Abstract:
In a method of manufacturing a dielectric structure, after a first dielectric layer is formed on a substrate by using a metal oxide doped with silicon, the substrate is placed on a susceptor of a chamber. By treating the first dielectric layer with a plasma in controlling a voltage difference between the susceptor and a ground, a second dielectric layer is formed on the first dielectric layer. The second dielectric layer including a metal oxynitride doped with silicon having enough content of nitrogen is formed on the first dielectric layer. Therefore, dielectric properties of the dielectric structure comprising the first and the second dielectric layers can be improved and a leakage current can be greatly decreased. By adapting the dielectric structure to a gate insulation layer and/or to a dielectric layer of a capacitor or of a non-volatile semiconductor memory device, capacitances and electrical properties can be improved.
Abstract:
Disclosed is a broadband reflection type brightness enhancement polarizer, which includes a cholesteric liquid crystal film laminate having a broadband selective reflecting wavelength range in which a plurality of cholesteric liquid crystal films having selective reflecting wavelength ranges different from each other by having different mixture ratios of a curable nematic liquid crystal compound expressed by the chemical formula 1 and a curable chiral compound expressed by the chemical formula 2 are laminated; and a film having ¼λ phase difference laminated on one surface of the cholesteric liquid crystal film laminate. This polarizer has wide selective reflecting wavelength ranges of the cholesteric liquid crystal films composing the polarizer, so the entire visible ray range can be covered just by laminating several cholesteric liquid crystal films. Accordingly, the polarizer may be manufactured relatively thinner, so the brightness can be greatly improved when the polarizer is applied to a liquid crystal display.
Abstract:
The present invention relates to a method of manufacturing a reflective polarizing film for a liquid crystal display device in which cholesteric liquid crystal layers having different selective light-reflecting wavelengths are laminated in the laminated coating method, thus a forming liquid crystal film that covers a visible light region and ¼λ retardation film are attached to the liquid crystal film. In this case, two or more cholestric liquid crystal layers having different selective light-reflecting wavelengths are laminated in order from the shorter wavelength to the longer wavelength in the laminated coating method. Further, during the lamination, orientation layers are laminated between the liquid crystal layers to maximize the selective reflection characteristic of the cholesteric liquid crystal.
Abstract:
Disclosed are methods of forming dielectric materials using atomic layer deposition (ALD) and methods of forming dielectric layers from such materials on a semiconductor device. The ALD process utilizes a first reactant containing at least one alkoxide group that is chemisorbed onto a surface of a substrate and then reacted with an activated oxidant that contains no hydroxyl group to form a dielectric material exhibiting excellent step coverage and improved leakage current characteristics.
Abstract:
Methods of forming a storage capacitor include forming an interlayer insulation layer having an opening there through on a semiconductor substrate, forming a contact plug in the opening, forming a molding oxide layer on the interlayer insulation layer and the contact plug, selectively removing portions of the molding oxide layer to form a recess above the contact plug, forming a titanium layer on a bottom surface and side surfaces of the recess, forming a titanium nitride layer on the titanium layer, and forming a titanium oxide nitride layer on the titanium nitride layer. A storage capacitor includes a semiconductor substrate, an interlayer insulation layer having a contact plug therein on the substrate, and a storage electrode on the contact plug including a titanium silicide layer, a titanium nitride layer on the titanium silicide layer, and a titanium oxide nitride layer on the titanium nitride layer.
Abstract:
The present invention is related to a method of method of manufacture of a reflective polarizing film that can improve brightness of a liquid crystal display device remarkably by making a liquid crystal film that can cover visible light by using cholesteric liquid crystal layers having different selective light-reflection central wavelengths, attaching a quarter wave (¼ λ) retardation film on top of the liquid crystal film, and adding prism patterns to the opposite side of the liquid crystal film. The reflective polarizing film of the present invention is characterized by that two or more cholesteric liquid crystal layers having different selective reflection wavelength regions are laminated in order from a shorter wavelength to a longer wavelength, and brightness of a liquid crystal display device is maximized owing to an integrated film manufactured by attaching a ¼ λ retardation film onto cholesteric liquid crystal layers and forming prism patterns onto the opposite side.
Abstract:
Integrated circuit devices, for example, dynamic random access memory (DRAM) devices, are provided including an integrated circuit substrate having a cell array region and a peripheral circuit region. A buried contact plug is provided on the integrated circuit substrate in the cell array region and a resistor is provided on the integrated circuit substrate in the peripheral circuit region. A first pad contact plug is provided on the buried contact plug in the cell array region and a second pad contact plug is provided on the resistor in the peripheral circuit region. An ohmic layer is provided between the first pad contact plug and the buried contact plug and between the second pad contact plug and the resistor. Related methods of fabricating integrated circuit devices are also provided.
Abstract:
Disclosed is a clip ribbon and apparatus for splicing surface mount device carrier tapes. The clip ribbon has a plurality of clips used for splicing carrier tapes are connected to one another in a line. The apparatus for splicing device carrier tapes has a tool for splicing the carrier tapes with a clip supplied from a roll of the clip ribbon. The tool is fixed to a frame to improve the speed and accuracy of the splicing process.
Abstract:
Methods of forming a zirconium hafnium oxide thin layer on a semiconductor substrate by supplying tetrakis(ethylmethylamino)zirconium ([Zr{N(C2H5)(CH3)}4], TEMAZ) and tetrakis(ethylmethylamino)hafnium ([Hf{N(C2H5)(CH3)}4], TEMAH) to a substrate are provided. The TEMAZ and the TEMAH may be reacted with an oxidizing agent. The thin layer including zirconium hafnium oxide may be used for a gate insulation layer in a gate structure, a dielectric layer in a capacitor, or a dielectric layer in a flash memory device.
Abstract translation:在半导体衬底上形成锆氧化铪薄层的方法是将四(乙基甲基氨基)锆([Zr(N 2 H 5 H 5) 3(H 2 O)2,H 2 O 3(H 2 O 3)3,TEMAZ)和四(乙基甲基氨基)铪([Hf(N(C 2 H 5) (CH 3 3)} 4 S,TEMAH)提供给基板。 TEMAZ和TEMAH可与氧化剂反应。 包括氧化铪的薄层可以用于栅极结构中的栅极绝缘层,电容器中的电介质层或闪存器件中的介电层。
Abstract:
A method of manufacturing a semiconductor device can include forming a tunnel oxide layer on a substrate, forming a floating gate on the tunnel oxide layer and forming a dielectric layer pattern on the floating gate using an ALD process. The dielectric layer pattern can include a metal precursor that includes zirconium and an oxidant. A control gate can be formed on the dielectric layer pattern. The semiconductor device can include the dielectric layer pattern provided herein.