公开(公告)号：US20110237058A1

公开(公告)日：2011-09-29

申请号：US13152406

申请日：2011-06-03

申请人： Jung-Ho Yun ,  Gil-heyun Choi ,  Jong-Myeong Lee

发明人： Jung-Ho Yun ,  Gil-heyun Choi ,  Jong-Myeong Lee

IPC分类号： H01L21/225

CPC分类号： H01L21/823814 ,  H01L21/823835

摘要： Provided are a semiconductor device and a method of forming the same. The method includes forming an interlayer dielectric on a semiconductor substrate, forming a contact hole in the interlayer dielectric to expose the semiconductor substrate, forming a metal pattern including a dopant on the exposed semiconductor substrate, and performing a heat treatment process to react the semiconductor substrate with the metal pattern to form a metal silicide pattern. The heat treatment process includes diffuses the dopant into the semiconductor substrate.

摘要翻译： 提供半导体器件及其形成方法。 该方法包括在半导体衬底上形成层间电介质，在层间电介质中形成接触孔以露出半导体衬底，在暴露的半导体衬底上形成包括掺杂剂的金属图案，并进行热处理工艺以使半导体衬底 与金属图案形成金属硅化物图案。 热处理工艺包括将掺杂剂扩散到半导体衬底中。

公开(公告)号：US20110136332A1

公开(公告)日：2011-06-09

申请号：US12960150

申请日：2010-12-03

申请人： Sang-Hoon Ahn ,  Gil-Heyun Choi ,  Jong-Myeong Lee ,  Sang-Don Nam ,  Kyu-Hee Han

发明人： Sang-Hoon Ahn ,  Gil-Heyun Choi ,  Jong-Myeong Lee ,  Sang-Don Nam ,  Kyu-Hee Han

IPC分类号： H01L21/28 ,  H01L21/31

CPC分类号： H01L23/5258 ,  H01L2924/0002 ,  H01L2924/00

摘要： A fuse base insulating region, for example, an insulating interlayer or a compensation region disposed in an insulating interlayer, is formed on a substrate. An etch stop layer is formed on the fuse base insulating region and forming an insulating interlayer having a lower dielectric constant than the first fuse base insulating region on the etch stop layer. A trench extending through the insulating interlayer and the etch stop layer and at least partially into the fuse base insulating region is formed. A fuse is formed in the trench. The fuse base insulating region may have a greater mechanical strength and/or density than the second insulating interlayer.

摘要翻译： 在衬底上形成熔丝基底绝缘区域，例如绝缘中间层或设置在绝缘中间层中的补偿区域。 在熔丝基底绝缘区上形成蚀刻停止层，形成绝缘中间层，该绝缘中间层的介电常数比蚀刻停止层上的第一熔丝基底绝缘区低。 形成了延伸穿过绝缘中间层和蚀刻停止层并且至少部分地进入熔丝基底绝缘区域的沟槽。 在沟槽中形成熔丝。 保险丝座绝缘区域可具有比第二绝缘中间层更大的机械强度和/或密度。

公开(公告)号：US07547632B2

公开(公告)日：2009-06-16

申请号：US11675158

申请日：2007-02-15

申请人： Jung-Hun Seo ,  Gil-Heyun Choi ,  Jong-Myeong Lee ,  Hee-Sook Park

发明人： Jung-Hun Seo ,  Gil-Heyun Choi ,  Jong-Myeong Lee ,  Hee-Sook Park

IPC分类号： H01L21/44

CPC分类号： C23C16/4408 ,  C23C16/54 ,  H01L21/76838 ,  H01L21/76841 ,  H01L21/76861

摘要： A metal deposition processing apparatus includes a first processing chamber configured for holding a semiconductor substrate therein. A second processing chamber is configured for holding the semiconductor substrate therein and for forming an upper metal layer thereon. A transfer chamber is connected to the first processing chamber and the second processing chamber. The transfer chamber is configured to transfer the semiconductor substrate between the first processing chamber and the second processing chamber.

摘要翻译： 金属沉积处理装置包括：第一处理室，被构造成用于将半导体基板保持在其中。 第二处理室构造成用于将半导体衬底保持在其中并用于在其上形成上金属层。 传送室连接到第一处理室和第二处理室。 传送室配置成在第一处理室和第二处理室之间传送半导体衬底。

公开(公告)号：US07452811B2

公开(公告)日：2008-11-18

申请号：US11425970

申请日：2006-06-22

申请人： Kyung-In Choi ,  Sang-Bom Kang ,  Seong-Geon Park ,  You-Kyoung Lee ,  Gil-Heyun Choi ,  Jong-Myeong Lee ,  Sang-Woo Lee

发明人： Kyung-In Choi ,  Sang-Bom Kang ,  Seong-Geon Park ,  You-Kyoung Lee ,  Gil-Heyun Choi ,  Jong-Myeong Lee ,  Sang-Woo Lee

IPC分类号： H01L21/443

CPC分类号： H01L21/28556 ,  C23C16/34 ,  C23C16/45553 ,  H01L21/28562 ,  H01L21/76843 ,  H01L21/7685 ,  H01L21/76858 ,  H01L21/76862 ,  H01L21/76867 ,  H01L21/76877

摘要： In a method for forming a wiring of a semiconductor device using an atomic layer deposition, an insulating interlayer is formed on a substrate. Tantalum amine derivatives represented by a chemical formula Ta(NR1)(NR2R3)3 in which R1, R2 and R3 represent H or C1-C6 alkyl group are introduced onto the insulating interlayer. A portion of the tantalum amine derivatives is chemisorbed on the insulating interlayer. The rest of tantalum amine derivatives non-chemisorbed on the insulating interlayer is removed from the insulating interlayer. A reacting gas is introduced onto the insulating interlayer. A ligand in the tantalum amine derivatives chemisorbed on the insulating interlayer is removed from the tantalum amine derivatives by a chemical reaction between the reacting gas and the ligand to form a solid material including tantalum nitride. The solid material is accumulated on the insulating interlayer through repeating the above processes to form a wiring.

摘要翻译： 在使用原子层沉积形成半导体器件的布线的方法中，在基板上形成绝缘中间层。 由化学式Ta（NR 1）3（NR 2 R 3）3表示的钽胺衍生物，其中 R 1，R 2和R 3代表H或C 1 -C 6 >烷基引入到绝缘中间层上。 一部分钽胺衍生物被化学吸附在绝缘中间层上。 在绝缘中间层上除去非化学吸附在绝缘中间层上的其余的钽胺衍生物。 将反应气体引入到绝缘中间层上。 化学吸附在绝缘中间层上的钽胺衍生物中的配体通过反应气体和配位体之间的化学反应从钽胺衍生物中除去以形成包括氮化钽的固体材料。 通过重复上述处理，将固体材料积聚在绝缘层间，形成布线。

公开(公告)号：US20050020042A1

公开(公告)日：2005-01-27

申请号：US10780244

申请日：2004-02-17

申请人： Seong-Jun Heo ,  Sun-Pil Youn ,  Sung-Man Kim ,  Si-Young Choi ,  Gil-Heyun Choi ,  Ja-Hum Ku ,  Chang-Won Lee ,  Jong-Myeong Lee ,  Kwon-Sun Ryu

发明人： Seong-Jun Heo ,  Sun-Pil Youn ,  Sung-Man Kim ,  Si-Young Choi ,  Gil-Heyun Choi ,  Ja-Hum Ku ,  Chang-Won Lee ,  Jong-Myeong Lee ,  Kwon-Sun Ryu

IPC分类号： H01L21/336 ,  H01L21/28 ,  H01L29/49 ,  H01L29/78 ,  H01L21/8238

CPC分类号： H01L21/28061 ,  H01L21/28088 ,  H01L29/4941 ,  H01L29/4966 ,  H01L29/6659 ,  H01L29/7833

摘要： Methods of forming a semiconductor device having a metal gate electrode include sequentially forming a gate insulator, a gate polysilicon layer and a metal-gate layer on a semiconductor substrate. The metal-gate layer and the gate polysilicon layer are sequentially patterned to form a gate pattern comprising a stacked gate polysilicon pattern and a metal-gate pattern. An oxidation barrier layer is formed to cover at least a portion of a sidewall of the metal-gate pattern.

摘要翻译： 形成具有金属栅电极的半导体器件的方法包括在半导体衬底上顺序地形成栅极绝缘体，栅极多晶硅层和金属栅极层。 金属栅极层和栅极多晶硅层被顺序地图案化以形成包括堆叠栅极多晶硅图案和金属栅极图案的栅极图案。 形成氧化阻挡层以覆盖金属 - 栅极图案的侧壁的至少一部分。

公开(公告)号：US08404579B2

公开(公告)日：2013-03-26

申请号：US12960150

申请日：2010-12-03

申请人： Sang-Hoon Ahn ,  Gil-Heyun Choi ,  Jong-Myeong Lee ,  Sang-Don Nam ,  Kyu-Hee Han

发明人： Sang-Hoon Ahn ,  Gil-Heyun Choi ,  Jong-Myeong Lee ,  Sang-Don Nam ,  Kyu-Hee Han

IPC分类号： H01L21/44

CPC分类号： H01L23/5258 ,  H01L2924/0002 ,  H01L2924/00

摘要： A fuse base insulating region, for example, an insulating interlayer or a compensation region disposed in an insulating interlayer, is formed on a substrate. An etch stop layer is formed on the fuse base insulating region and forming an insulating interlayer having a lower dielectric constant than the first fuse base insulating region on the etch stop layer. A trench extending through the insulating interlayer and the etch stop layer and at least partially into the fuse base insulating region is formed. A fuse is formed in the trench. The fuse base insulating region may have a greater mechanical strength and/or density than the second insulating interlayer.

摘要翻译： 在衬底上形成熔丝基底绝缘区域，例如绝缘中间层或设置在绝缘中间层中的补偿区域。 在熔丝基底绝缘区上形成蚀刻停止层，形成绝缘中间层，该绝缘中间层的介电常数比蚀刻停止层上的第一熔丝基底绝缘区低。 形成了延伸穿过绝缘中间层和蚀刻停止层并且至少部分地进入熔丝基底绝缘区域的沟槽。 在沟槽中形成熔丝。 保险丝座绝缘区域可具有比第二绝缘中间层更大的机械强度和/或密度。

公开(公告)号：US08304343B2

公开(公告)日：2012-11-06

申请号：US13240109

申请日：2011-09-22

申请人： Kyung-In Choi ,  Hyeon-Deok Lee ,  Gil-Heyun Choi ,  Jong-Myeong Lee

发明人： Kyung-In Choi ,  Hyeon-Deok Lee ,  Gil-Heyun Choi ,  Jong-Myeong Lee

IPC分类号： H01L21/768

CPC分类号： H01L21/76814 ,  H01L21/76843 ,  H01L21/76852 ,  H01L21/76856 ,  H01L27/11526 ,  H01L27/11543 ,  H01L27/11546 ,  H01L27/11548

摘要： In a method of manufacturing a metal wiring structure, a first metal wiring and a first barrier layer are formed on a substrate, and the first barrier layer is nitridated. An insulating interlayer is formed on the substrate so as to extend over the first metal wiring and the first barrier layer. Part of the insulating interlayer is removed to form a hole exposing at least part of the first metal wiring and part of the first barrier layer. A nitridation plasma treatment is performed on the exposed portion of the first barrier layer. A second barrier layer is formed along the bottom and sides of the hole. A plug is formed on the second barrier layer to fill the hole.

摘要翻译： 在制造金属布线结构的方法中，在基板上形成第一金属布线和第一阻挡层，并且对第一阻挡层进行氮化。 绝缘中间层形成在基板上，以便延伸越过第一金属布线和第一阻挡层。 去除部分绝缘中间层以形成露出第一金属布线和第一阻挡层的一部分的至少一部分的孔。 在第一阻挡层的暴露部分上进行氮化等离子体处理。 沿着孔的底部和侧面形成第二阻挡层。 在第二阻挡层上形成插塞以填充孔。

公开(公告)号：US08278207B2

公开(公告)日：2012-10-02

申请号：US12688557

申请日：2010-01-15

申请人： Jin-Ho Park ,  Gil-Heyun Choi ,  Byung-Lyul Park ,  Jong-Myeong Lee ,  Zung-Sun Choi ,  Hye-Kyung Jung

发明人： Jin-Ho Park ,  Gil-Heyun Choi ,  Byung-Lyul Park ,  Jong-Myeong Lee ,  Zung-Sun Choi ,  Hye-Kyung Jung

IPC分类号： H01L21/4763

CPC分类号： H01L21/76846 ,  H01L21/28562 ,  H01L21/76856 ,  H01L23/53223 ,  H01L23/53238 ,  H01L23/53252 ,  H01L27/10855 ,  H01L27/11521 ,  H01L27/11524 ,  H01L2924/0002 ,  H01L2924/00

摘要： A semiconductor device can include an insulation layer on that is on a substrate on which a plurality of lower conductive structures are formed, where the insulation layer has an opening. A barrier layer is on a sidewall and a bottom of the opening of the insulation layer, where the barrier layer includes a first barrier layer in which a constituent of a first deoxidizing material is richer than a metal material in the first barrier layer and a second barrier layer in which a metal material in the second barrier layer is richer than a constituent of a second deoxidizing material. An interconnection is in the opening of which the sidewall and the bottom are covered with the barrier layer, the interconnection is electrically connected to the lower conductive structure.

摘要翻译： 半导体器件可以包括在其上形成有多个下导电结构的基板上的绝缘层，其中绝缘层具有开口。 阻挡层位于绝缘层的开口的侧壁和底部上，其中阻挡层包括第一阻挡层，第一脱氧材料的成分比第一阻挡层中的金属材料更富，第二阻隔层 阻挡层，其中第二阻挡层中的金属材料比第二脱氧材料的成分更富。 互连在其开口中，侧壁和底部被阻挡层覆盖，互连电连接到下导电结构。

公开(公告)号：US20080296696A1

公开(公告)日：2008-12-04

申请号：US12127208

申请日：2008-05-27

申请人： Jung-Ho Yun ,  Gil-heyun Choi ,  Jong-Myeong Lee

发明人： Jung-Ho Yun ,  Gil-heyun Choi ,  Jong-Myeong Lee

IPC分类号： H01L27/092 ,  H01L21/8238

CPC分类号： H01L21/823814 ,  H01L21/823835

摘要： Provided are a semiconductor device and a method of forming the same. The method includes forming an interlayer dielectric on a semiconductor substrate, forming a contact hole in the interlayer dielectric to expose the semiconductor substrate, forming a metal pattern including a dopant on the exposed semiconductor substrate, and performing a heat treatment process to react the semiconductor substrate with the metal pattern to form a metal silicide pattern. The heat treatment process includes diffuses the dopant into the semiconductor substrate.

摘要翻译： 提供半导体器件及其形成方法。 该方法包括在半导体衬底上形成层间电介质，在层间电介质中形成接触孔以露出半导体衬底，在暴露的半导体衬底上形成包括掺杂剂的金属图案，并进行热处理工艺以使半导体衬底 与金属图案形成金属硅化物图案。 热处理工艺包括将掺杂剂扩散到半导体衬底中。

公开(公告)号：US20070134932A1

公开(公告)日：2007-06-14

申请号：US11675158

申请日：2007-02-15

申请人： Jung-Hun Seo ,  Gil-Heyun Choi ,  Jong-Myeong Lee ,  Hee-Sook Park

发明人： Jung-Hun Seo ,  Gil-Heyun Choi ,  Jong-Myeong Lee ,  Hee-Sook Park

IPC分类号： C23C16/00 ,  H01L21/31

CPC分类号： C23C16/4408 ,  C23C16/54 ,  H01L21/76838 ,  H01L21/76841 ,  H01L21/76861

摘要： A metal deposition processing apparatus includes a first processing chamber configured for holding a semiconductor substrate therein. A second processing chamber is configured for holding the semiconductor substrate therein and for forming an upper metal layer thereon. A transfer chamber is connected to the first processing chamber and the second processing chamber. The transfer chamber is configured to transfer the semiconductor substrate between the first processing chamber and the second processing chamber.

摘要翻译： 金属沉积处理装置包括：第一处理室，被构造成用于将半导体基板保持在其中。 第二处理室构造成用于将半导体衬底保持在其中并用于在其上形成上金属层。 传送室连接到第一处理室和第二处理室。 传送室配置成在第一处理室和第二处理室之间传送半导体衬底。