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公开(公告)号:US20230420570A1
公开(公告)日:2023-12-28
申请号:US18244329
申请日:2023-09-11
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Tatsuya HONDA , Masashi TSUBUKU , Yusuke NONAKA , Takashi SHIMAZU , Shunpei YAMAZAKI
IPC: H01L29/786 , H01L29/04 , H01L29/24 , H01L29/51 , G02F1/1333 , G02F1/1337 , G02F1/1339 , G02F1/1343 , H01L27/12 , H01L29/66
CPC classification number: H01L29/7869 , H01L29/045 , H01L29/24 , H01L29/51 , G02F1/133345 , G02F1/1337 , G02F1/13394 , G02F1/134309 , H01L27/1225 , H01L29/66969 , H01L29/78696 , H01L21/02565
Abstract: A semiconductor device includes a gate electrode, a gate insulating film which includes oxidized material containing silicon and covers the gate electrode, an oxide semiconductor film provided to be in contact with the gate insulating film and overlap with at least the gate electrode, and a source electrode and a drain electrode electrically connected to the oxide semiconductor film. In the oxide semiconductor film, a first region which is provided to be in contact with the gate insulating film and have a thickness less than or equal to 5 nm has a silicon concentration lower than or equal to 1.0 at. %, and a region in the oxide semiconductor film other than the first region has lower silicon concentration than the first region. At least the first region includes a crystal portion.
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公开(公告)号:US20230369341A1
公开(公告)日:2023-11-16
申请号:US18137032
申请日:2023-04-20
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Masahiro TAKAHASHI , Takuya HIROHASHI , Masashi TSUBUKU , Noritaka ISHIHARA , Masashi OOTA
IPC: H01L27/12 , G02F1/1368 , C23C14/08 , H01L29/66 , H01L29/786 , H01L29/24 , H01L29/04 , G01N23/207 , H01L21/66 , H01L21/02
CPC classification number: H01L27/1225 , G02F1/1368 , C23C14/086 , H01L29/66969 , H01L29/78693 , H01L29/7869 , H01L29/24 , H01L29/04 , G01N23/207 , H01L22/12 , H01L2924/0002 , H01L21/0237 , H01L21/02631 , H01L21/02422 , H01L21/02565 , H01L21/02554
Abstract: A metal oxide film including a crystal part and having highly stable physical properties is provided. The size of the crystal part is less than or equal to 10 nm, which allows the observation of circumferentially arranged spots in a nanobeam electron diffraction pattern of the cross section of the metal oxide film when the measurement area is greater than or equal to 5 nmφ and less than or equal to 10 nmφ.
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公开(公告)号:US20230085495A1
公开(公告)日:2023-03-16
申请号:US17989861
申请日:2022-11-18
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Shunpei YAMAZAKI , Junichiro SAKATA , Masashi TSUBUKU , Kengo AKIMOTO , Miyuki HOSOBA , Masayuki SAKAKURA , Yoshiaki OIKAWA
IPC: H01L21/477 , H01L27/12 , H01L29/66 , H01L21/02 , G02F1/1333 , G02F1/1368 , H01L29/786
Abstract: An object is to provide a display device with excellent display characteristics, where a pixel circuit and a driver circuit provided over one substrate are formed using transistors which have different structures corresponding to characteristics of the respective circuits. The driver circuit portion includes a driver circuit transistor in which a gate electrode layer, a source electrode layer, and a drain electrode layer are formed using a metal film, and a channel layer is formed using an oxide semiconductor. The pixel portion includes a pixel transistor in which a gate electrode layer, a source electrode layer, and a drain electrode layer are formed using an oxide conductor, and a semiconductor layer is formed using an oxide semiconductor. The pixel transistor is formed using a light-transmitting material, and thus, a display device with higher aperture ratio can be manufactured.
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公开(公告)号:US20220393035A1
公开(公告)日:2022-12-08
申请号:US17886643
申请日:2022-08-12
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Hajime KIMURA , Kengo AKIMOTO , Masashi TSUBUKU , Toshinari SASAKI
IPC: H01L29/786 , G09G3/36 , H01L27/12
Abstract: A display device including a pixel having a memory. The pixel includes at least a display element, a capacitor, an inverter, and a switch. The switch is controlled with a signal held in the capacitor and a signal output from the inverter so that voltage is supplied to the display element. The inverter and the switch can be constituted by transistors with the same polarity. A semiconductor layer included in the pixel may be formed using a light-transmitting material. Moreover, a gate electrode, a drain electrode, and a capacitor electrode may be formed using a light-transmitting conductive layer. The pixel is formed using a light-transmitting material in such a manner, whereby the display device can be a transmissive display device while including a pixel having a memory.
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公开(公告)号:US20220123149A1
公开(公告)日:2022-04-21
申请号:US17565771
申请日:2021-12-30
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Shunpei YAMAZAKI , Jun KOYAMA , Masashi TSUBUKU , Kosei NODA
IPC: H01L29/786 , H01L27/12 , H01L27/02
Abstract: A logic circuit includes a thin film transistor having a channel formation region formed using an oxide semiconductor, and a capacitor having terminals one of which is brought into a floating state by turning off the thin film transistor. The oxide semiconductor has a hydrogen concentration of 5×1019 (atoms/cm3) or less and thus substantially serves as an insulator in a state where an electric field is not generated. Therefore, off-state current of a thin film transistor can be reduced, leading to suppressing the leakage of electric charge stored in a capacitor, through the thin film transistor. Accordingly, a malfunction of the logic circuit can be prevented. Further, the excessive amount of current which flows in the logic circuit can be reduced through the reduction of off-state current of the thin film transistor, resulting in low power consumption of the logic circuit.
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公开(公告)号:US20210358766A1
公开(公告)日:2021-11-18
申请号:US17325490
申请日:2021-05-20
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Shunpei YAMAZAKI , Junichiro SAKATA , Masashi TSUBUKU , Kengo AKIMOTO , Miyuki HOSOBA , Masayuki SAKAKURA , Yoshiaki OIKAWA
IPC: H01L21/477 , H01L27/12 , H01L29/66 , H01L21/02 , G02F1/1333 , G02F1/1368 , H01L29/786
Abstract: An object is to provide a display device with excellent display characteristics, where a pixel circuit and a driver circuit provided over one substrate are formed using transistors which have different structures corresponding to characteristics of the respective circuits. The driver circuit portion includes a driver circuit transistor in which a gate electrode layer, a source electrode layer, and a drain electrode layer are formed using a metal film, and a channel layer is formed using an oxide semiconductor. The pixel portion includes a pixel transistor in which a gate electrode layer, a source electrode layer, and a drain electrode layer are formed using an oxide conductor, and a semiconductor layer is formed using an oxide semiconductor. The pixel transistor is formed using a light-transmitting material, and thus, a display device with higher aperture ratio can be manufactured.
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公开(公告)号:US20210189547A1
公开(公告)日:2021-06-24
申请号:US17113653
申请日:2020-12-07
Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Inventor: Shunpei YAMAZAKI , Junichi KOEZUKA , Kenichi OKAZAKI , Masashi TSUBUKU
Abstract: A metal oxide film containing a crystal part is provided. Alternatively, a metal oxide film with highly stable physical properties is provided. Alternatively, a metal oxide film with improved electrical characteristics is provided. Alternatively, a metal oxide film with which field-effect mobility can be increased is provided.
A metal oxide film including In, M (M is Al, Ga, Y, or Sn), and Zn includes a first crystal part and a second crystal part; the first crystal part has c-axis alignment; the second crystal part has no c-axis alignment; and the existing proportion of the second crystal part is higher than the existing proportion of the first crystal part.-
公开(公告)号:US20190386141A1
公开(公告)日:2019-12-19
申请号:US16555275
申请日:2019-08-29
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Shunpei YAMAZAKI , Jun KOYAMA , Masashi TSUBUKU , Kosei NODA
IPC: H01L29/786 , H01L27/02 , H01L27/12
Abstract: A logic circuit includes a thin film transistor having a channel formation region formed using an oxide semiconductor, and a capacitor having terminals one of which is brought into a floating state by turning off the thin film transistor. The oxide semiconductor has a hydrogen concentration of 5×1019 (atoms/cm3) or less and thus substantially serves as an insulator in a state where an electric field is not generated. Therefore, off-state current of a thin film transistor can be reduced, leadind to suppressing the leakage of electric charge stored in a capacitor, through the thin film transistor. Accordingly, a malfunction of the logic circuit can be prevented. Further, the excessive amount of current which flows in the logic circuit can be reduced through the reduction of off-state current of the thin film transistor, resulting in low power consumption of the logic circuit.
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公开(公告)号:US20180151596A1
公开(公告)日:2018-05-31
申请号:US15879506
申请日:2018-01-25
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Masahiro TAKAHASHI , Takuya HIROHASHI , Masashi TSUBUKU , Noritaka ISHIHARA , Masashi OOTA
IPC: H01L27/12 , H01L21/66 , G01N23/207 , G02F1/1368 , C23C14/08 , H01L29/04 , H01L29/24 , H01L29/66 , H01L29/786 , H01L21/02
Abstract: A metal oxide film including a crystal part and having highly stable physical properties is provided. The size of the crystal part is less than or equal to 10 nm, which allows the observation of circumferentially arranged spots in a nanobeam electron diffraction pattern of the cross section of the metal oxide film when the measurement area is greater than or equal to 5 nmφ and less than or equal to 10 nφ.
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40.
公开(公告)号:US20180090086A1
公开(公告)日:2018-03-29
申请号:US15824343
申请日:2017-11-28
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Shunpei YAMAZAKI , Ryo ARASAWA , Jun KOYAMA , Masashi TSUBUKU , Kosei NODA
IPC: G09G3/36 , H01L29/786 , G02F1/1335 , H01L29/66 , H01L29/45 , H01L29/423 , H01L29/24 , H01L27/12 , H01L21/477 , H01L21/467 , H01L21/02 , G02F1/1343 , G02F1/1368
Abstract: In a liquid crystal display device including a plurality of pixels in a display portion and configured to performed display in a plurality of frame periods, each of the frame periods includes a writing period and a holding period, and after an image signal is input to each of the plurality of pixels in the writing period, a transistor included in each of the plurality of pixels is turned off and the image signal is held for at least 30 seconds in the holding period. The pixel includes a semiconductor layer including an oxide semiconductor layer, and the oxide semiconductor layer has a carrier concentration of less than 1×1014/cm3.
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