公开(公告)号：US20080303175A1

公开(公告)日：2008-12-11

申请号：US12222329

申请日：2008-08-07

申请人： Nobuyasu Kanekawa ,  Hirokazu Ihara ,  Masatsugu Akiyama ,  Kiyoshi Kawabata ,  Hisayoshi Yamanaka ,  Tetsuya Okishima

发明人： Nobuyasu Kanekawa ,  Hirokazu Ihara ,  Masatsugu Akiyama ,  Kiyoshi Kawabata ,  Hisayoshi Yamanaka ,  Tetsuya Okishima

IPC分类号： H01L23/52

CPC分类号： H01L24/49 ,  G11C5/04 ,  G11C5/06 ,  H01L23/50 ,  H01L23/538 ,  H01L23/5386 ,  H01L24/48 ,  H01L25/0652 ,  H01L25/18 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2224/49433 ,  H01L2224/73265 ,  H01L2924/00014 ,  H01L2924/01005 ,  H01L2924/01007 ,  H01L2924/01013 ,  H01L2924/01019 ,  H01L2924/01039 ,  H01L2924/01055 ,  H01L2924/01074 ,  H01L2924/014 ,  H01L2924/12041 ,  H01L2924/14 ,  H01L2924/1433 ,  H01L2924/15183 ,  H01L2924/15787 ,  H01L2924/00 ,  H01L2224/45099 ,  H01L2224/05599

摘要： An electronic apparatus which includes a wiring substrate which includes wiring conductors, and a plurality of semiconductor bare chips that are formed on the wiring substrate. The semiconductor bare chips include a processor for processing data and a circuit having a checking function for detecting faults of the processor

摘要翻译： 一种电子设备，其包括布线基板和布线基板上形成的多个半导体裸芯片。 半导体裸芯片包括用于处理数据的处理器和具有用于检测处理器的故障的检查功能的电路

公开(公告)号：US20080116886A1

公开(公告)日：2008-05-22

申请号：US11926583

申请日：2007-10-29

申请人： Masamichi Yamada ,  Nobuyasu Kanekawa ,  Kenji Nakabayashi

发明人： Masamichi Yamada ,  Nobuyasu Kanekawa ,  Kenji Nakabayashi

IPC分类号： G01B7/30 ,  H01L43/08

CPC分类号： G01D5/145

摘要： A highly accurate displacement sensor using GMR elements for detecting a displacement of a physical quantity such as angle is to be provided wherein a waveform distortion of output voltage is diminished.There are installed at least two Wheatstone bridge circuits having a predetermined angular offset and each comprising a plurality of GMR elements, the GMR elements each having a fixed magnetic layer set to a predetermined magnetization direction. An AC power supply is use as a power supply of the Wheatstone bridge circuits and a displacement of a physical quantity such as a rotational angle is detected on the basis of AC-modulated outputs from the Wheatstone bridge circuits.An anisotropic self-bias effect of a free magnetic layer in each GMR element can be diminished and hence it is possible to remedy a waveform distortion of an output signal based on the anisotropic self-bias effect of the free magnetic layer.

摘要翻译： 提供一种使用GMR元件检测诸如角度的物理量的位移的高精度位移传感器，其中输出电压的波形失真减小。 安装有至少两个具有预定角度偏移的惠斯通电桥电路，每个包含多个GMR元件，每个具有固定的磁性层设置为预定的磁化方向的GMR元件。 使用交流电源作为惠斯登电桥电路的电源，并且基于惠斯通电桥电路的交流调制输出来检测物理量（例如旋转角度）的位移。 可以减少每个GMR元件中的自由磁性层的各向异性自偏置效应，因此可以基于自由磁性层的各向异性自偏置效应来补偿输出信号的波形失真。

公开(公告)号：US07277816B2

公开(公告)日：2007-10-02

申请号：US11196298

申请日：2005-08-04

申请人： Nobuyasu Kanekawa ,  Masatoshi Hoshino ,  Kazuhiro Komatsuzaki ,  Masayoshi Kaneyasu

发明人： Nobuyasu Kanekawa ,  Masatoshi Hoshino ,  Kazuhiro Komatsuzaki ,  Masayoshi Kaneyasu

IPC分类号： G06F19/00

CPC分类号： B60T8/1725 ,  G01P3/489

摘要： A system for directly measuring tire grip conditions is provided which can measure a skidding condition with no need of applying a vibration. A tire rotation speed sensor comprising a detection gear and a magnet sensor is mounted to a rotating shaft of a tire. An output of the tire rotation speed sensor is analyzed in time-frequency domain to detect vibrations caused by slips, thereby determining tire grip conditions, such as a slip ratio and a slip angle. By detecting fluctuations in rotation based on the cause-effect relation between the occurrence of tire slips and the occurrence of fluctuations in rotation, the tire slips can be directly detected. Therefore, the tire grip conditions can be confirmed with high accuracy.

摘要翻译： 提供一种用于直接测量轮胎抓地条件的系统，其可以在不需要施加振动的情况下测量打滑条件。 包括检测齿轮和磁体传感器的轮胎转速传感器安装在轮胎的旋转轴上。 在时频域分析轮胎转速传感器的输出，以检测由滑移引起的振动，从而确定轮滑状态，例如滑移率和滑移角。 通过基于轮胎滑动的发生与旋转发生之间的因果关系来检测旋转的波动，可以直接检测轮胎滑移。 因此，可以高精度地确认轮胎抓地条件。

公开(公告)号：US06476750B1

公开(公告)日：2002-11-05

申请号：US09485349

申请日：2000-02-09

申请人： Nobuyasu Kanekawa ,  Yasuyuki Kojima ,  Seigou Yukutake ,  Minehiro Nemoto ,  Kazuhisa Takami ,  Takayuki Iwasaki ,  Yusuke Takeuchi ,  Katsuhiro Furukawa

发明人： Nobuyasu Kanekawa ,  Yasuyuki Kojima ,  Seigou Yukutake ,  Minehiro Nemoto ,  Kazuhisa Takami ,  Takayuki Iwasaki ,  Yusuke Takeuchi ,  Katsuhiro Furukawa

IPC分类号： H03M112

CPC分类号： H03M3/392 ,  H03M3/498

摘要： The hardware of an over-sampling A/D and D/A converter is provided, which hardware is capable of being operated with either kind of software: one corresponding to a first method in which the over-sampling ratio is fixed and the other corresponding to a second method in which the over-sampling ratio is variable. The value N3 written on the pseudo-frequency-dividing-ratio-register 11 and the value N4 written on the pseudo-over-sampling-ratio-register 21 are converted through a user interface into the frequency dividing ratio N1 by the conversion circuit 12 and the converted result is written in the frequency-dividing-ratio-register 10.

摘要翻译： 提供过采样A / D和D / A转换器的硬件，哪个硬件能够使用任何一种软件进行操作：一种对应于过采样率固定的第一种方法，另一种对应 到过采样比是可变的第二种方法。 写入伪分频比寄存器11的值N3和写在伪过采样比寄存器21上的值N4由转换电路12通过用户接口转换成分频比N1 转换后的结果写入分频比寄存器10。

公开(公告)号：US06407432B1

公开(公告)日：2002-06-18

申请号：US09446846

申请日：1999-12-29

申请人： Minehiro Nemoto ,  Yasuyuki Kojima ,  Nobuyasu Kanekawa ,  Seigou Yukutake ,  Katsuhiro Furukawa

发明人： Minehiro Nemoto ,  Yasuyuki Kojima ,  Nobuyasu Kanekawa ,  Seigou Yukutake ,  Katsuhiro Furukawa

IPC分类号： H01L2701

CPC分类号： H01L21/76264 ,  H01L21/7624 ,  H01L21/76283 ,  H01L21/76291 ,  H01L23/49541 ,  H01L23/642 ,  H01L24/45 ,  H01L24/48 ,  H01L24/49 ,  H01L2224/05554 ,  H01L2224/45124 ,  H01L2224/45144 ,  H01L2224/48091 ,  H01L2224/48095 ,  H01L2224/48247 ,  H01L2224/48464 ,  H01L2224/49175 ,  H01L2924/00014 ,  H01L2924/01013 ,  H01L2924/01079 ,  H01L2924/10161 ,  H01L2924/12043 ,  H01L2924/13091 ,  H01L2924/181 ,  H01L2924/19041 ,  H01L2924/00 ,  H01L2924/00012 ,  H01L2224/45015 ,  H01L2924/207 ,  H01L2224/05599 ,  H01L2224/85399

摘要： A small sized semiconductor device having a high insulating performance between a primary side circuit and a secondary side circuit is realized. A circuit region 2, plural first and second terminal electrodes 5 connected to the circuit region 3, and an insulation-separation region 4 for separating electrically the first terminal electrodes from the second terminal electrodes, and for transmitting signals between the first and the second terminal electrodes are formed onto a semiconductor chip 1, and the insulation-separation region 4 is provided between the first and second terminal electrodes. The interval between the first and the second terminal electrodes on the same semiconductor chip can be separated with high insulating performance.

摘要翻译： 实现了在初级侧电路和次级侧电路之间具有高绝缘性能的小尺寸半导体器件。 电路区域2，连接到电路区域3的多个第一和第二端子电极5以及用于将第一端子电极与第二端子电极分离并用于在第一和第二端子之间传输信号的绝缘分离区域4 电极形成在半导体芯片1上，并且绝缘分离区域4设置在第一和第二端子电极之间。 相同半导体芯片上的第一和第二端子电极之间的间隔可以以高绝缘性能分离。

公开(公告)号：US6092217A

公开(公告)日：2000-07-18

申请号：US962879

申请日：1997-11-03

申请人： Nobuyasu Kanekawa ,  Shoji Suzuki ,  Yoshimichi Sato ,  Korefumi Tashiro ,  Keisuke Bekki ,  Hiroshi Sato ,  Makoto Nohmi ,  Shinya Ohtsuji

发明人： Nobuyasu Kanekawa ,  Shoji Suzuki ,  Yoshimichi Sato ,  Korefumi Tashiro ,  Keisuke Bekki ,  Hiroshi Sato ,  Makoto Nohmi ,  Shinya Ohtsuji

IPC分类号： G05B9/03 ,  G06F11/00 ,  G06F11/08 ,  G06F11/16 ,  G06F11/18 ,  G06F11/20 ,  G06F11/267 ,  G06F7/02 ,  H04L1/00

CPC分类号： G06F11/0763 ,  G05B9/03 ,  G06F11/085 ,  G06F11/1695 ,  G06F11/188 ,  G06F11/2023 ,  G06F11/2035 ,  G06F11/2215 ,  G06F11/008 ,  G06F11/0796 ,  G06F11/18

摘要： A self-checking circuit, which is useful for a highly reliable system configuration, includes a logic circuit having an error detection function. For function blocks for feeding out a plurality of signals that are at least duplexed, the logic circuit compares the output signals of the function blocks, and detects an error on the basis of results of the comparison. The logic circuit comprises synthesizing means provided to superimpose inherent waveforms assigned in advance to the respective output signals of the function blocks onto the output signals of one of the function blocks. The inherent waveforms are orthogonal waveforms generated by an orthogonal waveform generator circuit. The logic circuit also comprises comparison means for comparing a signal output of the synthesizing means with the signal output of the other function block to detect an error. The whole circuit including the function blocks are judged normal only if the waveforms inherent to both output signals exist.

摘要翻译： 对于高度可靠的系统配置有用的自检电路包括具有错误检测功能的逻辑电路。 对于用于输出至少双工的多个信号的功能块，逻辑电路比较功能块的输出信号，并且基于比较的结果来检测错误。 逻辑电路包括合成装置，用于将预先分配的固有波形与功能块的各个输出信号叠加到一个功能块的输出信号上。 固有波形是由正交波形发生器电路产生的正交波形。 逻辑电路还包括比较装置，用于将合成装置的信号输出与另一功能块的信号输出进行比较，以检测误差。 包括功能块的整个电路仅在存在两个输出信号固有的波形时才被判定为正常。

公开(公告)号：US5802266A

公开(公告)日：1998-09-01

申请号：US323094

申请日：1994-10-14

申请人： Nobuyasu Kanekawa ,  Shoji Suzuki ,  Yoshimichi Sato ,  Korefumi Tashiro ,  Keisuke Bekki ,  Hiroshi Sato ,  Makoto Nohmi ,  Shinya Ohtsuji

发明人： Nobuyasu Kanekawa ,  Shoji Suzuki ,  Yoshimichi Sato ,  Korefumi Tashiro ,  Keisuke Bekki ,  Hiroshi Sato ,  Makoto Nohmi ,  Shinya Ohtsuji

IPC分类号： G05B9/03 ,  G05B13/02 ,  G06F11/00 ,  G06F11/08 ,  G06F11/16 ,  G06F11/18 ,  G06F11/20 ,  G06F11/267 ,  G06F17/50 ,  H03K19/007 ,  G06F7/02 ,  H04L1/00

CPC分类号： G05B9/03 ,  G06F11/0763 ,  G06F11/085 ,  G06F11/1608 ,  G06F11/1695 ,  G06F11/188 ,  G06F11/2215 ,  G06F11/0796

摘要： A self-checking circuit, which is useful for a highly reliable system configuration, includes a logic circuit having an error detection function. For function blocks for feeding out a plurality of signals that are at least duplexed, the logic circuit compares the output signals of the function blocks, and detects an error on the basis of results of the comparison. The logic circuit comprises synthesizing circuitry provided to superimpose inherent waveforms assigned in advance to the respective output signals of the function blocks onto the output signals of one of the function blocks. The inherent waveforms are orthogonal waveforms generated by an orthogonal waveform generator circuit. The logic circuit also compares the output signals having the superimposed inherent waveforms with the signal output of the other function block to detect an error. The whole circuit including the function blocks are judged normal only if the waveforms inherent to both output signals exist.

摘要翻译： 对于高度可靠的系统配置有用的自检电路包括具有错误检测功能的逻辑电路。 对于用于输出至少双工的多个信号的功能块，逻辑电路比较功能块的输出信号，并且基于比较的结果来检测错误。 逻辑电路包括合成电路，用于将预先分配的固有波形叠加到功能块的各个输出信号到功能块之一的输出信号上。 固有波形是由正交波形发生器电路产生的正交波形。 逻辑电路还将具有叠加的固有波形的输出信号与另一功能块的信号输出进行比较，以检测错误。 包括功能块的整个电路仅在存在两个输出信号固有的波形时才被判定为正常。

公开(公告)号：US08717017B2

公开(公告)日：2014-05-06

申请号：US12708259

申请日：2010-02-18

申请人： Mutsumi Suzuki ,  Nobuyasu Kanekawa ,  Masamichi Yamada

发明人： Mutsumi Suzuki ,  Nobuyasu Kanekawa ,  Masamichi Yamada

IPC分类号： G01R33/02

CPC分类号： G01R33/091 ,  G01D1/00 ,  G01D15/00 ,  G01D21/00

摘要： There has been a problem that a bridge circuit using magneto-resistive elements or transducer elements could output a signal including an offset voltage, which could result in lower measurement accuracy. In order to solve such a problem, half-bridges each having magneto-resistive elements or transducer elements are excited with different excitation voltages so that the offset voltage is eliminated and the measurement accuracy is improved.

摘要翻译： 存在使用磁阻元件或换能器元件的桥式电路可以输出包括偏移电压的信号的问题，这可能导致较低的测量精度。 为了解决这样的问题，具有磁阻元件或换能器元件的半桥被不同的激励电压激励，从而消除了偏移电压，提高了测量精度。

公开(公告)号：US08589612B2

公开(公告)日：2013-11-19

申请号：US13106788

申请日：2011-05-12

申请人： Hiromichi Yamada ,  Kotaro Shimamura ,  Nobuyasu Kanekawa ,  Yuichi Ishiguro

发明人： Hiromichi Yamada ,  Kotaro Shimamura ,  Nobuyasu Kanekawa ,  Yuichi Ishiguro

IPC分类号： G06F13/24

CPC分类号： G06F13/24 ,  G06F11/1641 ,  G06F2201/845

摘要： A computer system which shortens standby time of CPUs and improves CPU processing efficiency of a performance mode upon switching from the performance mode (parallel operation) to a safety mode (master/checker operation) is provided. In a computer system including: at least two CPUs; a programmable interrupt controller for interrupting the CPUs; and a comparator for mutually comparing outputs of the CPUs, switching between the performance mode of executing mutually different processes by the CPUs, respectively, to improve performance and the safety mode of executing mutually the same processes by the CPUs and collating results by the comparator to detect failure can be carried out; CPUs to be interrupted can be set for each interrupt factor; and whether the performance mode is to be executed or the safety mode is to be executed can be set for each interrupt factor.

摘要翻译： 提供一种缩短CPU的待机时间并提高从性能模式（并行操作）切换到安全模式（主/检测器操作）时的CPU处理效率的计算机系统。 在一个计算机系统中，包括：至少两个CPU; 用于中断CPU的可编程中断控制器; 以及比较器，用于相互比较CPU的输出，分别由CPU执行相互不同的处理的性能模式之间进行切换，以提高CPU的性能和执行相同处理的安全模式，并将比较器的结果进行比较 检测失败可以进行; 可以为每个中断因子设置要中断的CPU; 并且可以针对每个中断因子来设置执行性能模式还是执行安全模式。

公开(公告)号：US08421441B2

公开(公告)日：2013-04-16

申请号：US12868236

申请日：2010-08-25

申请人： Teppei Hirotsu ,  Nobuyasu Kanekawa ,  Itaru Tanabe

发明人： Teppei Hirotsu ,  Nobuyasu Kanekawa ,  Itaru Tanabe

IPC分类号： G01R19/00

CPC分类号： G01R19/0092 ,  H03K17/0822

摘要： A current-controlled semiconductor device is provided which corrects fluctuations of both gain and offset of a current detection circuit to thereby enable high-accuracy current detection within a single-chip IC. The current-controlled semiconductor device is provided on the same semiconductor chip with a MOSFET, two constant current sources, and a current detection circuit which detects a current of the MOSFET and currents of the constant current sources. Further, the constant current sources are equipped with an external connecting terminal for measuring their current values. A correction measured-value holding register holds therein the current values of the constant current sources, which have been measured from outside.

摘要翻译： 提供一种电流控制半导体器件，其校正电流检测电路的增益和偏移的波动，从而使得能够在单芯片IC内进行高精度电流检测。 电流控制半导体器件设置在具有MOSFET，两个恒定电流源的同一半导体芯片上，以及检测MOSFET的电流和恒流源的电流的电流检测电路。 此外，恒流源配备有用于测量其电流值的外部连接端子。 校正测量值保持寄存器保持从外部测量的恒流源的当前值。