Multi-bit memory system with adaptive read voltage controller

    公开(公告)号:US11367489B2

    公开(公告)日:2022-06-21

    申请号:US17126649

    申请日:2020-12-18

    Abstract: According to an embodiment, a semiconductor memory, on receiving a first command, applies a voltage within a first range and a voltage within a second range to a word line and reads a first bit from a memory cell, and, on receiving a second command, applies a voltage within a third range to the word line and reads a second bit from the memory cell. The controller issues the first command a plurality of times and changes the voltages to be applied to the word line within the first range and the second range in accordance with the plurality of first commands, specifies a first and second voltage within the first and the second range, respectively, and estimates a third voltage within the third range. The voltage applied to read the second bit is the estimated third voltage.

    Semiconductor memory device to hold 5-bits of data per memory cell

    公开(公告)号:US11361820B2

    公开(公告)日:2022-06-14

    申请号:US17143530

    申请日:2021-01-07

    Abstract: According to one embodiment, a semiconductor memory device includes: a memory cell configured to hold 5-bit data; a word line coupled to the memory cell; and a row decoder configured to apply first to 31st voltages to the word line. A first bit of the 5-bit data is established by reading operations using first to sixth voltages. A second bit of the 5-bit data is established by reading operations using seventh to twelfth voltages. A third bit of the 5-bit data is established by reading operations using thirteenth to eighteenth voltages. A fourth bit of the 5-bit data is established by reading operations using nineteenth to 25th voltages. A fifth bit of the 5-bit data is established by reading operations using 26th to 31st voltages.

    Memory system
    33.
    发明授权

    公开(公告)号:US11334432B2

    公开(公告)日:2022-05-17

    申请号:US17092054

    申请日:2020-11-06

    Abstract: According to an embodiment, a memory controller obtains first data in a first page using a first voltage, obtains a first shift amount based on a first and second number. The first and second numbers represent numbers of bits each of which has different values in a first and second manner between the first data and first expected data. The controller obtains second data in the second page using a second voltage and a second shift amount, and obtains a third shift amount based on a third and fourth number, the third and fourth numbers respectively represent numbers of bits each of which has different values in the first and second manner between the second data and second expected data.

    Memory system
    34.
    发明授权

    公开(公告)号:US11322210B2

    公开(公告)日:2022-05-03

    申请号:US17005273

    申请日:2020-08-27

    Abstract: According to one embodiment, a memory system includes a semiconductor memory having a plurality of memory cells and a memory controller that controls the semiconductor memory to perform write and read operations and a read operation. The memory controller causes the semiconductor memory to execute a first write operation using a first voltage, detects, in a read operation, first memory cells among the plurality of memory cells that have a threshold voltage higher than a voltage value corresponding to data to be stored and sets a second voltage used for a second write operation after the first write operation based on a detection result of the first memory cells.

    Memory system
    37.
    发明授权

    公开(公告)号:US12073890B2

    公开(公告)日:2024-08-27

    申请号:US18174916

    申请日:2023-02-27

    Abstract: According to one embodiment, a memory system includes a semiconductor memory device and a controller. The device includes a plurality of memory cells capable of storing at least first to third data and a word line coupled to the plurality of memory cells. The first data is determined by a first read operation including a first read level. The second data is determined by a second read operation including a second read level. The third data is determined by a third read operation including a third read level. The controller controls the semiconductor memory device to perform a forth read operation including the first and second read levels in a search operation for first to third read voltages corresponding to the first to third read levels, respectively.

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