Abstract:
An embodiment integrated circuit comprises a memory device including at least one memory point having a volatile memory cell and a single non-volatile memory cell coupled together to a common node.
Abstract:
A method for programming a non-volatile memory (NVM) and an integrated circuit is disclosed. In an embodiment an integrated circuit includes a memory plane organized into rows and columns of memory words, each memory word comprising memory cells and each memory cell including a state transistor having a control gate and a floating gate and write circuitry configured to program a selected memory word during a programming phase by applying a first nonzero positive voltage to control gates of the state transistors of the memory cells that do not belong to the selected memory word.
Abstract:
A method of controlling a cycle for writing at least one data item to at least one memory slot of the electrically programmable and erasable read-only memory type disposed in an electronic circuit supplied by a supply voltage includes a controlled increase of the duration of the write cycle in the presence of a decrease in the supply voltage.
Abstract:
Some embodiments include a method for addressing an integrated circuit for a non-volatile memory of the EEPROM type on a bus of the I2C type. The memory includes J hardware-identification pins, with J being an integer lying between 1 and 3, which are assigned respective potentials defining an assignment code on J bits. The method includes a first mode of addressing used selectively when the assignment code is equal to a fixed reference code on J bits, and a second mode of addressing used selectively when the assignment code is different from the reference code. In the first mode, the memory plane of the non-volatile memory is addressed by a memory address contained in the last low-order bits of the slave address and in the first N bytes received. In the second mode, the memory plane is addressed by a memory address contained in the first N+1 bytes received.
Abstract:
A method of controlling a cycle for writing at least one data item to at least one memory slot of the electrically programmable and erasable read-only memory type disposed in an electronic circuit supplied by a supply voltage includes a controlled increase of the duration of the write cycle in the presence of a decrease in the supply voltage.
Abstract:
One embodiment provides a method for reading a memory cell of a memory plane of a memory of the erasable electrically-programmable ROM type. The word line and of the bit line to which the memory cell belongs are selected and the content of the cell is read via a read amplifier. One input of the read amplifier is connected to the bit line and pre-charged at a pre-charge voltage. During the read operation, a source voltage higher than the pre-charge voltage is applied to the source of the floating-gate transistor of the cell. A read current flows from the cell towards the input of the read amplifier and then flows through a programmed cell.
Abstract:
A memory device includes an input/output interface, a bus of SPI type coupled to the input/output interface, and a plurality of individual non-volatile memory devices connected to the bus of SPI type. The chip select inputs of each individual memory device are all connected to one and the same chip select wire of the SPI bus. The individual memory devices are further configured and controllable so as to behave, as seen by the input/output interface, as a single non-volatile memory device, the total memory space of which has a total memory capacity equal to the sum of the individual memory capacities of the individual devices.
Abstract:
An operation for writing at least one datum in at least one memory cell of the electrically erasable and programmable read-only memory type comprises at least one step of erasing or of programming of the cell by a corresponding erasing or programming pulse. The correct or incorrect conducting of the writing operation is checked by an analysis of the form of the erasing or programming pulse during the corresponding erasing or programming step. The result of this analysis is representative of the writing operation being conducted correctly or incorrectly.
Abstract:
An operation for writing at least one datum in at least one memory cell of the electrically erasable and programmable read-only memory type comprises at least one step of erasing or of programming of the cell by a corresponding erasing or programming pulse. The correct or incorrect conducting of the writing operation is checked by an analysis of the form of the erasing or programming pulse during the corresponding erasing or programming step. The result of this analysis is representative of the writing operation being conducted correctly or incorrectly.
Abstract:
An electronic device includes at least one processing circuit connected through at least one terminal at a first reference voltage. At least one radio frequency communication circuit is connected at least to receive the reference voltage. At least one first pad is intended to be taken to a second reference voltage of at least one electronic circuit external to the device. At least one first resistive impedance is coupled between the terminal and the first pad.