Abstract:
A device under test has a connection interface, a controller, and a functional block. The connection interface is used to receive a test pattern transmitted at a first clock rate and output a functional test result. The controller is used to sample the test pattern by using a second clock rate and accordingly generate a sampled test pattern, wherein the second clock rate is higher than the first clock rate. The functional block is used to perform a designated function upon the sampled test pattern and accordingly generate the functional test result.
Abstract:
A method for managing data stored in a flash memory is provided, where the flash memory includes a plurality of blocks. The method includes: providing a program list, where the program list records information about programmed blocks of the plurality of blocks and sequence of write times of the programmed blocks; detecting quality of a first block of the plurality of blocks to generate a detecting result, where the first block is the programmed block that has an earliest write time; and determining whether to move contents of the first block to a blank block, and to delete the contents of the first block according to the detecting result.
Abstract:
A method for reading data stored in a flash memory includes at least the following steps: controlling the flash memory to perform a plurality of read operations upon a plurality of memory cells included in the flash memory; obtaining a plurality of bit sequences read from the memory cells, respectively, wherein the read operations read bits of a predetermined bit order from the memory cells by utilizing different control gate voltage settings; and determining readout information of the memory cells according to binary digit distribution characteristics of the bit sequences.
Abstract:
The invention provides a flash memory apparatus. In one embodiment, the flash memory apparatus comprises a flash memory and a flash memory controller. The flash memory comprises a write circuit and a memory cell array comprising a plurality of memory cells, wherein the write circuit is coupled to the memory cell array to write data in the memory cells. The flash memory controller is coupled to the write circuit, obtains a total capacity and a used data amount of the flash memory, and directs the write circuit to perform data writing in a one-bit mode when a ratio of the user data amount to the total capacity is less than a first predetermined value.
Abstract:
A flash memory controller, to be coupled between a host device and a flash memory module, includes an error correction code (ECC) circuit. The ECC circuit performs a wordline-dimensional ECC operation upon specific data, sent from the host device to form a super block stored within the flash memory module, to generate wordline-dimensional parity data and performs a finger-dimensional ECC operation upon the specific data generate finger-dimensional parity data. The ECC circuit corrects an error of the superblock by using the wordline-dimensional parity data and the finger-dimensional parity data so as to obtain correct data content of the specific data.
Abstract:
A data programming method for a flash memory includes: writing a write data to a page buffer of the flash memory; encoding the write data to generate first parity data corresponding to the write data, and writing the first parity data to the page buffer; while generating the first parity data, performing an error detection based on the write data and the first parity data to produce an error detection result; and when the error detection result indicates that there is no error in the first parity data, issuing a program command to the flash memory to program the write data and the first parity data in the page buffer into a flash memory element of the flash memory.
Abstract:
A method for reading data stored in a flash memory includes at least the following steps: controlling the flash memory to perform a plurality of read operations upon a plurality of memory cells included in the flash memory; obtaining a plurality of bit sequences read from the memory cells, respectively, wherein the read operations read bits of a predetermined bit order from the memory cells by utilizing different control gate voltage settings; and determining readout information of the memory cells according to binary digit distribution characteristics of the bit sequences.
Abstract:
The present invention provides a control method of the memory device. In the operation of the memory device, the soft information is compressed by a control circuit within the flash memory module, so that the second readout information including the compressed soft information transmitted by the flash memory module has much smaller data size. Therefore, the performance of the memory interface will not be affected due to the bandwidth occupied by the soft information transmission.
Abstract:
A flash memory storage management method includes: providing a flash memory module including single-level-cell (SLC) blocks and at least one multiple-level-cell block such as MLC block, TLC block, or QLC block; classifying data to be programmed into groups of data; respectively executing SLC programing and RAID-like error code encoding to generate corresponding parity check codes, to program the groups of data and corresponding parity check codes to the SLC blocks; when completing program of the SLC blocks, performing an internal copy to program the at least one multiple-level-cell block by sequentially reading and writing the groups of data and corresponding parity check codes from the SLC blocks to the multiple-level-cell block according to a storage order of the SLC blocks.
Abstract:
A method for performing data retention management of a memory device with aid of pre-shutdown control and associated apparatus are provided. The method may include: receiving a predetermined host command from a host device; in response to the predetermined host command, performing a re-programming procedure on the NV memory, for enhancing data storage reliability of the memory device, for example, reading stored data from at least one source location within the at least one NV memory element to prepare re-programming data according to the stored data, and programming the re-programming data into at least one destination location within the at least one NV memory element to be replacement of the stored data; and in response to the re-programming procedure being completed, sending completion information of the predetermined host command to the host device, to allow the host device to trigger the shutdown of the memory device.