摘要:
The present invention provides a magnetic memory. In one embodiment, the magnetic memory includes a first line having a first cross-sectional area. A second line is provided having a second cross-sectional area different from the first cross-sectional area. A magnetic memory cell stack is positioned between the first line and the second line.
摘要:
A data storage device that includes a memory cell string. The memory cell string includes a first memory cell and a second memory cell. The device also includes a circuit coupled to a node between the first memory cell and a second memory cell. The circuit is configured to detect a voltage change at the node in response to a voltage being provided to the memory cell string and the first memory cell being written to a first state.
摘要:
A memory cell sensor including an integrator for sensing a logical state of a memory cell. An integrator calibration circuit provides a corrective bias to the integrator, the corrective bias being based upon a difference between an initial integrator output value and a reference value. Another embodiment includes a method of sensing a logical state of a memory cell. The memory cell being sensed by an integrator. The method includes determining an initial integrator output value when a corrective bias of the integrator is zeroed, generating a correction value by comparing the initial integrator output value to a reference value, and applying the correction value to the corrective bias of the integrator.
摘要:
A memory array has a plurality of conductor structures. Each conductor structure has a top wire segment extending in a first direction, a middle wire segment extending in a second direction at an angle from the first direction, a bottom wire segment extending in a direction opposite to the first direction, and a via connecting the top, middle, and bottom wire segments. A plurality of memory cells in an upper plane of the memory array are formed at intersections of the middle wire segment of each conductor structure with the top wire segments of neighboring conductor structures, and a plurality of memory cells in a lower plane are formed at intersections of the middle wire segment of each conductor structure with the bottom wire segments of neighboring conductor structures.
摘要:
A method for reading a memory element within a crossbar array includes switching a column line connected to a target memory element of the crossbar array to connected to an input of a current mirror; applying an error voltage to unselected rows of the crossbar array; applying a sense voltage to a row line connected to the target memory element; and measuring an output current of the current mirror.
摘要:
A read circuit for sensing a resistive state of a resistive switching device in a crosspoint array has an equipotential preamplifier connected to a selected column line of the resistive switching device in the array to deliver a read current while maintaining the selected column line at a reference voltage near a biasing voltage applied to unselected row lines of the array. The read circuit includes a reference voltage generation component for generating the reference voltage for the equipotential preamplifier. The reference voltage generation component samples the biasing voltage via the selected column line and adds a small increment to a sampled biasing voltage to form the reference voltage.
摘要:
A sense amplifier for reading the data stored in a crossbar array includes a storage transistor to store a first voltage resulting from an electric current from a column line connected to a target memory element while the target memory element is half-selected, the first voltage resulting from bias voltages applied to row lines not connected to the target memory element; a mirror transistor to store a second voltage resulting from an electric current from the column line while the target memory element is fully selected; a cross-coupled inverter circuit having a first branch connected to the storage transistor and a second branch connected to the mirror transistor; and an output node to output a signal from the first branch of the cross-coupled inverter circuit, the signal based on a comparison between the first voltage stored in the storage transistor and the second voltage across the mirror transistor.
摘要:
A method for reading a memory element within a crossbar array, the method including selecting a column line connected to a target memory element of the crossbar array by applying a supply voltage to a source follower, a gate terminal of the source follower connected to the column line; applying bias voltages to row lines of the crossbar array; storing an output voltage of the source follower in a storage element; applying a sense voltage to a row line connected to the target memory element; and outputting a difference between the voltage stored in the storage element and an output voltage of the source follower while the sense voltage is applied to the row line.
摘要:
A method for reading a memory element within a crossbar array includes switching a column line connected to a target memory element of the crossbar array to connected to an input of a current mirror; applying an error voltage to unselected rows of the crossbar array; applying a sense voltage to a row line connected to the target memory element; and measuring an output current of the current mirror.
摘要:
A combined analog and digital calibration circuit and method for adjusting an output offset voltage of a differential amplifier circuit are provided. The circuit comprises a digitally controlled voltage divider positioned between at least one isolated well and a controllable voltage source, a controllable voltage source controlled by an initial constant current and a variable current, and a controller to modify the variable current to continuously adjust the back gate control voltage. The method comprises adjusting a control voltage of at least one of a pair of input transistors using a back gate control voltage, providing an analog current to establish a back gate control voltage, and altering the analog current when the back gate control voltage causes an output offset voltage to differ from a reference voltage by more than a predetermined quantity.