公开(公告)号：US11761833B2

公开(公告)日：2023-09-19

申请号：US17085403

申请日：2020-10-30

Applicant: Panasonic Intellectual Property Management Co., Ltd.

Inventor： Yousuke Irie

IPC: G01L1/24 ,  G01K3/10 ,  G01J5/00 ,  H04N5/33 ,  H04N7/18 ,  G01B11/16 ,  G01L1/00 ,  G01M5/00 ,  G01N25/20 ,  G01N25/72 ,  G01M99/00 ,  G01M11/08

CPC classification number: G01L1/248 ,  G01B11/16 ,  G01J5/0003 ,  G01K3/10 ,  G01L1/00 ,  G01M5/0008 ,  G01M5/0091 ,  G01M11/081 ,  G01M99/002 ,  G01N25/20 ,  G01N25/72 ,  H04N5/33 ,  H04N7/181 ,  G01J2005/0077

Abstract: A stress measurement device includes a first obtaining unit obtaining thermal data including information indicating a temperature of a measuring region, a second obtaining unit obtaining data related to stress occurring in one part of the measuring region, and a controller finding stress occurring in the measuring region from the thermal data and the data related to the stress. The controller finds, first waveform data respectively on the one part and a part other than the one part based on a change with time of the thermal data, and second waveform data based on a change with time of the data related to the stress. The controller finds, disturbance data through a deduction of the second waveform data from the first waveform data on the one part, and stress data indicating stress occurring in the part through a deduction the disturbance data from the first waveform data on the part.

公开(公告)号：US20160363542A1

公开(公告)日：2016-12-15

申请号：US15245442

申请日：2016-08-24

Applicant: Intel Corporation

Inventor： Liang W. Zhang ,  Zhihua Zou ,  Osborne A. Martin, III ,  Robert F. Wiedmaier

IPC: G01N21/95 ,  G01N21/88 ,  G03F7/20 ,  G01B11/27

CPC classification number: G01B11/14 ,  G01B11/18 ,  G01B11/272 ,  G01L1/241 ,  G01L1/248 ,  G01N21/8806 ,  G01N21/9501 ,  G03F7/70775 ,  G03F9/7007 ,  G03F9/7046 ,  G03F9/7065 ,  H01L22/12 ,  H05K1/0269 ,  H05K3/0008

Abstract: Inspection of microelectronic devices is described using near infrared light. In one example, a dielectric material layer on a substrate is illuminated with a near infrared light beam. The substrate has at least one contact land, the dielectric material layer overlies at least a portion of the contact land, and the substrate has at least one via defined in the dielectric material layer, the via exposing at least a portion of the contact land. Reflected near infrared light is reflected from the substrate at a camera. The position of the via is determined relative to the contact land from the reflected light beam using an image processing device.

公开(公告)号：US20160178477A1

公开(公告)日：2016-06-23

申请号：US14966642

申请日：2015-12-11

Applicant: Corning Incorporated

Inventor： Rostislav Vatchev Roussev ,  Vitor Marino Schneider ,  Emily Elizabeth Young

IPC: G01M11/08 ,  G01L1/24 ,  G02B6/14 ,  G02B6/36 ,  G02B6/134 ,  G02B6/34

CPC classification number: G01M11/08 ,  C03C21/002 ,  G01B11/0641 ,  G01B11/22 ,  G01L1/24 ,  G01L1/248 ,  G01N21/23 ,  G01N21/41 ,  G01N21/8422 ,  G01N2021/4126 ,  G02B5/04 ,  G02B6/1345 ,  G02B6/14 ,  G02B6/34 ,  G02B6/362

Abstract: Prism-coupling systems and methods for characterizing large depth-of-layer waveguides formed in glass substrates are disclosed. One method includes making a first measurement after a first ion-exchange process that forms a deep region and then performing a second measurement after a second ion-exchange process that forms a shallow region. Light-blocking features are arranged relative to the prism to produce a mode spectrum where the contrast of the mode lines for the strongly coupled low-order modes is improved at the expense of loss of resolution for measuring characteristics of the shallow region. Standard techniques for determining the compressive stress, the depth of layer or the tensile strength of the shallow region are then employed. A second measurement can be made using a near-IR wavelength to measure characteristics of the deeper, first ion-exchange process. Systems and methods of measuring ion-exchanged samples using shape control are also disclosed.

Abstract translation: 公开了用于表征玻璃基板中形成的大深度深度波导的棱镜耦合系统和方法。 一种方法包括在形成深区域的第一离子交换过程之后进行第一测量，然后在形成浅区域的第二离子交换过程之后进行第二测量。 光阻特征相对于棱镜布置以产生模式光谱，其中强耦合低阶模的模式线的对比度以改善浅区域特性的分辨率损失为代价而得到改善。 然后采用用于确定压缩应力，层的深度或浅区域的拉伸强度的标准技术。 可以使用近红外波长进行第二次测量，以测量较深的第一离子交换过程的特性。 还公开了使用形状控制测量离子交换样品的系统和方法。

公开(公告)号：US20150308907A1

公开(公告)日：2015-10-29

申请号：US14259519

申请日：2014-04-23

Applicant: The Boeing Company

Inventor： Gary E. Georgeson ,  Morteza Safai

IPC: G01L1/24 ,  G01K11/12 ,  G01N21/64

CPC classification number: G01L1/24 ,  G01K11/12 ,  G01L1/241 ,  G01L1/248 ,  G01N21/64 ,  G01N2021/6497

Abstract: A witness material for monitoring an environmental history of an object may include a material containing a dye of a type that fluoresces in response to actinic radiation in one or both of a shift in color and a change in intensity when subjected to a predetermined stress above a predetermined level; and the material forming a coating on one or more of an outer container for the object, an inner container for the object, a tape that is applied to an outer container for the object, a tape that is applied to an inner container for the object, a shrink wrap enclosing the object, an outer surface of the object, and an inner surface of the object.

Abstract translation: 用于监测物体的环境历史的目击材料可以包括含有染料的材料，该染料的颜色响应于光化辐射中的一种或两种而发生荧光，并且当受到预定的应力以上时的强度变化 预定水平; 并且在用于该物体的外部容器中的一个或多个上形成涂层的材料，用于该物体的内部容器，应用于该物体的外部容器的带，被施加到该物体的内部容器的带 包围对象的收缩包装，物体的外表面和物体的内表面。

公开(公告)号：US20150276621A1

公开(公告)日：2015-10-01

申请号：US14229824

申请日：2014-03-28

Applicant: Liang W. Zhang ,  Zhihua Zou ,  Osborne A. Martin, III ,  Robert F. Wiedmaier

Inventor： Liang W. Zhang ,  Zhihua Zou ,  Osborne A. Martin, III ,  Robert F. Wiedmaier

IPC: G01N21/95 ,  H01L21/66 ,  G01B11/27

CPC classification number: G01B11/14 ,  G01B11/18 ,  G01B11/272 ,  G01L1/241 ,  G01L1/248 ,  G01N21/8806 ,  G01N21/9501 ,  G03F7/70775 ,  G03F9/7007 ,  G03F9/7046 ,  G03F9/7065 ,  H01L22/12 ,  H05K1/0269 ,  H05K3/0008

Abstract: Inspection of microelectronic devices is described using near infrared light. In one example, a dielectric material layer on a substrate is illuminated with a near infrared light beam. The substrate has at least one contact land, the dielectric material layer overlies at least a portion of the contact land, and the substrate has at least one via defined in the dielectric material layer, the via exposing at least a portion of the contact land. Reflected near infrared light is reflected from the substrate at a camera. The position of the via is determined relative to the contact land from the reflected light beam using an image processing device.

Abstract translation: 使用近红外光描述微电子器件的检查。 在一个示例中，用近红外光束照射基板上的电介质材料层。 衬底具有至少一个接触焊盘，电介质材料层覆盖接触焊盘的至少一部分，并且衬底具有限定在介电材料层中的至少一个通孔，该通孔暴露至少一部分接触焊盘。 反射的近红外光在相机处从基板反射。 使用图像处理装置，相对于来自反射光束的接触面确定通孔的位置。

公开(公告)号：US20150109607A1

公开(公告)日：2015-04-23

申请号：US14391613

申请日：2012-10-31

Applicant: Utku BUYUKSAHIN

Inventor： Utku Buyuksahin

IPC: G01L5/22 ,  G01L1/24

CPC classification number: G01L5/226 ,  G01L1/242 ,  G01L1/248 ,  G01L5/228

Abstract: The features of the system are: fiber optic cables (instead of human sensory receptor) and low cost CMOS or CCD image sensor (which can be found in a conventional webcam, camcorder, digital camera etc.) are used by pairing each pixel of the image sensor with corresponding fiber optic cable, which is assured to transfer all light beams to the processor on a single photo frame where the coordinates and the level of displacements are detected precisely by the aid of image processing techniques, in order to provide tactile sensing. The system can work with a computer or it can work individually with an electronically circuit that contains an independent processor.

Abstract translation: 该系统的特点是：将光纤电缆（而不是人感觉接收器）和低成本的CMOS或CCD图像传感器（可以在传统的网络摄像头，摄像机，数码相机等中找到）通过将每个像素 图像传感器，其具有相应的光纤电缆，其被确保将所有光束传输到单个相框上的处理器，其中通过图像处理技术精确地检测坐标和位移水平，以便提供触觉感测。 该系统可以与计算机一起工作，或者可以使用包含独立处理器的电子电路单独工作。

公开(公告)号：US20140326882A1

公开(公告)日：2014-11-06

申请号：US14358815

申请日：2012-11-16

Applicant: OPTOFORCE MÜSZAKI FEJLESZTÖ ÉS INNOVÁCIÓS KFT

Inventor： Ákos Sándor Tar ,  György Gábor Cserey ,  József Veres

IPC: G01L1/24

CPC classification number: G01L1/248 ,  G01L1/24 ,  G01L5/166

Abstract: The invention is a sensor device comprising a carrier element (24), at least one light emitting element (20) arranged on the carrier element (24), at least one light detecting element (22) arranged on the carrier element (24); a cover layer (12) reflecting at least one part of the light emitted by the light emitting element (20) to the at least one light detecting element (22); and at least one transparent filler element (16, 18) filling at least partly the space between the carrier element (24) and the cover layer (12) and being made of a flexible material.

Abstract translation: 本发明是包括载体元件（24），布置在载体元件（24）上的至少一个发光元件（20）），布置在载体元件（24）上的至少一个光检测元件（22）的传感器装置。 将由所述发光元件（20）发射的光的至少一部分反射到所述至少一个光检测元件（22）的覆盖层（12）。 和至少一个填充载体元件（24）和覆盖层（12）之间的空间并由柔性材料制成的透明填料元件（16,18）。

公开(公告)号：US20050143938A1

公开(公告)日：2005-06-30

申请号：US11003376

申请日：2004-12-06

Applicant: Bernd Schulze ,  Ole Trinks

Inventor： Bernd Schulze ,  Ole Trinks

IPC: G01L1/00 ,  G01L1/24 ,  G01M9/06

CPC classification number: G01M9/062 ,  G01L1/248

Abstract: A method for determining a wall shear stress distribution on a surface of a body around which air flows. The method includes determining a heat flow distribution into the surface of the body around which air flows by infrared thermography, obtaining a surface pressure distribution on the surface optically and determining the wall shear stress distribution on the surface of the body by processing from at least the heat flow distribution and the surface pressure distribution. The instant abstract is neither intended to define the invention disclosed in this specification nor intended to limit the scope of the invention in any way.

Abstract translation: 一种用于确定空气流动的身体表面上的壁剪切应力分布的方法。 该方法包括确定通过红外线热成像在空气流动的身体的表面中的热流分布，在光学上获得表面上的表面压力分布，并且通过至少从 热流分布和表面压力分布。 本摘要既不旨在限定本说明书中公开的发明，也不旨在以任何方式限制本发明的范围。

公开(公告)号：US5693889A

公开(公告)日：1997-12-02

申请号：US716664

申请日：1996-08-27

Applicant: Richard H. Nadolink

Inventor： Richard H. Nadolink

IPC: G01L1/24 ,  G01N13/00

CPC classification number: G01N13/00 ,  G01L1/248

Abstract: A piece of single crystal silicon is embedded in a material such that the licon is flush with the surface thereof. The silicon is illuminated with infrared radiation having a wavelength in the range of 800-1100 nanometers. Isochromatic fringe patterns projected from the silicon are monitored as a direct indication of the amount of stress experienced at the surface.

Abstract translation: 将一片单晶硅嵌入材料中，使得硅与其表面齐平。 用具有在800-1100纳米范围内的波长的红外辐射照射硅。 监测从硅投射的等色条纹图案作为在表面经历的应力量的直接指示。

公开(公告)号：US5222400A

公开(公告)日：1993-06-29

申请号：US427931

申请日：1989-10-25

Applicant: John A. Hilton

Inventor： John A. Hilton

IPC: G01L1/24 ,  G01L5/16 ,  G01L5/22 ,  G06F3/038 ,  G06F3/041

CPC classification number: G06F3/038 ,  G01L1/248 ,  G01L5/161 ,  G01L5/166 ,  G01L5/223 ,  G06F3/03543 ,  H01H2239/052 ,  Y10T74/20201

Abstract: A force and torque converter provides command signals representative of a translational applied force and an applied torque extending about an axis substantially perpendicular to the axis along which the translational force is applied. The apparatus comprises a body to which the force and torque are applied, first and second connecting means attached to the body, means for biasing the connecting means to a central position and sensor means comprising two sensor devices arranged to detect a displacement force in each of the first and second connecting means respectively and which respond to the applied translation force and also respond to the torque to resolve the torque into a force comprising two components. A very important embodiment of the invention is arranged to operate in three dimensions and to resolve any applied torque into a respective components related to three mutually perpendicular axes. The apparatus can thus interpret operator applied hand signals for controlling an apparatus such as a computer based system.

Abstract translation: 力和力矩转换器提供表示平移施加力的命令信号和围绕基本上垂直于施加平移力的轴线的轴线延伸的施加的扭矩。 该装置包括施加力和扭矩的主体，附接到主体的第一和第二连接装置，用于将连接装置偏置到中心位置的装置和包括两个传感器装置的传感器装置，传感器装置布置成检测每个中的位移力 第一连接装置和第二连接装置，其分别响应于所施加的平移力并且还响应扭矩以将扭矩分解成包括两个部件的力。 本发明的一个非常重要的实施例被布置成在三个维度上操作并且将任何施加的扭矩分解成与三个相互垂直的轴相关的相应部件。 因此，该装置可以解释操作者应用的手信号，以控制诸如基于计算机的系统之类的装置。