Doped photoconductive film comprising selenium and tellurium
    36.
    发明授权
    Doped photoconductive film comprising selenium and tellurium 失效
    包含硒和碲的掺杂光导膜

    公开(公告)号:US4463279A

    公开(公告)日:1984-07-31

    申请号:US380779

    申请日:1982-05-21

    CPC分类号: H01L31/08 H01J29/456

    摘要: A photoconductive film comprising a photo-conductive layer which is mainly made of selenium and a region added with tellurium in a direction of the thickness of the layer, wherein at least either one of a portion in a direction of hole flow of said region added with tellurium and a portion in the hole flow of another region which is located adjacent to said region added with tellurium is doped with at least one member selected from the group consisting of an oxide, a fluoride and elements which belong to the group II, III and VII, which are capable of forming a negative space charge in selenium, at a concentration in a range of 10 ppm to 1% by weight on an average. Typical examples of such oxide, fluoride and element include CuO, In.sub.2 O.sub.3, SeO.sub.2, V.sub.2 O.sub.5, MoO.sub.3, WO.sub.3, GaF.sub.2 InF.sub.3, Zn, Ga, In, Cl, I, Br and the like. The after image characteristic ascribable to incident light of high intensity can be significantly improved.

    摘要翻译: 一种光导电膜,其包含主要由硒制成的光导电层和在层的厚度方向上添加有碲的区域,其中所述区域的空穴流动方向上的一部分中的至少一个添加有 碲和与添加有碲的所述区域相邻的另一区域的空穴流中的一部分掺杂有选自氧化物,氟化物和属于II,III族的元素中的至少一种,以及 VII能够在硒中形成负空间电荷,浓度平均为10〜1重量%。 这种氧化物,氟化物和元素的典型实例包括CuO,In2O3,SeO2,V2O5,MoO3,WO3,GaF2 + L,InF3,Zn,Ga,In,Cl,I,Br等。 可以显着提高归因于高强度入射光的后图像特性。

    Method of production of image pickup device
    37.
    发明授权
    Method of production of image pickup device 失效
    图像拾取装置的制造方法

    公开(公告)号:US4380557A

    公开(公告)日:1983-04-19

    申请号:US287554

    申请日:1981-07-28

    CPC分类号: H01J9/233

    摘要: In preparing an image pickup device by using hydrogen-containing amorphous silicon for a photoconductive layer, a hydrogen-containing amorphous silicon layer is first formed and is then heat-treated at 100.degree. to 300.degree. C. The image pickup characteristics of the amorphous silicon layer are highly improved by this heat treatment. For example, the lag and dark current are reduced and the signal current-target voltage characteristic is improved. Especially excellent improving effects can be obtained when amorphous silicon characterized in that (1) the hydrogen content is 5 to 30 atomic %, (2) the optical forbidden band gap is 1.30 to 1.95 eV and (3) in the infrared absorption spectrum, the component of a wave number of 2000 cm.sup.-1 is observed larger than the component of a wave number of 2100 cm.sup.-1 is subjected to the above-mentioned heat treatment. The adhesion to the substrate is enhanced, and good image pickup characteristics can be obtained.

    摘要翻译: 在通过使用含氢非晶硅作为光电导层制备图像拾取装置时,首先形成含氢非晶硅层,然后在100℃至300℃下进行热处理。非晶硅的图像拾取特性 通过这种热处理高度改善了层。 例如,滞后和暗电流降低,信号电流 - 目标电压特性提高。 当非晶硅的特征在于:(1)氢含量为5〜30原子%,(2)光学禁带宽为1.30〜1.95eV,(3)在红外吸收光谱中,特别优异的改善效果为 观察到比2100cm -1的波数的分量更大的波数为2000cm -1的分量进行上述热处理。 增强了与基板的粘附性,并且可以获得良好的图像拾取特性。

    Manufacturing method of semiconductor film and image display device
    39.
    发明授权
    Manufacturing method of semiconductor film and image display device 有权
    半导体薄膜和图像显示装置的制造方法

    公开(公告)号:US07202144B2

    公开(公告)日:2007-04-10

    申请号:US11007188

    申请日:2004-12-09

    IPC分类号: H01L21/20

    摘要: A semiconductor thin film is manufactured by scanning laser light or a substrate onto an arbitrary region of the semiconductor thin film and irradiating a laser thereon. The semiconductor thin film is formed by the substantially belt-shaped crystal being crystallized such that crystalline grains grow in the scanning direction, on the substrate, on XY coordinates where value x of beam size W (μm) of the laser light measured in substantially the same direction as the scanning direction is defined as X axis, and where value y of scanning velocity Vs (m/s) is defined as Y axis, the crystallization processing is performed within a region where all of the following conditions hold: condition 1: the beam size W is larger than wavelength of the laser beam, condition 2: the scanning velocity Vs is smaller than upper-limit of crystal growth speed, and condition 3: x×(1/y)

    摘要翻译: 通过将激光或基板扫描到半导体薄膜的任意区域上并在其上照射激光来制造半导体薄膜。 半导体薄膜由基本上带状的晶体形成,使得晶粒在扫描方向上在基板上在XY坐标上生长,其中激光的光束尺寸W(mum)的值x基本上在 与扫描方向相同的方向被定义为X轴,其中扫描速度Vs(m / s)的值y被定义为Y轴,在满足以下所有条件的区域内进行结晶处理:条件1: 光束尺寸W大于激光束的波长,条件2:扫描速度Vs小于晶体生长速度的上限,条件3:xx(1 / y)<25μs。