公开(公告)号：US20220215239A1

公开(公告)日：2022-07-07

申请号：US17219352

申请日：2021-03-31

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Thuan Vu ,  Stephen Trinh ,  Stanley Hong ,  Nghia Le ,  Toan Le ,  Hien Pham

IPC: G06N3/063 ,  G11C16/10 ,  G11C16/34 ,  G06F7/523 ,  H03M1/38

Abstract: Numerous embodiments for reading or verifying a value stored in a selected non-volatile memory cell in a vector-by-matrix multiplication (VMM) array in an artificial neural network are disclosed. The embodiments comprise various designs of input blocks for applying inputs to the VMM array during a read or verify operation and various designs of output blocks for receiving outputs from the VMM array during the read or verify operation.

公开(公告)号：US11328752B2

公开(公告)日：2022-05-10

申请号：US17095331

申请日：2020-11-11

Applicant: Silicon Storage Technology, Inc.

Inventor： Massimiliano Frulio

IPC: G11C7/06 ,  G11C7/10 ,  H03K19/21 ,  G11C7/22

Abstract: A self-timed sensing architecture for reading a selected cell in an array of non-volatile cells is disclosed. The sensing circuitry generates a signal when a stable sensing value has been obtained from the selected cell, where the stable sensing value indicates the value stored in the selected cell. The signal indicates the end of the sensing operation, causing the stable sensing value to be output as the result of the read operation.

公开(公告)号：US11315635B2

公开(公告)日：2022-04-26

申请号：US17152696

申请日：2021-01-19

Applicant: Silicon Storage Technology, Inc.

Inventor： Chunming Wang ,  Xian Liu ,  Guo Xiang Song ,  Leo Xing ,  Nhan Do

IPC: G11C16/04 ,  G11C16/16 ,  H01L27/11556 ,  H01L27/11521 ,  H01L29/423

Abstract: A memory device includes a semiconductor substrate, first and second regions in the substrate having a conductivity type different than that of the substrate, with a channel region in the substrate extending between the first and second regions. The channel region is continuous between the first and second regions. A first floating gate is disposed over and insulated from a first portion of the channel region. A second floating gate is disposed over and insulated from a second portion of the channel region. A first coupling gate is disposed over and insulated from the first floating gate. A second coupling gate is disposed over and insulated from the second floating gate. A word line gate is disposed over and insulated from a third portion of the channel region between the first and second channel region portions. An erase gate is disposed over and insulated from the word line gate.

公开(公告)号：US11308383B2

公开(公告)日：2022-04-19

申请号：US15594439

申请日：2017-05-12

Applicant: Silicon Storage Technology, Inc. ,  The Regents of the University of California

Inventor： Farnood Merrikh Bayat ,  Xinjie Guo ,  Dmitri Strukov ,  Nhan Do ,  Hieu Van Tran ,  Vipin Tiwari ,  Mark Reiten

IPC: G06N3/04 ,  G06N3/063 ,  G06F3/06

Abstract: An artificial neural network device that utilizes one or more non-volatile memory arrays as the synapses. The synapses are configured to receive inputs and to generate therefrom outputs. Neurons are configured to receive the outputs. The synapses include a plurality of memory cells, wherein each of the memory cells includes spaced apart source and drain regions formed in a semiconductor substrate with a channel region extending there between, a floating gate disposed over and insulated from a first portion of the channel region and a non-floating gate disposed over and insulated from a second portion of the channel region. Each of the plurality of memory cells is configured to store a weight value corresponding to a number of electrons on the floating gate. The plurality of memory cells are configured to multiply the inputs by the stored weight values to generate the outputs.

公开(公告)号：US11270771B2

公开(公告)日：2022-03-08

申请号：US16382051

申请日：2019-04-11

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Steven Lemke ,  Vipin Tiwari ,  Nhan Do ,  Mark Reiten

IPC: G11C11/54 ,  G11C16/10 ,  G11C16/04 ,  G11C16/26 ,  G06N3/04 ,  G11C14/00 ,  G06N3/063 ,  H01L27/115 ,  H01L27/11521

Abstract: A neural network device with synapses having memory cells each having source and drain regions in a semiconductor substrate with a channel region extending there between, a floating gate over an entirety of the channel region, and a first gate over the floating gate. First lines each electrically connect together the first gates in one of the memory cell rows, second lines each electrically connect together the source regions in one of the memory cell rows, and third lines each electrically connect together the drain regions in one of the memory cell columns. The synapses are configured to receive a first plurality of inputs as electrical voltages on the first lines or on the second lines, and to provide a first plurality of outputs as electrical currents on the third lines.

公开(公告)号：US20220067499A1

公开(公告)日：2022-03-03

申请号：US17190376

申请日：2021-03-02

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran

IPC: G06N3/063 ,  G11C11/40 ,  G06F7/523

Abstract: Numerous embodiments of analog neural memory systems that enable concurrent write and verify operations are disclosed. In some embodiments, concurrent operations occur among different banks of memory. In other embodiments, concurrent operations occur among different blocks of memory, where each block comprises two or more banks of memory. The embodiments substantially reduce the timing overhead for weight writing and verifying operations in analog neural memory systems.

公开(公告)号：US11257555B2

公开(公告)日：2022-02-22

申请号：US17006550

申请日：2020-08-28

Applicant: Silicon Storage Technology, Inc.

Inventor： Guangming Lin ,  Xiaozhou Qian ,  Xiao Yan Pi ,  Vipin Tiwari ,  Zhenlin Ding

IPC: G11C16/04 ,  G11C16/34 ,  G11C16/26 ,  G11C16/14 ,  G11C16/10 ,  G06F12/02 ,  G06F12/08

Abstract: The present invention relates to systems and methods for implementing wear leveling in a flash memory device that emulates an EEPROM. The embodiments utilize an index array, which stores an index word for each logical address in the emulated EEPROM. Each bit in each index word is associated with a physical address for a physical word in the emulated EEPROM, and the index word keeps track of which physical word is the current word for a particular logical address. The use of the index word enables a wear leveling algorithm that allows for a programming command to a logical address to result in: (i) skipping the programming operation if the data stored in the current word does not contain a “1” that corresponds to a “0” in the data to be stored, (ii) reprogramming one or more bits of the current word in certain situations, or (iii) shifting to and programming the next physical word in certain situations.

公开(公告)号：US20220013531A1

公开(公告)日：2022-01-13

申请号：US17179057

申请日：2021-02-18

Applicant: Silicon Storage Technology, Inc.

Inventor： Jeng-Wei YANG ,  Man-Tang WU ,  Boolean FAN ,  Nhan DO

IPC: H01L27/11524 ,  G11C16/04 ,  H01L29/66

Abstract: A method of forming a memory cell includes forming a first polysilicon block over an upper surface of a semiconductor substrate and having top surface and a side surface meeting at a sharp edge, forming an oxide layer with a first portion over the upper surface, a second portion directly on the side surface, and a third portion directly on the sharp edge, performing an etch that thins the oxide layer in a non-uniform manner such that the third portion is thinner than the first and second portions, performing an oxide deposition that thickens the first, second and third portions of the oxide layer, wherein after the oxide deposition, the third portion is thinner than the first and second portions, and forming a second polysilicon block having one portion directly on the first portion of the oxide layer and another portion directly on the third portion of the oxide layer.

公开(公告)号：US11205490B2

公开(公告)日：2021-12-21

申请号：US16828206

申请日：2020-03-24

Applicant: Silicon Storage Technology, Inc.

Inventor： Viktor Markov ,  Alexander Kotov

IPC: G11C16/16 ,  G11C16/26 ,  H01L27/11529 ,  H01L27/11524 ,  G11C16/28 ,  G11C29/50 ,  G11C16/34 ,  G11C29/04 ,  G11C29/44

Abstract: A memory device that includes a plurality of non-volatile memory cells and a controller. The controller is configured to erase the plurality of memory cells, program each of the memory cells, and for each of the memory cells, measure a threshold voltage applied to the memory cell corresponding to a target current through the memory cell in a first read operation, re-measure a threshold voltage applied to the memory cell corresponding to the target current through the memory cell in a second read operation, and identify the memory cell as defective if a difference between the measured threshold voltage and the re-measured threshold voltage exceeds a predetermined amount.

公开(公告)号：US11188237B2

公开(公告)日：2021-11-30

申请号：US16228313

申请日：2018-12-20

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Vipin Tiwari ,  Nhan Do

IPC: G06F3/06 ,  G11C16/28 ,  G11C7/06 ,  G11C29/48 ,  G11C29/02 ,  G11C29/18 ,  G06F11/07 ,  G11C16/04 ,  G11C16/08 ,  G11C16/10 ,  G11C16/26 ,  G11C16/34 ,  H01L21/78 ,  H01L27/11521 ,  H01L29/423 ,  G11C29/04 ,  G11C29/12 ,  G11C29/44 ,  H01L23/00

Abstract: Multiple embodiments are disclosed for enhancing security and preventing hacking of a flash memory device. The embodiments prevent malicious actors from hacking a flash memory chip to obtain data that is stored within the chip. The embodiments include the use of fault detection circuits, address scrambling, dummy arrays, password protection, improved manufacturing techniques, and other mechanisms.