摘要:
Disclosed is a method for forming a die-attach layer during semiconductor packaging processes. A chip carrier includes a substrate core and a stiffener. Top surface of the substrate core includes a plurality of die-attaching units and a peripheral area enclosed by the stiffener. A non-planar printing stencil is also provided. When the non-planar printing stencil is pressed against the chip carrier, the non-planar printing stencil is compliantly in contact with the substrate core and the stiffener and a plurality of printing openings of the non-planar printing stencil exposes the substrate core within the die-attaching units. During stencil printing, die-attach material fills in the printing openings to directly adhere to the substrate core. Therefore, the warpage of the substrate core is restrained to avoid bleeding of die-attach material so that die-attach materials can be formed as a die-attach layer with a uniform thickness on core-exposed chip carrier with lower costs. Additionally, the chip carrier will not be deformed during semiconductor packaging processes.
摘要:
A semiconductor device having linear zigzag(s) for wire bonding is revealed, primarily comprising a chip, a plurality of leads made of a lead frame and a plurality of bonding wires electrically connecting the chip and the leads. At least one of the leads has a linear zigzag including a first finger and a second finger connected each other in a zigzag form. One end of one of the bonding wire is bonded to a bonding pad on the chip and the other end is selectively bonded to either the first finger or the second finger but not both in a manner that the wire-bonding direction of the bonding wire is parallel to or in a sharp angle with the direction of the connected fingers for easy wire bonding processes. Therefore, the semiconductor device can assemble chips with diverse dimensions or with diverse bonding pads layouts by flexible wire-bonding angles at linear zigzag to avoid electrical short between the adjacent leads.
摘要:
A LOC leadframe-based semiconductor package includes a chip with multiple rows of bonding pads. At least a bus bar is attached to the chip and is disposed between a first row of bonding pads and the fingers of the leads. A plurality of bonding wires electrically connect the first row of bonding pads to the fingers of the leads. The portion of the bus bar attached to the active surface of the chip includes a bent section bent away from the fingers. A long bonding wire electrically connects one of a second row of bonding pads to one of the fingers of the leads by overpassing the bent section. Therefore, the distance between the long bonding wire and the bus bar is increased to avoid electrical short between the long bonding wire and the bus bar and to enhance the quality of electrical connections of the LOC semiconductor package.
摘要:
A memory module for improving impact resistance mainly comprises a multi-layer PWB (Printed Wiring Board) and a plurality of memory packages. The multi-layer PWB is rectangular and has two longer sides and two shorter sides, wherein a plurality of gold fingers are disposed along one of the longer sides, at least an arc notch and a plurality of first stress-absorbing slots are formed at the two shorter sides respectively. Preferably, plural second stress-absorbing slots are formed at another longer side far away from the gold fingers. The impact stress due to accidental drop may be absorbed by the first stress-absorbing slots or/and the second stress-absorbing slots to prevent the product from damaging.
摘要:
A wiring substrate with tensile-strength enhanced traces primarily comprises a core layer, a plurality of connecting pads, a plurality of traces, and a solder resist where the connecting pads and the traces are disposed on a top of the core layer. The solder resist is formed over the top of the core layer to cover the traces with the connecting pads partially or completely exposed. Furthermore, the traces have I-shaped cross sections to enhance the tensile strength of the traces.
摘要:
A substrate panel primarily comprises a plurality of substrate strips arranged in an array, one or more current input lines, a plurality of cascaded lines connecting between the substrate strips, and a current input buffer gate. Current input lines connect a current input side of the substrate panel to the adjacent substrate strips. The current input buffer gate has a frame around the substrate strips and a plurality of meshes where the frame intersects with the current input lines and the meshes intersect with the cascaded lines with both ends of the meshes connecting to the frame. Therefore, the current can be evenly distributed to each substrate strip during plating processes to improve the issues of different plating thicknesses and different plating roughness caused by different current densities and to protect the internal circuits inside the substrate strips from the damages due to current surges and unstable voltages.
摘要:
A substrate strip for semiconductor packages to slow the crack growth, primarily comprises a molding area and two side rails. The molding area includes a plurality of packaging units. The side rails are located outside the molding area and include two opposing longer sides of the substrate strip. A metal mesh is disposed on the side rails. The metal mesh consists of a plurality of crisscrossed wires having a plurality of isolated wire terminals at one edge of the metal mesh. Accordingly, crack growth is slowed by the specific metal mesh without damaging the packaging units. In one embodiment, the metal mesh is without boundary wires connecting to the isolated wire terminals to enhance the resistance to crack growth.
摘要:
A LOC semiconductor package with the leadframe for the package is revealed. The LOC semiconductor package primarily comprises a plurality of leadframe's leads, at least a tie bar, a chip, and an encapsulant encapsulating the components mentioned above. Each lead has a bonding finger. The tie bar has a dummy finger where the dummy finger is linearly disposed at one side of the disposition area of the bonding fingers. The chip has an active surface with the bonding fingers. When the dummy finger and the bonding fingers are disposed above the active surface by a die-attaching layer, the dummy finger is adjacent to one edge of the active surface. The bonding fingers are electrically connected with the bonding pads. The dummy finger will bear the concentrated stresses to avoid the bonding fingers on the active surface to delamination or break due to external stresses and to avoid the interference to the layout of the leads.
摘要:
A method for forming an isolated inner lead from a leadframe is revealed. The leadframe primarily comprises a plurality of leads, the isolated inner lead, and an external lead. Each lead has an inner portion having a finger. The isolated inner lead having two fingers is completely formed inside a molding area and is made of the same metal leadframe as the leads. One finger of the isolated inner lead and the fingers of the leads are linearly arranged. The other finger of the isolated inner lead is adjacent to a finger of the external lead. At least one of the inner portions divides the isolated inner lead from the external lead. The isolated inner lead is integrally connected to an adjacent one of the inner portions by a connecting block. A tape-attaching step is performed to mechanically connect the isolated inner lead where two insulating tapes are attached in a manner that the connecting block can be removed. Therefore, the isolated inner lead is electrically isolated from the leads and can be mechanically fixed to replace extra redistributing components during semiconductor packaging processes.
摘要:
A stacked assembly of semiconductor packages primarily comprises a plurality of stacked semiconductor packages. Each semiconductor package includes an encapsulant, at least a chip, and a plurality of external leads of a leadframe, where the external leads are exposed and extended from a plurality of sides of the encapsulant. Each external lead of an upper semiconductor package has a U-shaped cut end when package singulation. The U-shaped cut ends are configured for locking to the soldered portion of a corresponding external lead of a lower semiconductor package where the U-shaped cut ends and the soldered portions by soldering materials. Therefore, the stacked assembly has a larger soldering area and stronger lead reliability to enhance the soldering points to against the effects of impacts, thermal shocks, and thermal cycles.