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公开(公告)号:US11892907B2
公开(公告)日:2024-02-06
申请号:US17984309
申请日:2022-11-10
Applicant: Kioxia Corporation
Inventor: Tsukasa Tokutomi , Masanobu Shirakawa , Marie Takada , Masamichi Fujiwara , Kazumasa Yamamoto , Naoaki Kokubun , Tatsuro Hitomi , Hironori Uchikawa
CPC classification number: G06F11/1068 , G06F11/1012 , G06F11/1048 , H03M13/1105 , H03M13/1108 , H03M13/1111 , H03M13/152 , H03M13/2906 , H03M13/3715 , H03M13/6505
Abstract: In general, according to an embodiment, a memory system includes a memory device including a memory cell; and a controller. The controller is configured to: receive first data from the memory cell in a first data reading; receive second data from the memory cell in a second data reading that is different from the first data reading; convert a first value that is based on the first data and the second data, to a second value in accordance with a first relationship; and convert the first value to a third value in accordance with a second relationship that is different from the first relationship.
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公开(公告)号:US11763893B2
公开(公告)日:2023-09-19
申请号:US17568336
申请日:2022-01-04
Applicant: Kioxia Corporation
Inventor: Tsukasa Tokutomi , Masanobu Shirakawa , Marie Takada , Shohei Asami , Masamichi Fujiwara
CPC classification number: G11C16/26 , G06F3/0604 , G06F3/0659 , G06F3/0679 , G11C16/0483 , G11C11/5671 , G11C16/08 , H10B43/27 , H10B43/35
Abstract: According to one embodiment, a memory system includes a semiconductor memory and a controller. The semiconductor memory includes first to fourth word lines and first to fourth memory cells. The controller is configured to issue first and second instructions. The controller is further configured to execute a first operation to obtain a first read voltage based on a threshold distribution of the first memory cell, and a second operation to read data from the second memory cell.
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公开(公告)号:US11626167B2
公开(公告)日:2023-04-11
申请号:US17131026
申请日:2020-12-22
Applicant: KIOXIA CORPORATION
Inventor: Masanobu Shirakawa , Tsukasa Tokutomi , Marie Takada
IPC: G11C16/26 , G11C11/56 , G11C16/04 , H01L27/11582 , H01L27/1157
Abstract: According to one embodiment, a memory system includes a semiconductor memory device and a controller. The device includes a plurality of memory cells capable of storing at least first to third data and a word line coupled to the plurality of memory cells. The first data is determined by a first read operation including a first read level. The second data is determined by a second read operation including a second read level. The third data is determined by a third read operation including a third read level. The controller controls the semiconductor memory device to perform a forth read operation including the first and second read levels in a search operation for first to third read voltages corresponding to the first to third read levels, respectively.
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公开(公告)号:US11315643B2
公开(公告)日:2022-04-26
申请号:US16892817
申请日:2020-06-04
Applicant: KIOXIA CORPORATION
Inventor: Tsukasa Tokutomi , Masanobu Shirakawa
Abstract: According to one embodiment, a controller is configured to write four-bit data in each of memory cells, and read first data item from the memory cells through application of a first voltage to a word line. The controller is configured to read second data items by repeating a first operation of reading data including data of respective first bits of the memory cells through application of two voltages to the word line at different timings while changing the two voltages in each first operation from the two voltages in another first operation. The controller is configured to mask part of each of the second data items using the first data.
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公开(公告)号:US11211138B2
公开(公告)日:2021-12-28
申请号:US17003937
申请日:2020-08-26
Applicant: KIOXIA CORPORATION
Inventor: Tsukasa Tokutomi , Kiwamu Watanabe , Yuko Noda
Abstract: A memory system includes a memory chip and a memory controller. The memory chip has a first plane and a second plane. A threshold voltage corresponding to multiple bit data is set for each of the memory cells. The memory controller causes the memory chip to execute a first read process on the first plane and the second plane in parallel by using a plurality of first read voltages different from each other for the first plane and the second plane. The first read process being a process of reading a data group of one bit among the multiple bits by using the first read voltages. The memory controller subsequently adjusts the voltage levels of the first read voltages on the basis of the data group read from the memory cells of the first plane and the data group read from the memory cells of the second plane.
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公开(公告)号:US12094541B2
公开(公告)日:2024-09-17
申请号:US17452463
申请日:2021-10-27
Applicant: Kioxia Corporation
Inventor: Tsukasa Tokutomi , Masanobu Shirakawa , Kengo Kurose , Marie Takada , Ryo Yamaki , Kiyotaka Iwasaki , Yoshihisa Kojima
IPC: G11C7/00 , G06F3/06 , G06F11/10 , G11C11/56 , G11C16/04 , G11C16/26 , G11C29/52 , G11C16/08 , H10B43/27 , H10B43/35
CPC classification number: G11C16/26 , G06F3/0604 , G06F3/0659 , G06F3/0679 , G06F11/1068 , G11C11/5671 , G11C16/0483 , G11C29/52 , G11C16/08 , H10B43/27 , H10B43/35
Abstract: According to one embodiment, a memory system includes a nonvolatile memory and a memory controller. The memory controller is configured: to store, in a buffer, a data set read from a cell unit, and an expected data set generated by an error correction on the data set; to count a number of first and second memory cells corresponding to a first and a second combination of data in the data set and the expected data set, respectively, among the memory cells in the cell unit; to calculate a shift amount of a read voltage used in a read operation from the cell unit, based on the number of the first and second memory cells; and to apply the shift amount to a next read operation from the first cell unit.
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公开(公告)号:US12068044B2
公开(公告)日:2024-08-20
申请号:US18312696
申请日:2023-05-05
Applicant: KIOXIA CORPORATION
Inventor: Tsukasa Tokutomi , Masanobu Shirakawa
CPC classification number: G11C16/34 , G06F11/1068 , G11C11/5628 , G11C11/5642 , G11C16/10 , G11C16/26 , G11C29/52 , G11C16/0483
Abstract: According to one embodiment, a controller is configured to write four-bit data in each of memory cells, and read first data item from the memory cells through application of a first voltage to a word line. The controller is configured to read second data items by repeating a first operation of reading data including data of respective first bits of the memory cells through application of two voltages to the word line at different timings while changing the two voltages in each first operation from the two voltages in another first operation. The controller is configured to mask part of each of the second data items using the first data.
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公开(公告)号:US11367489B2
公开(公告)日:2022-06-21
申请号:US17126649
申请日:2020-12-18
Applicant: KIOXIA CORPORATION
Inventor: Tsukasa Tokutomi , Masanobu Shirakawa , Marie Takada
Abstract: According to an embodiment, a semiconductor memory, on receiving a first command, applies a voltage within a first range and a voltage within a second range to a word line and reads a first bit from a memory cell, and, on receiving a second command, applies a voltage within a third range to the word line and reads a second bit from the memory cell. The controller issues the first command a plurality of times and changes the voltages to be applied to the word line within the first range and the second range in accordance with the plurality of first commands, specifies a first and second voltage within the first and the second range, respectively, and estimates a third voltage within the third range. The voltage applied to read the second bit is the estimated third voltage.
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公开(公告)号:US20220115070A1
公开(公告)日:2022-04-14
申请号:US17556663
申请日:2021-12-20
Applicant: KIOXIA CORPORATION
Inventor: Masanobu Shirakawa , Marie Takada , Tsukasa Tokutomi , Yoshihisa Kojima , Kiichi Tachi
IPC: G11C16/08 , G11C16/34 , H01L27/1157 , G11C16/12 , G11C16/04 , G11C16/26 , G11C11/56 , H01L27/11582 , G11C16/10
Abstract: According to one embodiment, a memory system includes a semiconductor memory and a controller. The semiconductor memory includes: first memory cells, first word lines, a first row decoder, and a driver circuit. The first row decoder includes first transistors capable of coupling the first word lines to first signal lines, and a first block decoder supplying a first block selection signal to the first transistors. When the controller issues a data read command, the first block decoder asserts the first block selection signal to allow the first transistors to transfer a first voltage to a selected first word line, and a second voltage to unselected other first word lines. After data is read, the first block decoder continues asserting the first block selection signal, and the driver circuit transfers a third voltage.
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公开(公告)号:US12300328B2
公开(公告)日:2025-05-13
申请号:US18177877
申请日:2023-03-03
Applicant: Kioxia Corporation
Inventor: Masahiro Saito , Kiwamu Watanabe , Yuko Noda , Tsukasa Tokutomi , Yoshiki Takai
Abstract: A memory controller receives first, second, and third data by first, second, and third reads, specifying a first address, and respectively specifying first, second, and third read voltages higher in this order. The controller instructs a memory to execute a fourth read specifying a fourth read voltage lower than the first read voltage and the first address when a first difference between a first-value-bit count of the first data and an expected value is smaller than a second difference between a first-value-bit count of the third data and the expected value. The memory controller instructs the memory to execute a fifth read specifying a fifth read voltage higher than the third read voltage and the first address when the first difference is larger than the second difference.
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