METHOD FOR TRANSFERRING A CONTROL SIGNAL BETWEEN A FIRST DIGITAL DOMAIN AND A SECOND DIGITAL DOMAIN, AND CORRESPONDING SYSTEM-ON-A-CHIP

    公开(公告)号:US20240178823A1

    公开(公告)日:2024-05-30

    申请号:US18516660

    申请日:2023-11-21

    CPC classification number: H03K5/05

    Abstract: A system-on-a-chip includes a first digital domain and a second digital domain. An interface circuit includes a level-shifting circuit for converting a signal between the first digital domain and the second digital domain. The first digital domain includes a control circuit configured to generate a control signal for transmission to the second digital domain. The control signal includes a pulse having a nominal duration adapted to the level-shifting circuit. At the input of the level-shifting circuit, the interface circuit includes, in the first domain, a conditional pulse-stretching circuit that lengthens a duration of the pulse of the control signal to at least the nominal duration when a duration of the pulse of the control signal is shorter than the nominal duration and non-zero.

    HOST-DEVICE INTERFACE FOR DEBUG AUTHENTICATION
    535.
    发明公开

    公开(公告)号:US20240176864A1

    公开(公告)日:2024-05-30

    申请号:US18521480

    申请日:2023-11-28

    CPC classification number: G06F21/44

    Abstract: An electronic device includes a debug port providing a communications interface for debugging purposes, a plurality of processing unit access ports, an authentication interface circuit configured to authenticate the external device, and a further access port coupled between the debug port and the authentication interface circuit. The further access port is configured to be in an open state in which communications are relayed between the debug port and the authentication interface circuit. The authentication interface circuit has registers including a status register capable of being read by the external device via the debug port and the further access port, the status register being configured to store an indication of the open or closed state of each of the processing unit access ports.

    Phase-independent testing of a converter

    公开(公告)号:US11933861B2

    公开(公告)日:2024-03-19

    申请号:US17860959

    申请日:2022-07-08

    CPC classification number: G01R31/40

    Abstract: A method and apparatus for performing an on-system built-in self-test of a converter are provided. In the method, a controller generates a test signal and outputs the test signal to the converter. The controller receives a response signal from the converter and determines a plurality of bin powers of a plurality of bins, respectively, of a frequency domain signal representative of the response signal. The controller determines a figure of merit for the converter based on a first bin power of a first bin of the plurality of bin powers, where the first bin corresponds to a frequency of the test signal.

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