FLUID EJECTION DEVICE, PRINTHEAD, PRINTER, AND METHOD FOR MANUFACTURING THE EJECTION DEVICE

    公开(公告)号:US20180281402A1

    公开(公告)日:2018-10-04

    申请号:US15884186

    申请日:2018-01-30

    Abstract: Ejection device for fluid, comprising a solid body including: first semiconductor body including a chamber for containing the fluid, an ejection nozzle in fluid connection with the chamber, and an actuator operatively connected to the chamber to generate, in use, one or more pressure waves in the fluid such as to cause ejection of the fluid from the ejection nozzle; and a second semiconductor body including a channel for feeding the fluid to the chamber, coupled to the first semiconductor body, in such a way that the channel is in fluid connection with the chamber. The second semiconductor body integrates a damping cavity over which extends a damping membrane, the damping cavity and the damping membrane extending laterally to the channel for feeding the fluid.

    Method and system for gyroscope real-time calibration

    公开(公告)号:US10088333B2

    公开(公告)日:2018-10-02

    申请号:US14444920

    申请日:2014-07-28

    Inventor: Daniele Mangano

    Abstract: A method for real-time calibration of a gyroscope, configured for supplying a value of angular velocity that is function of a first angle of rotation about a first angular-sensing axis that includes defining a time interval, acquiring from an accelerometer an equivalent value of angular velocity that can be associated to the first angle of rotation; calculating a deviation between the value of angular velocity and the equivalent value of angular velocity; iteratively repeating the previous steps through the time interval, incrementing or decrementing an offset variable by a first predefined value on the basis of the values assumed by the deviations during the iterations, and updating the value of angular velocity as a function of the offset variable.

    Porous-Silicon Light-Emitting Device and Manufacturing Method Thereof

    公开(公告)号:US20180269357A1

    公开(公告)日:2018-09-20

    申请号:US15983959

    申请日:2018-05-18

    Abstract: A light-emitting device may include a semiconductor body having a first conductivity type, with a front side and a back side. The light-emitting device may also include a porous-silicon region which extends in the semiconductor body at the front side, and a cathode region in direct lateral contact with the porous-silicon region. The light-emitting device may further include a barrier region of electrically insulating material, which extends in direct contact with the cathode region at the bottom side of the cathode region so that, in use, an electric current flows in the semiconductor body through lateral portions of the cathode region.

    DRIVER CIRCUIT, CORRESPONDING ULTRASOUND APPARATUS AND METHOD

    公开(公告)号:US20180248544A1

    公开(公告)日:2018-08-30

    申请号:US15690963

    申请日:2017-08-30

    Abstract: A driver circuit for driving, for example, ultrasonic transducers in medical equipment, such as ultrasound scanning equipment. The driver circuit includes first inputs receptive of a pulsed signal, second inputs receptive of an analog signal, an output for applying a pulsed drive signal or an analog drive signal to a load. A pair of output transistors of complementary polarities are positioned with their current paths in series between opposing supply lines with a connection point intermediate between the transistors of the pair of transistors. The connection point between output transistors is coupled to the output of the circuit. The control terminals of the output transistors, which are coupled together, may be coupled to the first inputs with the driver functioning as a pulser, or else coupled to the second inputs with the driver functioning as a linear driver.

    Probe card for testing integrated circuits

    公开(公告)号:US10060972B2

    公开(公告)日:2018-08-28

    申请号:US15290386

    申请日:2016-10-11

    Inventor: Alberto Pagani

    Abstract: A probe card is adapted for testing at least one integrated circuit that integrated on a corresponding at least one die of a semiconductor material wafer. The probe card includes a board adapted for the coupling to a tester apparatus. Several probes are coupled to the board. The probe card includes replaceable elementary units, wherein each unit includes at least one probe for contacting externally-accessible terminals of an integrated circuit under test. The replaceable elementary units are arranged so as to correspond to an arrangement of at least one die on the semiconductor material wafer containing integrated circuits to be tested.

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