Abstract:
Repair control logic for a safe memory having redundant elements is provided. The repair control logic includes comparison logic including, for each bit slice of a memory array, a comparator circuit configured to determine whether a location value of an associated bit slice of the memory array is greater than a location value of a defective bit slice of the memory array, and data switching logic including, for each bit slice of the memory array, a switching circuit, responsive to a determination that the location value of the associated bit slice is greater than the location value of the defective bit slice, to switch data from the associated bit slice to an adjacent bit slice of the memory array.
Abstract:
A dual rail SRAM array includes a plurality of columns of memory cells each coupled between two bit lines. A sense amplifier is coupled between each pair of bit lines. Capacitors are positioned between the sense amplifier outputs and the bit lines, thereby separating the sense amplifier from the bit lines. The memory cells are powered with an array supply voltage. The sense amplifier is powered with a peripheral supply voltage. During a read operation of the memory array, the bit lines are precharged to the array supply voltage. The sense amplifier is precharged to the peripheral supply voltage or to an intermediate voltage.
Abstract:
An IC Card comprises a first device, including a first processor and a first memory unit, to communicate with a handset, and a second device. The second device includes a second processor and a second memory unit, to communicate via a wireless communication with an electronic apparatus external to the handset, the second device providing predetermined services. Each predetermined service is programmed to receive a wireless message from a respective electronic apparatus, to execute a predetermined elaboration operation, and to return a result to the respective electronic apparatus. The second memory unit stores a plurality of additional programs for executing additional elaborations operations, each program being associated to one of the predetermined services. The second device has a run-time environment for executing the additional programs when the corresponding predetermined services receives the wireless message.
Abstract:
A system for power measurement in an electronic device includes a sensing unit, an analog-to-digital converter (ADC) and a controller. The sensing unit senses voltage across a power source and modulates a carrier signal based on the sensed voltage. The ADC converts a combination of the modulated carrier signal and audio signals received by the electronic device to generate a digitized combined signal and provides the digitized combined signal to the controller. The controller separates digitized modulated carrier signal and digitized audio signals. The digitized modulated carrier signal is demodulated to generate an output signal that provides a measure of the power consumed by the electronic device.
Abstract:
One embodiment of a power management system includes a reservoir configured to collect energy. The system also includes a voltage regulator coupled to the reservoir via an input terminal and configured to convert the energy to an output voltage via an output terminal when enabled. A threshold detector is coupled to the reservoir and is configured to sense the energy and enable the voltage regulator when the energy exceeds a threshold. The system further includes a feedback circuit coupled between the output terminal and the threshold detector, and configured to feedback the output voltage to the threshold detector to compensate for a voltage drop across the threshold detector due to an output current drawn by the load.
Abstract:
A safety system monitors faults in an embedded control system. The embedded control system is modeled to produce one or more model check values by calculating how many clock cycles will pass between an initialization time point and at least one event time point for a specific event. The initialization time point is a certain point in an initialization function of a scheduler in the embedded control system. The at least one event time point is an expected number of clock cycles to pass before a specific event occurs. In operation, the embedded control system is initialized, a current clock cycle counter value is retrieved at a certain point in the initialization, and either an occurrence or an absence of an occurrence of a scheduled event is recognized. A current clock cycle value is recorded upon the recognition, and a mathematic check value is produced from the clock cycle value stored at the certain point in the initialization and the clock cycle value recorded upon the recognition. Subsequently, the model check value is compared to the mathematic check value, and action is taken based on the comparison.
Abstract:
A Schmitt Trigger is implemented in FDSOI technology. The Schmitt Trigger includes a first inverting stage having an NMOS and PMOS transistor having their drains tied together. The NMOS and PMOS transistor each have a first gate coupled to the input voltage and a back gate coupled to the output of the Schmitt Trigger.
Abstract:
An embodiment of a method for automated test pattern generation (ATPG), a system for ATPG, and a memory configured for ATPG. For example, an embodiment of a memory includes a first test memory cell, a data-storage memory cell, and a test circuit configured to enable the test cell and to disable the data-storage cell during a test mode.
Abstract:
An amplitude limiting circuit for a crystal oscillator circuit includes a current source configured to supply drive current to the crystal oscillator circuit and a current sensing circuit configured to sense operating current in an inverting transistor of the crystal oscillator circuit. The current comparison circuit functions to compare the sensed operating current to at least a reference current and generate an output signal. A current control circuit generates a control signal for controlling operation of the current source in response to the output signal.
Abstract:
A phase locked loop includes a voltage-controlled oscillator and a current mirror circuit that supplies a drive current to the voltage-controlled oscillator. The current mirror circuit includes a filter between a bias current generator and current mirror transistor. The filter includes a first and a second switch driven in unison with a small duty cycle.