Pattern forming method, semiconductor device manufacturing method and phase shift photomask having dummy gate patterns
    41.
    发明申请
    Pattern forming method, semiconductor device manufacturing method and phase shift photomask having dummy gate patterns 有权
    图案形成方法,半导体器件制造方法和具有虚拟栅极图案的相移光掩模

    公开(公告)号:US20060210889A1

    公开(公告)日:2006-09-21

    申请号:US11374009

    申请日:2006-03-14

    申请人: Masashi Fujimoto

    发明人: Masashi Fujimoto

    IPC分类号: G03C5/00 G03F1/00

    CPC分类号: G03F1/70 G03F1/26

    摘要: In a method for forming a plurality of gate patterns in parallel with each other on a photoresist layer within one circuit block, at least one dummy gate pattern is formed in parallel with the gate patterns when a pitch between said gate patterns is larger than a predetermined maximum pitch, so that pitches between the gate patterns including the dummy gate pattern are smaller than the predetermined maximum pitch. Then, a photolithography process is performed upon the photoresist layer by using a phase shift photomask having first and second openings whose difference in phase is π. The first and second openings alternate between the gate patterns including the dummy gate pattern to form phase edges therein.

    摘要翻译: 在一个电路块内的光致抗蚀剂层上形成彼此平行的多个栅极图案的方法中,当所述栅极图案之间的间距大于预定的栅极图案时,形成与栅极图案平行的至少一个伪栅极图案 使得包括伪栅极图案的栅极图案之间的间距小于预定的最大间距。 然后,通过使用具有相位差为π的第一和第二开口的相移光掩模在光致抗蚀剂层上进行光刻工艺。 第一和第二开口在包括伪栅极图案的栅极图案之间交替,以在其中形成相位边缘。

    Pattern formation method
    42.
    发明授权
    Pattern formation method 有权
    图案形成方法

    公开(公告)号:US06812155B2

    公开(公告)日:2004-11-02

    申请号:US10342796

    申请日:2003-01-15

    申请人: Masashi Fujimoto

    发明人: Masashi Fujimoto

    IPC分类号: H01L21302

    摘要: A pattern formation method of the present invention is one that forms a circuit pattern in a resist film upon a wafer 141 by exposure using a plurality of phase-shift masks. A first phase-shift mask is for an isolated pattern including a pattern with a distance between adjacent patterns (inter-pattern distance) W1 of at least 400 nm, and a second phase-shift mask is for a dense pattern including patterns with inter-pattern distances W2 under 400 nm. Affects of the optical proximity effect are eliminated through providing optimum exposure conditions for the distances between adjacent patterns W1 and W2 using the plurality of phase-shift masks in accordance with respective inter-pattern distances W1 and W2.

    摘要翻译: 本发明的图案形成方法是通过使用多个相移掩模的曝光在晶片141上形成抗蚀剂膜中的电路图案的图案形成方法。 第一相移掩模用于包括具有至少400nm的相邻图案(图案间距离)W1之间的距离的图案的隔离图案,并且第二相移掩模用于包括具有间隔图案的图案的致密图案, 400nm以下的图案距离W2。 通过使用根据各图案间距离W1和W2的多个相移掩模,为相邻图案W1和W2之间的距离提供最佳曝光条件来消除光学邻近效应的影响。

    Mask set for use in phase shift photolithography technique which is suitable to form random patterns
    43.
    发明授权
    Mask set for use in phase shift photolithography technique which is suitable to form random patterns 有权
    适用于形成随机图案的相移光刻技术中使用的掩模

    公开(公告)号:US06699626B2

    公开(公告)日:2004-03-02

    申请号:US10315096

    申请日:2002-12-10

    申请人: Masashi Fujimoto

    发明人: Masashi Fujimoto

    IPC分类号: G03F900

    摘要: A mask set has a first mask including a shielding region shielding a first pattern-defining light; a second mask including a phase-shifting region having a phase shifter edge and a non-phase-shifting region adjacent to the phase-shifting region on the phase shifter edge. A first phase of the first light portion passing through the phase-shifting region differs from a second phase of the second light portion. The first and second masks are aligned such that the phase shifter edge overlaps on the shielding region.

    摘要翻译: 掩模组具有包括屏蔽第一图案限定光的屏蔽区域的第一掩模; 第二掩模,包括具有移相器边缘的相移区域和与移相器边缘上的相移区域相邻的非相移区域。 穿过相移区域的第一光部分的第一相位与第二光部分的第二相位不同。 对准第一和第二掩模,使得移相器边缘与屏蔽区域重叠。

    Mask set for use in phase shift photolithography technique which is suitable to form random patterns, and method of exposure process using the same
    44.
    发明授权
    Mask set for use in phase shift photolithography technique which is suitable to form random patterns, and method of exposure process using the same 有权
    适用于形成随机图案的相移光刻技术中使用的掩模组,以及使用其的曝光处理方法

    公开(公告)号:US06517982B2

    公开(公告)日:2003-02-11

    申请号:US09741375

    申请日:2000-12-21

    申请人: Masashi Fujimoto

    发明人: Masashi Fujimoto

    IPC分类号: G03C500

    摘要: A method of forming a photoresist pattern by a photolithography technique is composed of: providing a photoresist layer; exposing the photoresist layer to a first pattern-defining light using a first mask; and exposing the photoresist layer to a second pattern-defining light using a second mask. The first mask includes a shielding region shielding the first pattern-defining light. The second mask includes a phase-shifting region having a phase shifter edge and a non-phase-shifting region adjacent to the phase-shifting region on the phase shifter edge. A first light portion of the second pattern-defining light passes through the phase-shifting region. A second light portion of the second pattern-defining light passes through the non-phase-shifting region. A first phase of the first light portion differs from a second phase of the second light portion. The first and second masks are aligned such that the phase shifter edge overlaps on the shielding region.

    摘要翻译: 通过光刻技术形成光致抗蚀剂图案的方法包括:提供光致抗蚀剂层;使用第一掩模将光致抗蚀剂层暴露于第一图案限定光; 以及使用第二掩模将所述光致抗蚀剂层附着到第二图案限定光。 第一掩模包括屏蔽第一图案限定光的屏蔽区域。 第二掩模包括具有移相器边缘的移相区域和与移相器边缘上的相移区域相邻的非相移区域。 第二图案限定光的第一光部分通过相移区域。 第二图案限定光的第二光部分穿过非相移区域。 第一光部的第一相与第二光部的第二相不同。 对准第一和第二掩模,使得移相器边缘与屏蔽区域重叠。

    Apparatus for providing levelling and focusing adjustments on a semiconductor wafer
    45.
    发明授权
    Apparatus for providing levelling and focusing adjustments on a semiconductor wafer 失效
    用于在半导体晶片上提供调平和聚焦调节的装置

    公开(公告)号:US06449029B1

    公开(公告)日:2002-09-10

    申请号:US09604589

    申请日:2000-06-27

    申请人: Masashi Fujimoto

    发明人: Masashi Fujimoto

    IPC分类号: G03B2742

    摘要: For a photolithography apparatus, an adjustment method is provided which comprises first and second processes. In the first process, a semiconductor wafer is successively set in one of cell positions. In each of the cell positions, a laser beam is directed to the surface of the wafer and light reflecting off the wafer surface is detected and analyzed to determine a vertical offset position of the wafer at each cell position. Data representing the vertical offset position is stored in a memory and the first process is repeated until the offset position data are derived from all cell positions. In the second process, tilt angles of the wafer at all cell positions are determined from the stored offset position data, and angle data representing the determined tilt angles are stored in a memory. The wafer is then set in one of the cell positions, and the angle data is read from the memory corresponding to the set cell position and the wafer surface is horizontally aligned. The offset position data is read from the memory corresponding to the set cell position and the wafer surface is vertically moved to the focal point. The second process is repeated until the wafer is set to all cell positions.

    摘要翻译: 对于光刻设备,提供了包括第一和第二处理的调整方法。 在第一工序中,将半导体晶片依次设置在单元位置之一中。 在每个单元位置中,激光束被引导到晶片的表面,并且检测和分析从晶片表面反射的光,以确定晶片在每个单元位置处的垂直偏移位置。 表示垂直偏移位置的数据被存储在存储器中,并且重复第一处理直到偏移位置数据从所有单元位置导出。 在第二过程中,从所存储的偏移位置数据确定所有单元位置处的晶片的倾斜角度,并且将表示确定的倾斜角度的角度数据存储在存储器中。 然后将晶片设置在单元位置中的一个位置,并且从对应于设置单元位置的存储器读取角度数据,并且晶片表面水平对准。 从对应于设定单元位置的存储器读取偏移位置数据,并且晶片表面垂直移动到焦点。 重复第二个过程,直到将晶片设置为所有单元位置。

    Retractable vehicle seat
    47.
    发明授权
    Retractable vehicle seat 有权
    伸缩式车座

    公开(公告)号:US08708392B2

    公开(公告)日:2014-04-29

    申请号:US13582155

    申请日:2011-02-23

    IPC分类号: B60N2/30

    摘要: A retractable vehicle seat in which a seat main body disposed on a vehicle floor is flipped up laterally, so as to be retracted in a vehicle interior side wall of which the upper portion is inwardly inclined, may include a connection mechanism that is configured to rotatably connect the seat main body to a support stand. The connection mechanism includes a four-link mechanism having a stationary link integral with the support stand, an intermediate link integral with the seat main body, and a first link and a second link that connect these two links. The second link is configured to increase an angle between the first link and the intermediate link as the seat main body is flipped up.

    摘要翻译: 一种可伸缩的车辆座椅,其中设置在车辆地板上的座椅主体侧向地翻转,以便在其上部向内倾斜的车辆内侧壁中缩回,可以包括连接机构,该连接机构构造成可旋转 将座椅主体连接到支撑架上。 连接机构包括具有与支撑架一体的固定连杆的四连杆机构,与座椅主体一体的中间连杆,以及连接这两个连杆的第一连杆和第二连杆。 第二连杆构造成当座椅主体翻转时增加第一连杆和中间连杆之间的角度。

    RETRACTABLE VEHICLE SEAT
    48.
    发明申请
    RETRACTABLE VEHICLE SEAT 有权
    可收回的车辆座椅

    公开(公告)号:US20130057040A1

    公开(公告)日:2013-03-07

    申请号:US13582155

    申请日:2011-02-23

    IPC分类号: B60N2/30

    摘要: A retractable vehicle seat in which a seat main body disposed on a vehicle floor is flipped up laterally, so as to be retracted in a vehicle interior side wall of which the upper portion is inwardly inclined, may include a connection mechanism that is configured to rotatably connect the seat main body to a support stand. The connection mechanism includes a four-link mechanism having a stationary link integral with the support stand, an intermediate link integral with the seat main body, and a first link and a second link that connect these two links. The second link is configured to increase an angle between the first link and the intermediate link as the seat main body is flipped up.

    摘要翻译: 一种可伸缩的车辆座椅,其中设置在车辆地板上的座椅主体侧向地翻转,以便在其上部向内倾斜的车辆内侧壁中缩回,可以包括连接机构,该连接机构构造成可旋转 将座椅主体连接到支撑架上。 连接机构包括具有与支撑架一体的固定连杆的四连杆机构,与座椅主体一体的中间连杆,以及连接这两个连杆的第一连杆和第二连杆。 第二连杆构造成当座椅主体翻转时增加第一连杆和中间连杆之间的角度。

    Method of designing a pattern
    50.
    发明授权
    Method of designing a pattern 有权
    设计图案的方法

    公开(公告)号:US07870514B2

    公开(公告)日:2011-01-11

    申请号:US11867841

    申请日:2007-10-05

    申请人: Masashi Fujimoto

    发明人: Masashi Fujimoto

    IPC分类号: G06F17/50

    摘要: A method of designing a pattern of a hole pattern having a configuration, in which grid of interval smaller than a minimum permissible pitch according to a design rule for a semiconductor integrated circuit is provided in a pattern drawing, a hole pattern is arranged on a first lattice point which is an intersection of the grid, and, at the same time, other hole patterns are not arranged on a second lattice point group which is on the periphery of the first lattice point, and is adjacent to the first lattice point is provided. And, the number of hole patterns, which may be arranged in a third lattice point group of a plurality of lattice points which are on the periphery of a second lattice point group and are within a predetermined distance from the first lattice point, is controlled.

    摘要翻译: 在图案图形中设置具有根据半导体集成电路的设计规则的具有小于最小允许间距的间隔格栅的孔图案的图案的方法,孔图案布置在第一 作为栅格的交叉点的网格点,并且同时,在第一格子点的周围并且与第一格子点相邻的第二格子点组上不设置其他孔图案 。 并且,控制可以布置在位于第二格子点组的周边并且距离第一格子点的预定距离内的多个格子点的第三格子点组中的孔图案的数量。