摘要:
A phase change memory cell includes a MOS select transistor having a gate coupled to a word line, and a source and drain region coupled between first and second bit lines, respectively. A first phase change element is coupled between the first bit line and the source region of the MOS select transistor. A method of reading a selected cell in the array is provided by evaluating a body effect impact of a state of the phase change element associated with the selected cell on a MOS select transistor.
摘要:
A memory device includes an array portion of resistive memory cells organized in rows and columns, wherein the rows correspond to word lines and the columns correspond to bit lines. The device further includes a combined read/write circuit associated with each respective bit line in the array portion configured to read from or write to a resistive memory cell associated with the respective bit line.
摘要:
A memory includes a first bipolar transistor, a first bit line, and a first resistive memory element coupled between a collector of the first bipolar transistor and the first bit line. The memory includes a second bit line, a second resistive memory element coupled between an emitter of the first bipolar transistor and the second bit line, and a word line coupled to a base of the first bipolar transistor.
摘要:
A phase change memory cell includes a MOS select transistor having a gate coupled to a word line, and a source and drain region coupled between first and second bit lines, respectively. A first phase change element is coupled between the first bit line and the source region of the MOS select transistor. A method of reading a selected cell in the array is provided by evaluating a body effect impact of a state of the phase change element associated with the selected cell on a MOS select transistor.
摘要:
A memory includes a volume of phase change material, a first transistor coupled to the volume of phase change material for accessing a first storage location within the volume of phase change material, and a second transistor coupled to the volume of phase change material for accessing a second storage location within the volume of phase change material.
摘要:
A memory device includes a first bit line in a first conducting layer and a second bit line parallel to the first bit line. The second bit line is in a second conducting layer. The memory device includes a MOS select transistor and a word line coupled to a gate of the MOS select transistor. The word line is at an angle with respect to the first bit line and the second bit line. The memory device includes a first resistive memory element coupled between a source of the MOS select transistor and the first bit line. The memory device includes a second resistive memory element coupled between a drain of the MOS select transistor and the second bit line.
摘要:
A memory includes a volume of phase change material, a first transistor coupled to the volume of phase change material for accessing a first storage location within the volume of phase change material, and a second transistor coupled to the volume of phase change material for accessing a second storage location within the volume of phase change material.
摘要:
In one embodiment, a bit-line interface is disclosed. The bit-line interface has a multiplexer having a plurality of bit-line outputs, and a write path coupled to a multiplexer signal input. The bit-line interface also has a read path coupled to the multiplexer signal input, wherein the read path and the write path share at least one component.
摘要:
In one embodiment, a bit-line driver has a first driver having a source terminal coupled to a high-voltage supply bus and a drain terminal coupled to the bit-line, and a second driver having a source terminal coupled to a high-voltage return bus and a drain terminal coupled to the bit line. The bit-line driver also has a first pre-driver coupled to a gate terminal of the first driver and a second pre-driver coupled to a gate terminal of the second driver. The first and second drivers use a first type of transistor, and the first and second pre-drivers use a second type of transistor. The first type of transistor is rated at a higher voltage than the second type of transistor.
摘要:
Non volatile memories and methods of programming thereof are disclosed. In one embodiment, the method of programming a memory array includes receiving a series of data blocks, each data block having a number of bits that are to be programmed, determining the number of bits that are to be programmed in a first data block, determining the number of bits that are to be programmed in a second data block, and writing the first data block and the second data block into the memory array in parallel if the sum of the number of bits that are to be programmed in the first data block and the second data block is not greater than a maximum value. The first and second data blocks may or may not be adjacent data blocks. Improved programming efficiency may be achieved in a memory circuit when the maximum allowable current may be limited by the application or the size of a charge pump. Inverse data may be written in parallel if the sum is greater than the maximum value.