摘要:
Described are mobile phones that incorporate radiation detectors formed using commonly available semiconductor memories. The radiation detectors require little or no additional hardware over what is available in a conventional phone, and can thus be integrated with little expense or packaging modifications. The low cost supports a broad distribution of detectors. Data collected from constellations of detector-equipped mobile phones can be used to locate mislaid or stolen nuclear materials or other potentially dangerous radiation sources. Phone users can be alerted to radiation dangers in their vicinity, and aggregated phone-specific error data can serve as user-specific dosimeters.
摘要:
Described are mobile phones that incorporate radiation detectors formed using commonly available semiconductor memories. The radiation detectors require little or no additional hardware over what is available in a conventional phone, and can thus be integrated with little expense or packaging modifications. The low cost supports a broad distribution of detectors. Data collected from constellations of detector-equipped mobile phones can be used to locate mislaid or stolen nuclear materials or other potentially dangerous radiation sources. Phone users can be alerted to radiation dangers in their vicinity, and aggregated phone-specific error data can serve as user-specific dosimeters.
摘要:
A method and apparatus for testing and characterizing circuits is provided. In one embodiment, a high-speed interface of a semiconductor component includes high-speed test circuitry. The high-speed test circuitry obviates the need for an external high-speed testing system for testing and characterization. In one embodiment, the high-speed test circuitry includes a test pattern generation circuit, and various differential comparators to compare low bandwidth reference signals with interface signals during testing and characterization. In one embodiment, an interface that includes the test circuitry can test itself or another interface. In one embodiment, a timing reference signal decouples the individual parameters of two interfaces testing each other to avoid any errors introduced by the combination of individual interface circuit parameters, such as receiver parameters and transmitter parameters. The testing can be performed at the wafer stage, at the component stage, and in a system.
摘要:
A memory device includes a receiver to receive an input data signal and to create an output signal corresponding to the present received data signal and a voltage representative of a signal sampled earlier in time.
摘要:
Contactless interconnects between an integrated circuit die and an electrical structure are aligned by charging alignment pads on the integrated circuit die to a first voltage, and charging counterpart alignment pads on the electrical structure to a second voltage. The integrated circuit die is disposed in an initial position relative to the electrical structure to develop an electrostatic aligning force between the charged alignment pads and their counterparts. When the integrated circuit die and electrical structure are enabled to move relative to one another, the electrostatic aligning force shifts the relative positioning of the integrated circuit die and electrical structure toward a desired alignment.
摘要:
An input signal is transmitted from a first device to a second device. At the second device the input signal method is received, and an output signal is generated in response to the input signal. The output signal is sensed, and the input signal is dynamically terminated in response to sensing the output data. In some embodiments, the receiving, generating and dynamically terminating occur within a single integrated circuit. In some embodiments, the method includes detecting a signal voltage level of the input signal and causing a termination voltage level to change from a first voltage level to a second voltage level in response to the signal voltage level.
摘要:
Self-timed interfaces and methods are provided for interfacing different timing domains. These self-timed interfaces receive a strobe signal from a component operating under a first clock domain. A first signal path of the self-timed interface couples the strobe signal to a receiver that samples data of data line under control of the strobe signal. A second signal path of the self-timed interface couples the strobe signal to an interface circuit through a hysteresis-based element. The interface circuit, under control of an output of the hysteresis-based element along with a clock signal that originates under a second clock domain, generates an interface enable signal for use in controlling data transfers between the different clock domains.
摘要:
A current controller for a multi-level current mode driver. The current controller includes a multi-level voltage reference and at least one source calibration signal. A comparator is coupled by a coupling network to the multi-level voltage reference and the at least one source calibration signal. A selected voltage is applied from the multi-level voltage reference and a selected source calibration signal is applied from the at least one source calibration signal to the comparator.
摘要:
A card assembly (20) having multiple layers for matching an article to a vehicle. The card assembly (20) includes a liner (28) having a first adhesive (36) and a first layer (40) along with a second adhesive (38) and a second layer (42). A scoreline (26, 50) extends through the first layer (40), first adhesive (36), and liner (28) to define a tag portion (24, 52) of the card assembly. The tag portion (24, 52) may be removed from the second adhesive (38) to expose a portion of the second adhesive (38), which defines an attachment area (48, 54) of a card portion (22). The card portion (22) may be adhered to a vehicle surface, such as the interior of a window, by the attachment area (48, 54). The removed tag portion (24, 52) may be attached to an article, such as a key set, for matching the article to the vehicle.
摘要:
Described are on-die termination (ODT) systems and methods that facilitate high-speed communication between a transmitter die and a receiver die interconnected via one or more signal transmission lines. An ODT control system in accordance with one embodiment calibrates and maintains the termination resistances for the signal transmission lines. The ODT control system derives a number of calibration currents from precision voltage and resistance references and distributes the reference currents to a number of transmitters. Each transmitter then derives an ODT calibration signal using the respective reference current and another precision resistor, and then employs the calibration signal to calibrate local termination elements. Distributing calibrated currents provides excellent noise immunity, while limiting the requisite number of external voltage references reduces cost.