GANGED SINGLE LEVEL CELL VERIFY IN A MEMORY DEVICE

    公开(公告)号:US20240379178A1

    公开(公告)日:2024-11-14

    申请号:US18780167

    申请日:2024-07-22

    Abstract: Control logic in a memory device identifies a set of memory cells in a block of a memory array, wherein the set of memory cells comprises two or more memory cells programmed during a program phase of a program operation and associated with a selected wordline of the memory array. The control logic further causes a program verify voltage to be applied to the selected wordline during a program verify phase of the program operation and performs concurrent sensing operations on the set of memory cells to determine whether each memory cell in the set of memory cells was programmed to at least the program verify voltage during the program phase of the program operation.

    Status polling based on die-generated pulsed signal

    公开(公告)号:US11972135B2

    公开(公告)日:2024-04-30

    申请号:US17590650

    申请日:2022-02-01

    CPC classification number: G06F3/0653 G06F3/0604 G06F3/0673

    Abstract: A memory system includes multiple dice having multiple planes. A processing device is coupled to the dice and performs controller operations including receiving a status indicator signal comprising a pulse that is asserted by one or more planes of the multiple dice. In response to receiving the pulse, the processing device performs at least one of: a first status check of dice operations being performed by the multiple dice at an expiration of a polling delay period; or a second status check of the dice operations in response to detecting the pulse being deasserted. The processing device terminates performances of status checks while the status indicator signal remains deasserted.

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