Power module and method for manufacturing power module

    公开(公告)号:US11217571B2

    公开(公告)日:2022-01-04

    申请号:US16977172

    申请日:2019-03-05

    IPC分类号: H01L25/11 H01L25/18 H01L25/00

    摘要: A power module (1) is disclosed, comprising: first and second substrates (10), each substrate patterned layer of electrically conductive material (12), a plurality of pre-packed power cells (20), positioned between the substrates, each cell comprising: an electrically insulating core (21) embedding at least one power die (22), and two external layers (23) of electrically conductive material on opposite sides of the electrically insulating core (21), said external layers being respectively connected to each patterned layers of the substrates, wherein each external layer of a pre-packed power cell comprises a contact pad (230) connected to a respective contact (220) of the power die through connections arranged in the electrically insulating core (21), said contact pad having a surface area greater than the surface area of the power die electrical contact to which it is connected.

    Electric power conversion apparatus

    公开(公告)号:US11191192B2

    公开(公告)日:2021-11-30

    申请号:US16396814

    申请日:2019-04-29

    申请人: DENSO CORPORATION

    IPC分类号: H05K7/20 H01L23/473 H01L25/11

    摘要: In an electric power conversion apparatus, a semiconductor module-cooler unit includes a semiconductor module and a cooler that has cooling pipes stacked with the semiconductor module in a stacking direction. A flow path forming component includes an electronic component main body and has an in-component flow path formed therein. A case receives both the semiconductor module-cooler unit and the flow path forming component therein. A pressure-applying member is arranged in the case to apply pressure to the semiconductor module-cooler unit from a rear side toward a front side in the stacking direction. Moreover, the flow path forming component is fixed to the case. The pressure-applying member, the semiconductor module-cooler unit and the flow path forming component are arranged in alignment with each other in the stacking direction. An in-cooler flow path formed in the cooler and the in-component flow path are fluidically connected with each other in the stacking direction.

    SEMICONDUCTOR DEVICE AND IMAGING APPARATUS

    公开(公告)号:US20210280724A1

    公开(公告)日:2021-09-09

    申请号:US17327316

    申请日:2021-05-21

    发明人: MAKOTO MURAI

    摘要: In a semiconductor device, a first package is provided with a first substrate under which a semiconductor chip configured to output a signal and a first wiring electrically connected to the semiconductor chip are arranged. A second package is provided with a second substrate above which a processing circuit configured to process the output signal, a second wiring electrically connected to the processing circuit, and an encapsulant configured to seal the processing circuit are arranged, the semiconductor chip and the encapsulant being arranged to face each other in a non-contact manner. A connection portion electrically connects the first wiring and the second wiring.

    Semiconductor device
    36.
    发明授权

    公开(公告)号:US11107761B2

    公开(公告)日:2021-08-31

    申请号:US16253710

    申请日:2019-01-22

    申请人: DENSO CORPORATION

    摘要: A semiconductor device may include a first conductive plate, a plurality of semiconductor chips disposed on the first conductive plate, and a first external connection terminal connected to the first conductive plate. The plurality of semiconductor chips may include first, second, and third semiconductor chips. The second semiconductor chip may be located between the first semiconductor chip and the third semiconductor chip. A portion of the first conductive plate where the first external connection terminal is connected may be closest to the second semiconductor chip among the first, second, and third semiconductor chips. The first conductive plate may be provided with an aperture located between the portion of the first conductive plate where the first external connection terminal is connected and a portion of the first conductive plate where the second semiconductor chip is connected.