Abstract:
A ROM-type memory is provided that includes a matrix of memory cells made up of rows and columns, with each row allowing storage of a page of MUX words of N bits. An address decoder decodes addresses in order to extract the page to be read. At the output of the matrix, N multiplexers are each coupled to the columns that correspond to one of the bits of the output stage. An N-bit output stage includes at least one inverter, with each of the inverters being connected to the output of one of the multiplexers so as to restore inverted values of information to be stored to correct values. The inverted values are stored in all of the memory cells of all of the columns coupled to the one multiplexer. Storing the inverted values makes it possible to store less “0” values within the matrix and further makes LVS testing of the ROM memory considerably easier. Also provided is a method for sequentially checking groups of memory cells.
Abstract:
A method for adjusting a duration of an internal timing signal in an integrated circuit with a value close to a typical value of the duration may include activating the internal timing signal in the integrated circuit and sequentially sending calibration values to an input of the integrated circuit. The expiration of the internal timing signal may determine the last calibration value received or being received, and the calibration data may be applied to a device for adjusting the duration of the internal timing signal.
Abstract:
A differential amplifier includes a pair of first and second transistors connected together. The first transistor includes a first conduction terminal, and a second conduction terminal forming a first output node of the amplifier. The second transistor includes a first conduction terminal connected to the first conduction terminal of the first transistor, and a second conduction terminal forming a second output node of the amplifier. A first inductive load is connected between the first output node and a supply reference, and a second inductive load is connected between the second output node and the supply reference. A limiting network limits output voltages on the first and second output nodes, and includes a first resistor connected to the first output node, and a second resistor connected to the second output node. The first and second resistors also connected together in series at a common intermediate node. A first analog switch is connected to the first resistor and to the supply reference, and a second analog switch connected to the second resistor and the supply reference via the first analog switch. The first and second analog switches are turned on when a voltage on the common intermediate node exceeds a threshold.
Abstract:
A circuit for controlling a switch to be controlled in unidirectional fashion while the voltage present there across is an A.C. voltage, including circuitry for delaying the switch turning-on with respect to a zero crossing of the voltage there across, and circuitry for triggering the switch turning-off after its turning on, at the end of a predetermined time interval plus or minus an error time controlled by the duty cycle of the A.C. voltage across the switch, in one or several previous periods. The control circuit applies to the forming of a rectifying circuit by the switch.
Abstract:
A method for arbitrating access to a resource shared by several electronic elements. Each element is allocated a first counting value and a first penalty, the first counting value is decremented in synchronization with a clock signal, and is incremented by a value equal to the first penalty every time the element is selected for an access cycle. When several elements are simultaneously waiting to access the shared resource, an element is selected to access the resource if its first counting value is lower than or equal to a determined threshold, and is lower than the first counting values of the other elements having sent an access request.
Abstract:
A memory circuit comprising a memory area for storing data, a non-volatile memory area for storing at least one identification code, and a pin for storing the identification code in the non-volatile memory area. The memory circuit further comprising a programmable register in which a programmable state is fixed, wherein the programmable state indicates if the identification code has been stored in the non-volatile memory area, and a logic module which blocks any subsequent changes to the identification code fixed in the non-volatile memory area in response to the programmable state in the programmable register indicating that the identification code has been stored in the non-volatile area. The invention also relates to an associated method. The invention is useful particularly to avoid fraudulent reprogramming of the area containing the identification code. The invention also relates to an associated method.
Abstract:
An optical semiconductor package includes an optical semiconductor component (8), a front face of which has an optical sensor (10), and encapsulation defining a cavity in which the optical component is placed and having external electrical connection (11) of this optical semiconductor component (8). The encapsulation (2, 5) includes a glass pane letting light through to the optical sensor. The encapsulation (2, 5) includes electromagnetic screening (23, 24, 28) made of an electrically conductive material, that is externally connectable, this screening being electrically isolated in the optical semiconductor package from the electrical connection of the optical semiconductor component (8).
Abstract:
An integrated circuit is provided that includes an active region and at least one interconnect part. The interconnect part is located above the active region, and includes a plurality of metallization levels and at least one test pad. The test pad is located in one of the metallization levels that is beneath a top one of the metallization levels. In a preferred embodiment, the test pad is located beneath supply lines. Also provided is a method for testing such an integrated circuit.
Abstract:
Process for fabricating semiconductor components, and semiconductor component, in which a support plate comprises, at various locations, portions provided with respective electrical connection means having electrical connection regions on a front face and having through-holes located in proximity or adjacently to the portions. An integrated-circuit chip is fastened to the front face of each portion of the support plate by means of electrical connection balls. On one side, the electrical connection balls are connected to electrical connection regions of the front face of this plate and, on the other side, to electrical connection pads on the rear face of this integrated-circuit chip, in positions such that one edge of the rear face of each integrated-circuit chip faces at least one through-hole. A curable liquid fill material is delivered in the through-holes so as to at least partly fills a space defined between this support plate and each integrated-circuit chip, respectively.
Abstract:
A decoding and error correcting method is applicable to a secured code word that may have an error relative to an initial secured code word. The method includes an error correcting step, and a decoding step using a decoding function. The decoding step may be carried out before the error correcting step, and includes applying the decoding function to the secured code word to obtain a secured decoded word containing a coded error. The method reduces the decoding and error correcting time of the secured code word.