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公开(公告)号:US20180061972A1
公开(公告)日:2018-03-01
申请号:US15600795
申请日:2017-05-22
Inventor: Xiaorong LUO , Gaoqiang DENG , Kun ZHOU , Qing LIU , Linhua HUANG , Tao SUN , Bo ZHANG
IPC: H01L29/739 , H01L29/74 , H01L29/10 , H01L29/08 , H01L29/861
CPC classification number: H01L29/7397 , H01L29/0634 , H01L29/0804 , H01L29/0834 , H01L29/1095 , H01L29/7395 , H01L29/7416 , H01L29/8611
Abstract: The present invention relates to the technical field of the power semiconductor device relates to a reverse conducting insulated gate bipolar transistor (RC-IGBT). The RC-IGBT comprises a P-type region, an N-type emitter region, a P-type body contact region, a dielectric trench, a collector region, and an electrical filed cutting-off region. The beneficial effect of the present invention is that, when compared with traditional RC-IGBT, the IGBT of the present invention can eliminate negative resistance effect and effectively improve the performance of forward and reverse conduction.
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公开(公告)号:US20160322483A1
公开(公告)日:2016-11-03
申请号:US15209745
申请日:2016-07-13
Applicant: UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA , INSTITUTE OF ELECTRONIC AND INFORMATION ENGINEERING IN DONGGUAN, UESTC
Inventor: Jinping ZHANG , Yadong SHAN , Gaochao XU , Xin YAO , Jingxiu LIU , Zehong LI , Min REN , Bo ZHANG
IPC: H01L29/739 , H01L29/06 , H01L29/10 , H01L29/423
CPC classification number: H01L29/7397 , H01L29/0634 , H01L29/1095 , H01L29/4236
Abstract: A bidirectional IGBT device, including a cellular structure including: two MOS structures, a substrate drift layer, two highly doped buried layers operating for carrier storage or field stop, two metal electrodes, and isolating dielectrics. Each MOS structure includes: a body region, a heavily doped source region, a body contact region, and a gate structure. Each gate structure includes: a gate dielectric and a gate conductive material. The two MOS structures are symmetrically disposed on the top surface and the back surface of the substrate drift layer. The heavily doped source region and the body contact region are disposed in the body region and independent from each other, and both surfaces of the heavily doped source region and the body contact region are connected to each of the two metal electrodes. The gate dielectric separates the gate conductive material from a channel region of each of the MOS structures.
Abstract translation: 一种双向IGBT器件,其包括:两个MOS结构,衬底漂移层,用于载流子存储或场停止的两个高掺杂掩埋层,两个金属电极和隔离电介质。 每个MOS结构包括:体区,重掺杂源区,体接触区和栅结构。 每个栅极结构包括:栅极电介质和栅极导电材料。 两个MOS结构对称地设置在衬底漂移层的顶表面和背表面上。 重掺杂源极区域和体接触区域设置在体区域中并且彼此独立,并且重掺杂源极区域和体接触区域的两个表面连接到两个金属电极中的每一个。 栅极电介质将栅极导电材料与每个MOS结构的沟道区分离。
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公开(公告)号:US20250107137A1
公开(公告)日:2025-03-27
申请号:US18398222
申请日:2023-12-28
Inventor: Ming QIAO , Jiawei WANG , Dingxiang MA , Yue GAO , Gen LIU , Shengduo WANG , Yuanqing YE , Bo ZHANG
IPC: H01L29/78 , H01L29/06 , H01L29/417
Abstract: A lateral power semiconductor device layout and a device structure belong to the technical field of power semiconductor devices. A method for designing a lateral power semiconductor device layout with high integrity and high cell density has the following advantages of reducing a specific on-resistance of the device, increasing a width of a channel per unit area, improving the current capability of the device, optimizing the static characteristic of the device, reducing the area of a drain region and the parasitic capacitance of the device, reducing the delay time of a cell switch caused by an excessively long gate electrode of a traditional finger cell, optimizing the dynamic characteristic of the device, optimizing the cell edge of the device and the curvature effect of a terminal, and reducing the pre-breakdown risk of the device.
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公开(公告)号:US20200076086A1
公开(公告)日:2020-03-05
申请号:US16556258
申请日:2019-08-30
Inventor: Yujian CHENG , Yanran DING , Jinfan ZHANG , Chunxu BAI , Yong FAN , Kaijun SONG , Xianqi LIN , Bo ZHANG
Abstract: A shared-aperture antenna includes a first copper metal layer; a second copper metal layer; and a dielectric substrate layer sandwiched between the first copper metal layer and the second copper metal layer. The dielectric substrate layer includes a plurality of metallized vias. The first copper metal layer is in communication with the second copper metal layer via the plurality of metallized vias. The plurality of metallized vias includes first metallized vias forming an inner circular ring and second metallized vias forming an outer circular ring with respect to the center of the antenna. The first copper metal layer, the dielectric substrate layer, the second copper metal layer, and the first metallized vias form a substrate integrated waveguide (SIW) circular cavity slot antenna. The first copper metal layer, the dielectric substrate layer, the second copper metal layer, the first metallized vias and the second metallized vias form a coaxial cavity slot antenna.
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公开(公告)号:US20190304966A1
公开(公告)日:2019-10-03
申请号:US16017978
申请日:2018-06-25
Inventor: Ming QIAO , Zhao QI , Jiamu XIAO , Longfei LIANG , Danye LIANG , Bo ZHANG
Abstract: The present invention provides a high voltage ESD protection device including a P-type substrate; a first NWELL region located on the left of the upper part of the P-type substrate; an NP contact region located on the upper part of the first NWELL region; an N+ contact region located on the right of the upper part of the P-type substrate apart from the first NWELL region; a P+ contact region tangential to the right side of the N+ contact region; a NTOP layer arranged on the right of the NP contact region inside the first NWELL region. The NP contact region is connected to a metal piece to form a metal anode. The N+ contact region and the P+ contact region are connected by a metal piece to form a metal cathode.
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公开(公告)号:US20190004553A1
公开(公告)日:2019-01-03
申请号:US16026081
申请日:2018-07-03
Applicant: University of Electronic Science and Technology of China , Institute of Electronic and Information Engineering of UESTC in Guangdong
Inventor: Xin MING , Jiahao ZHANG , Wenlin ZHANG , Di GAO , Xuan ZHANG , Zhuo WANG , Bo ZHANG
CPC classification number: G05F1/575 , H03F3/082 , H03F3/3061 , H03F3/45183 , H03F3/45264 , H03F3/45269 , H03F3/45273
Abstract: A ripple pre-amplification based fully integrated LDO pertains to the technical field of power management. The positive input terminal of a transconductance amplifier is connected to a reference voltage Vref, and the negative input terminal of the transconductance amplifier is connected to the feedback voltage Vfb. The output terminal of the transconductance amplifier is connected to the negative input terminal of a transimpedance amplifier and the negative input terminal of an error amplifier. The positive input terminal of the transimpedance amplifier is connected to the ground GND, and the output terminal of the transimpedance amplifier is connected to the positive input terminal of the error amplifier. The gate terminal of the power transistor MP is connected to the output terminal of the error amplifier, the source terminal of the power transistor MP is connected to an input voltage VIN, and the drain terminal of the power transistor MP is grounded.
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公开(公告)号:US20180046212A1
公开(公告)日:2018-02-15
申请号:US15387678
申请日:2016-12-22
Inventor: Xin MING , Tiansheng LI , Jun XU , Zhuo WANG , Bo ZHANG
IPC: G05F1/575
Abstract: A low-dropout regulator, including: a dynamic pole tracking circuit having an active load, a voltage-to-current converter, a current amplifier, a bias circuit, a regulating transistor, a first feedback resistor, a second feedback resistor, and a first capacitor. The dynamic pole tracking circuit includes: a first PMOS, a second PMOS, a first resistor, and a second resistor. The voltage-to-current converter includes: a first NMOS, a second NMOS, a third NMOS, a fourth NMOS, a fifth NMOS, a sixth NMOS, a seventh NMOS, an eighth NMOS, a third PMOS, a fourth PMOS, a seventh PMOS, an eighth PMOS. The current amplifier includes: a fifth PMOS, a sixth PMOS, a ninth NMOS, a tenth NMOS, and a third resistor. The bias circuit includes: a ninth PMOS, a tenth PMOS, an eleventh PMOS, an eleventh NMOS, a twelfth NMOS, a thirteenth NMOS, and a fourth resistor.
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公开(公告)号:US20180026143A1
公开(公告)日:2018-01-25
申请号:US15602107
申请日:2017-05-23
IPC: H01L29/872 , H01L29/66 , H01L29/15
CPC classification number: H01L29/872 , H01L21/26586 , H01L29/0619 , H01L29/0634 , H01L29/157 , H01L29/158 , H01L29/1608 , H01L29/66143
Abstract: The present invention relates to the field of semiconductor technology, particularly to a super-junction schottky diode. According to the present invention, the effective area of schottky junction is increased by forming the schottky junction in the trench located in the body of the device. Therefore, the current capacity of this novel schottky diode can be greatly improved. In addition, a super-junction structure is used to improve the device's reverse breakdown voltage and reduce the reverse leakage current. The super-junction schottky diode provided in the present invention can achieve a larger forward current, a lower on-resistance and a better reverse breakdown characteristic.
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公开(公告)号:US20170084728A1
公开(公告)日:2017-03-23
申请号:US15372352
申请日:2016-12-07
Applicant: UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA , INSTITUTE OF ELECTRONIC AND INFORMATION ENGINEERING IN DONGGUAN, UESTC
Inventor: Jinping ZHANG , Zehong LI , Jingxiu LIU , Min REN , Bo ZHANG , Zhaoji LI
IPC: H01L29/74 , H01L29/10 , H01L21/02 , H01L29/66 , H01L21/3065 , H01L21/265 , H01L29/747 , H01L29/40
CPC classification number: H01L29/7424 , H01L21/02233 , H01L21/26586 , H01L21/3065 , H01L29/0623 , H01L29/1095 , H01L29/407 , H01L29/408 , H01L29/66325 , H01L29/66386 , H01L29/7394 , H01L29/747 , H01L29/78
Abstract: A bidirectional Metal-Oxide-Semiconductor (MOS) device, including a P-type substrate, and an active region. The active region includes a drift region, a first MOS structure and a second MOS structure; the first MOS structure includes a first P-type body region, a first P+ contact region, a first N+ source region, a first metal electrode, and a first gate structure; the second MOS structure includes a second P-type body region, a second P+ contact region, a second N+ source region, a second metal electrode, and a second gate structure; and the drift region includes a dielectric slot, a first N-type layer, a second N-type layer, and an N-type region. The active region is disposed on the upper surface of the P-type substrate. The first MOS structure and the second MOS structure are symmetrically disposed on two ends of the upper layer of the drift region.
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