Article with gradient property and processes for selective etching
    61.
    发明授权
    Article with gradient property and processes for selective etching 有权
    具有选择性蚀刻的梯度特性和工艺的文章

    公开(公告)号:US09580809B2

    公开(公告)日:2017-02-28

    申请号:US14596338

    申请日:2015-01-14

    Inventor: Owen Hildreth

    Abstract: An article includes a substrate; and a coating disposed on the substrate that includes a microporous layer; a gradient in a density of a volume of the microporous layer, and a plurality of dendritic veins that are anisotropically disposed in the coating. A process for forming a coating includes disposing an activating catalyst on a substrate; introducing an activatable etchant; introducing an etchant oxidizer, performing an oxidation-reduction reaction between the substrate, the activatable etchant, and the etchant oxidizer in a presence of the activating catalyst, the oxidation-reduction reaction occurring in a liquid medium including the activatable etchant; and the etchant oxidizer, forming an etchant product comprising atoms from the substrate; removing a portion of the etchant product from the substrate; and forming a dendritic vein in the substrate to form the coating, the dendritic vein being anisotropically disposed in the coating.

    Abstract translation: 一种制品包括底物; 以及设置在所述基板上的包括微孔层的涂层; 微孔层的体积密度的梯度和各向异性地设置在涂层中的多个树枝状静脉。 一种形成涂层的方法包括在基材上设置活化催化剂; 引入可激活的蚀刻剂; 引入蚀刻剂氧化剂,在活化催化剂的存在下,在底物,可活化蚀刻剂和蚀刻剂氧化剂之间进行氧化还原反应,氧化还原反应在包括可活化蚀刻剂的液体介质中发生; 和蚀刻剂氧化剂,形成包含来自基底的原子的蚀刻剂产物; 从衬底去除蚀刻剂产物的一部分; 并在基质中形成树突状静脉以形成涂层,树突状静脉各向异性地置于涂层中。

    PROCESS FOR MAKING AN IRIDIUM LAYER
    62.
    发明申请
    PROCESS FOR MAKING AN IRIDIUM LAYER 审中-公开
    制备IRIIUM层的工艺

    公开(公告)号:US20160340792A1

    公开(公告)日:2016-11-24

    申请号:US15146888

    申请日:2016-05-04

    Abstract: A process for depositing a plurality of layers of iridium on a substrate includes: contacting the substrate with an electrolyte composition including: iridium cations protons; biasing the substrate at a first potential; forming iridium on the substrate at the first potential of the substrate; disposing hydrogen on the substrate; self-terminating the forming of iridium on the substrate in response to increasing a coverage of hydrogen on the substrate; oxidizing hydrogen on the substrate by changing a potential of the substrate from the first potential to a second potential; and changing the potential of the substrate from the second potential to a third potential for forming additional iridium on the substrate to deposit a plurality of layers of iridium on the substrate, such that forming the additional iridium on the substrate occurs at the third potential in response to oxidizing the hydrogen on the substrate at the second potential.

    Abstract translation: 用于在衬底上沉积多层铱的方法包括:使基底与电解质组合物接触,所述电解质组合物包括:铱阳离子质子; 将衬底偏置在第一电位; 在基板的第一电位处形成铱; 在基板上设置氢; 响应于增加衬底上的氢的覆盖而自身终止在衬底上形成铱; 通过将衬底的电位从第一电位改变到第二电位来在衬底上氧化氢; 并且将衬底从第二电位的电位改变到用于在衬底上形成额外的铱的第三电位,以在衬底上沉积多个铱层,使得在衬底上形成附加的铱响应于第三个电位 以在第二电位下氧化衬底上的氢。

    ORACLE-FREE MATCH TESTING OF A PROGRAM USING COVERING ARRAYS AND EQUIVALENCE CLASSES
    63.
    发明申请
    ORACLE-FREE MATCH TESTING OF A PROGRAM USING COVERING ARRAYS AND EQUIVALENCE CLASSES 审中-公开
    使用覆盖阵列和等效类的程序的无符合匹配测试

    公开(公告)号:US20160299836A1

    公开(公告)日:2016-10-13

    申请号:US15019448

    申请日:2016-02-09

    Abstract: A process for testing a program includes: receiving a variable comprising a plurality of input values; producing a plurality of equivalence classes for the input values; producing a representative value per equivalence class; producing, by a processor, a primary covering array comprising a plurality of primary vectors; producing a secondary covering array comprising a plurality of secondary vectors; providing the secondary vectors to the program; and producing a result vector comprising a plurality of result entries to test the program. A computer system for testing the program includes: a memory; and a processor, in communication with the memory, wherein the computer system is configured to perform the process for testing the program. A computer program product for testing the program includes: a non-transitory computer readable storage medium readable by a processor and storing program code for execution by the processor to perform the process.

    Abstract translation: 用于测试程序的过程包括:接收包括多个输入值的变量; 产生用于输入值的多个等价类; 产生每个等价类的代表值; 由处理器产生包括多个主向量的主覆盖阵列; 产生包括多个次向量的次级覆盖阵列; 向程序提供辅助向量; 并产生包括多个结果条目的结果向量以测试该程序。 用于测试程序的计算机系统包括:存储器; 以及与所述存储器通信的处理器,其中所述计算机系统被配置为执行用于测试所述程序的处理。 一种用于测试程序的计算机程序产品包括:由处理器可读的非暂时计算机可读存储介质,并存储用于由处理器执行以执行该过程的程序代码。

    SUSCEPTOMETER AND PROCESS FOR DETERMINING MAGNETIC SUSCEPTIBILITY
    64.
    发明申请
    SUSCEPTOMETER AND PROCESS FOR DETERMINING MAGNETIC SUSCEPTIBILITY 有权
    用于确定磁性可靠性的测定仪和方法

    公开(公告)号:US20160274199A1

    公开(公告)日:2016-09-22

    申请号:US15059824

    申请日:2016-03-03

    Abstract: A susceptometer includes: a substrate; a plurality of electrodes including: a first pair of electrodes disposed on the substrate; a second pair of electrodes disposed on the substrate, the second pair of electrodes arranged collinear with the first pair of electrodes to form a set of aligned electrodes; and a third pair of electrodes disposed on the substrate, the third pair of electrodes arranged noncollinearly with set of aligned electrodes; and a solenoid circumscribingly disposed around the electrodes to: receive the sample such that the solenoid is circumscribingly disposed around the sample; receive an alternating current and produce an primary magnetic field based on the alternating current; and subject the sample to the primary magnetic field.

    Abstract translation: 检测仪包括:底物; 多个电极,包括:设置在所述基板上的第一对电极; 设置在所述基板上的第二对电极,所述第二对电极与所述第一对电极共线设置,以形成一组对齐的电极; 以及设置在所述基板上的第三对电极,所述第三对电极非对齐地排列成一组排列的电极; 以及围绕所述电极环绕地设置的螺线管,以便:接收所述样品,使得所述螺线管围绕所述样品环绕地设置; 接收交流电流并基于交流电产生初级磁场; 并将样品置于主磁场。

    Photon detector and process for detecting a single photon
    65.
    发明授权
    Photon detector and process for detecting a single photon 有权
    光子探测器和检测单个光子的过程

    公开(公告)号:US09401448B2

    公开(公告)日:2016-07-26

    申请号:US14547189

    申请日:2014-11-19

    CPC classification number: H01L31/107

    Abstract: A photon detector article includes a photon detector configured to receive a primary waveform, the photon detector includes a multiplication region; a photon absorption region; a punch through voltage range; and a breakdown voltage; a source in electrical communication with the photon detector and configured to provide the primary waveform that includes a first voltage that is: less than a maximum value of the punch through voltage range, or effective to maintain a charge carrier in the absorption region; and a second voltage that is greater than the breakdown voltage; and a reference member in electrical communication with the source and configured to provide a reference waveform in response to receiving the primary waveform.

    Abstract translation: 光子检测器物品包括被配置为接收主波形的光子检测器,所述光子检测器包括乘法区域; 光子吸收区; 穿过电压范围; 和击穿电压; 与所述光子检测器电通信的源,并且被配置为提供包括第一电压的初级波形,所述第一电压是:小于所述穿通电压范围的最大值,或有效地在所述吸收区域中保持电荷载体; 以及大于所述击穿电压的第二电压; 以及与源电气通信并被配置为响应于接收主波形而提供参考波形的参考构件。

    PHASE SHIFT DETECTOR PROCESS FOR MAKING AND USE OF SAME
    66.
    发明申请
    PHASE SHIFT DETECTOR PROCESS FOR MAKING AND USE OF SAME 审中-公开
    相移检测程序的制作和使用

    公开(公告)号:US20160209275A1

    公开(公告)日:2016-07-21

    申请号:US14995861

    申请日:2016-01-14

    CPC classification number: H01Q1/526 G01N22/00 H01Q1/521

    Abstract: A phase shift detector includes: an interferometer; and a microwave probe in electrical communication with the interferometer, the microwave probe including: a primary shield electrode; and a transmission electrode disposed proximate to the primary shield electrode, the transmission electrode and the primary shield electrode being exposed and arranged to produce an electric field, wherein the transmission electrode is isolated electrically from the primary shield electrode. A process for acquiring phase shift data includes: receiving a microwave radiation by a power splitter; producing a reference microwave radiation and a sample microwave radiation; communicating the reference microwave radiation to a reference arm; communicating the sample radiation to a sample arm; communicating the sample radiation from the sample arm to a microwave probe; subjecting a sample to the sample microwave radiation; producing a probe microwave radiation in response to subjecting the sample to the sample microwave radiation; communicating the probe microwave radiation to a power combiner; receiving the probe microwave radiation and the reference microwave radiation from the reference arm; and producing an interferometer signal in response to receiving the probe microwave radiation and the reference microwave radiation to acquire phase shift data.

    Abstract translation: 一种相移检测器,包括:干涉仪; 以及与所述干涉仪电通信的微波探头,所述微波探头包括:主屏蔽电极; 以及布置在所述主屏蔽电极附近的透射电极,所述透射电极和所述主屏蔽电极被曝光和布置以产生电场,其中所述透射电极与所述主屏蔽电极电隔离。 一种用于获取相移数据的过程包括:通过功率分配器接收微波辐射; 产生参考微波辐射和样品微波辐射; 将参考微波辐射传送到参考臂; 将样品辐射传递到样品臂; 将样品辐射从样品臂传送到微波探针; 使样品经受样品微波辐射; 响应于使样品经受样品微波辐射而产生探针微波辐射; 将探测微波辐射传送到功率组合器; 从参考臂接收探头微波辐射和参考微波辐射; 以及响应于接收到所述探针微波辐射和所述参考微波辐射而产生干涉仪信号以获取相移数据。

    NONCONTACT RESONAMETER, PROCESS FOR MAKING AND USE OF SAME
    67.
    发明申请
    NONCONTACT RESONAMETER, PROCESS FOR MAKING AND USE OF SAME 审中-公开
    非共轭结构,其制备和使用方法

    公开(公告)号:US20160161424A1

    公开(公告)日:2016-06-09

    申请号:US14958539

    申请日:2015-12-03

    CPC classification number: G01N22/00

    Abstract: A noncontact resonameter includes: a resonator to: produce an excitation signal including a field; subject a sample to the excitation signal; produce a first resonator signal in a presence of the sample and the excitation signal, the first resonator signal including: a first quality factor of the resonator; a first resonance frequency of the resonator; or a combination thereof, the first resonator signal occurring in an absence of contact between the sample and the resonator; and produce a second resonator signal in a presence of the excitation signal and an absence of the sample, the second resonator signal including: a second quality factor of the resonator; a second resonance frequency of the resonator; or a combination thereof; a circuit in electrical communication with the resonator to receive the first resonator signal and the second resonator signal; and a continuous feeder to: provide the sample proximate to the resonator; dispose the sample intermediately in the field of the excitation signal during production of the first resonator signal; remove the sample from the resonator; and manipulate a position of the sample relative to the resonator in a continuous motion and in an absence of contact between the sample and the resonator.

    Abstract translation: 非接触谐振器包括:谐振器,用于:产生包括场的激励信号; 对样品进行激发信号; 在样本和激励信号的存在下产生第一谐振器信号,所述第一谐振器信号包括:谐振器的第一品质因数; 谐振器的第一谐振频率; 或其组合,所述第一谐振器信号在所述样品和所述谐振器之间没有接触的情况下发生; 并且在存在激发信号和不存在采样的情况下产生第二谐振器信号,所述第二谐振器信号包括:谐振器的第二品质因子; 谐振器的第二共振频率; 或其组合; 与谐振器电连通以接收第一谐振器信号和第二谐振器信号的电路; 以及连续进料器以:使样品靠近谐振器; 在产生第一谐振器信号期间将采样中间地置于激励信号的场中; 从谐振器中取出样品; 并且以连续运动并且在样本和谐振器之间没有接触的情况下相对于谐振器操纵样本的位置。

    PHOTONIC ARTICLE, PROCESS FOR MAKING AND USING SAME
    68.
    发明申请
    PHOTONIC ARTICLE, PROCESS FOR MAKING AND USING SAME 有权
    光学文章,制作和使用相同的方法

    公开(公告)号:US20160018280A1

    公开(公告)日:2016-01-21

    申请号:US14664247

    申请日:2015-03-20

    CPC classification number: G01L11/02 G01K11/00 G01N21/45

    Abstract: An article to determine a sample condition includes a substrate; a reference optical cavity disposed on the substrate and comprising a reference cavity, the reference optical cavity being configured to support a reference optical resonance and to maintain an axial length of the reference cavity; and a sample optical cavity disposed on the substrate and comprising a sample cavity, the sample optical cavity being configured to support a sample optical resonance and to maintain an axial length of the sample cavity.

    Abstract translation: 用于确定样品条件的制品包括底物; 参考光学腔,其设置在所述衬底上并且包括参考腔,所述参考光学腔被配置为支撑参考光学谐振并且保持所述参考腔的轴向长度; 以及设置在所述基板上并且包括样品腔的样品光学腔,所述样品光学腔被配置为支撑样品光学共振并保持所述样品腔的轴向长度。

    PHASE MODULATION NOISE REDUCERE
    69.
    发明申请
    PHASE MODULATION NOISE REDUCERE 有权
    相位调制噪声减少

    公开(公告)号:US20150270835A1

    公开(公告)日:2015-09-24

    申请号:US14716518

    申请日:2015-05-19

    Abstract: A phase modulation (PM) noise reducer to reduce phase modulation noise of an oscillator, the PM noise reducer including: an amplitude modulation (AM) detector to receive a primary oscillator signal and to produce an AM detector signal based on the primary oscillator signal, the primary oscillator signal including a first phase modulation (PM) noise; a control circuit in electrical communication with the AM detector to receive the AM detector signal and to produce a control signal; a phase shifter in electrical communication with the control circuit to receive the primary oscillator signal and the control signal and to produce a secondary oscillator signal based on the primary oscillator signal and the control signal, the secondary oscillator signal comprising a second PM noise, wherein the second PM noise is less than the first PM noise.

    Abstract translation: 一种用于减少振荡器的相位调制噪声的相位调制(PM)降噪器,所述PM降噪器包括:幅度调制(AM)检测器,用于接收主振荡器信号并且基于所述主振荡器信号产生AM检测器信号, 所述主振荡器信号包括第一相位调制(PM)噪声; 控制电路,与AM检测器电通信以接收AM检测器信号并产生控制信号; 与所述控制电路电连接以接收所述主振荡器信号和所述控制信号并基于所述主振荡器信号和所述控制信号产生辅助振荡器信号的相移器,所述辅助振荡器信号包括第二PM噪声,其中, 第二PM噪声小于第一PM噪声。

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