摘要:
An operational margin of a memory of a semiconductor integrated circuit device including an SRAM is improved. In order to set the Vth of driving MISFETs Qd, transfer MISFETs Qt and MISFETs for load resistance QL forming memory cells of an SRAM, relatively and intentionally higher than the Vth of predetermined MISFETs of SRAM peripheral circuits and logic circuits such as microprocessor, an impurity introduction step is introduced to set the Vth of the driving MISFETs Qd, transfer MISFETs Qt and MISFETs for load resistance, separately from an impurity introduction step for setting the Vth of the predetermined MISFETs.
摘要:
A data processor in which a speed of an address translating operation is raised is disclosed. A translation lookaside buffer is divided into a buffer for data and a buffer for instruction, address translation information for instruction is also stored into a translation lookaside buffer for data, and when a translation miss occurs in a translation lookaside buffer for instruction, new address translation information is fetched from the translation lookaside buffer for data. A high speed of the address translating operation can be realized as compared with that in case of obtaining address translation information from an external address translation table each time a translation miss occurs in the translation lookaside buffer for instruction.
摘要:
An operational margin of a memory of a semiconductor integrated circuit device including an SRAM is improved. In order to set the Vth of driving MISFETs Qd, transfer MISFETs Qt and MISFETs for load resistance QL forming memory cells of an SRAM, relatively and intentionally higher than the Vth of predetermined MISFETs of SRAM peripheral circuits and logic circuits, such as a microprocessor, an impurity introduction step is introduced to set the Vth of the driving MISFETs Qd, transfer MISFETs Qt and MISFETs for load resistance, separately from an impurity introduction step for setting the Vth of the predetermined MISFETs.
摘要:
A logic test having less over-head for testing a logic circuit in a chip is implemented by constituting a test circuit in the chip without introducing a novel device process of FPGA. A memory of a self-configuration type is provided in the chip and a test circuit is constituted in the memory of a self-configuration type or an ordinary memory through a tester HDL, thereby testing other memories and logic circuits in the chip. The test circuit is reconstituted such that the memory used in the structure of the test circuit can be operated as an ordinary memory.
摘要:
A data processor for executing instructions using operand data stored in a main memory includes an instruction control unit having a first associative memory storing instructions read out from the main memory. The data processor also includes an instruction controller reading out an instruction from the first associative memory when the instruction is present in the first associative memory and reading an instruction from the main memory when the instruction is not present in the first associative memory. The controller also has as an output instruction to be executed. An instruction execution unit has a second associative memory storing operand data read out from the main memory. An instruction executioner executes the instruction by using operand data read out from the second associative memory when the operand data is present in the second associative memory and from the main memory when the operand data is not present in the second associative memory.
摘要:
A data processor is used with a main memory that stores operand data and instructions. The data processor itself includes two cache memories, one of which stores logical instruction addresses and corresponding instructions while the other stores logical operand addresses and corresponding operand data. A selector chooses whether a logical operand address or logical instruction address should access the respective cache memory or the main memory to obtain an instruction or operand data. Furthermore, the processor includes the capability of invalidating all of the data in either the instruction cache memory or operand cache memory based on a software instruction signal received at a purge unit.
摘要:
Herein disclosed is a method of controlling a microprocessor in accordance with the present invention characterized in that, when the microprocessor for executing a microprogram in accordance with clock cycles .PHI..sub.1 and .PHI..sub.2 receives a command (i.e., STOP signal) for stopping a normal operation from the outside, a freezing signal (i.e., FRZ signal) synchronizing with the clock cycles is generated to bring the operation being executed into a stopped state.
摘要:
In a memory device having a content addressable memory array and a random access memory array, the word coincidence lines and word selection lines of the content addressable memory array are connected to the word selection lines of the corresponding words of the random access memory array via a selection circuit, access is made to the random access memory array on the basis of the result of association of the content addressable memory array when the selection circuit selects the word coincidence lines, and access is made to the memory device as a whole as a random access memory array when the selection circuit selects the word selection lines.
摘要:
The feature of the present invention consists in: a processor main circuit for executing program instruction strings on a processor chip; a substrate bias switching unit for switching voltages of substrate biases applied to a substrate of the processor main circuit; and an operation mode control unit for controlling, in response to the execution of an instruction to proceed to a stand-by mode in the processor main circuit, the substrate bias switching unit in such a way that the biases are switched over to voltages for the stand-by mode, and for controlling, in response to an interruption of the stand-by release from the outside, the substrate bias switching unit in such a way that the biases are switched over to voltages for a normal mode, and also for releasing, after the bias voltages switched thereto have been stabilized, the stand-by of the processor main circuit to restart the operation.
摘要:
The feature of the present invention consists in: a processor main circuit for executing program instruction strings on a processor chip; a substrate bias switching unit for switching voltages of substrate biases applied to a substrate of the processor main circuit; and an operation mode control unit for controlling, in response to the execution of an instruction to proceed to a stand-by mode in the processor main circuit, the substrate bias switching unit in such a way that the biases are switched over to voltages for the stand-by mode, and for controlling, in response to an interruption of the stand-by release from the outside, the substrate bias switching unit in such a way that the biases are switched over to voltages for a normal mode, and also for releasing, after the bias voltages switched thereto have been stabilized, the stand-by of the processor main circuit to restart the operation.