first inverter and charge an output of the second inverter according to signals provided by a first word line and a second word line. The switching unit is configured to disconnect a power from the first inverter and the second inverter according to a signal provided by the first word line.
Abstract translation: 存储器件包括第一反相器,与第一反相器交叉耦合的第二反相器,存取单元和切换单元。 访问单元被配置为对第一反相器的输出进行放电,并根据由第一字线和第二字线提供的信号对第二反相器的输出进行充电。 开关单元被配置为根据由第一字线提供的信号来断开来自第一逆变器和第二逆变器的电力。
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公开(公告)号:US20160093366A1
公开(公告)日:2016-03-31
申请号:US14501623
申请日:2014-09-30
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Tzu-Kuei LIN , Hung-Jen LIAO , Yen-Huei CHEN
IPC: G11C11/419
CPC classification number: G11C11/419 , G11C7/14
Abstract: An electronic device is disclosed that includes n memory cells, a replica memory array, and a sensing unit. Each of the n memory cells stores bit data, in which n is a positive integer. The replica memory array includes a first reference memory cell having a high logic state, a second reference memory cell having a low logic state, n−1 first pseudo reference memory cells having the low logic state, and n−1 second pseudo reference memory cells having the high logic state. The first reference memory cell and the n−1 first pseudo reference memory cells generate a first signal, and the second reference memory cell and the n−1 second pseudo reference memory cells generate a second signal. The sensing unit determines a logic state of the bit data of one of the n memory cells according to the first signal and the second signal.
Abstract translation: 公开了一种包括n个存储单元,复制存储器阵列和感测单元的电子设备。 n个存储单元中的每一个存储位数据,其中n是正整数。 复制存储器阵列包括具有高逻辑状态的第一参考存储单元,具有低逻辑状态的第二参考存储单元,具有低逻辑状态的n-1个第一伪参考存储器单元和n-1个第二伪参考存储器单元 具有高逻辑状态。 第一参考存储单元和n-1个第一伪参考存储单元产生第一信号,第二参考存储单元和第n-1个第二伪参考存储单元产生第二信号。 感测单元根据第一信号和第二信号确定n个存储器单元之一的位数据的逻辑状态。
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