Abstract:
A method and apparatus for detecting and correcting errors in a magnetic recording channel of a mass storage system that combines a Soft Output Viterbi Algorithm SOVA, which has the capability of detecting the reliability of a discrete, equalized signal, and a post processor, which has the capability of detecting specific error events in said discrete, equalized signal, so as to correct error events and to generate an output bit stream.
Abstract:
An output buffer for causing a voltage (Vout) of an integrated circuit output line (OUT,OUT13 PAD) to switch from a voltage of a first voltage line (VDD) to a voltage of a second voltage line (GND) and vice versa, comprises a current path switch circuit (111a,111b) activatable for causing a prescribed current (Is) to constantly flow between the first and second voltage lines during a time between two successive switchings of the output line, and for causing the prescribed current to be deviated (Ic1) to the output line during at least an initial phase of an output line switching from the first voltage line voltage to the second voltage line voltage or vice versa. A current delivered by the first and second voltage lines is thus kept substantially constant in the output line switching. In this way, the time derivative of the current flowing between the first and the second voltage lines is kept small and low switching noise is induced.
Abstract:
A MOS semiconductor device formed on a substrate of a first conductivity type is provided. The device includes active zones for elementary active elements, and at least one inactive zone suitable for electric signal input or output. The substrate is connected with the drain terminal of the device, and at least one of the elementary active elements includes a body region of a second conductivity type that is connected with the source terminal of the device. The at least one inactive zone includes a semiconductor region of the second conductivity type formed in the substrate and adjacent a surface of the substrate, a conductive layer located over the semiconductor region, and a silicon oxide layer located between the semiconductor region and the conductive layer. The silicon oxide layer has alternating first zones and second zones that are contiguous to each other, with the first zones having a greater thickness than the second zones.
Abstract:
An MOS electronic device is formed to reduce drain/gate capacity and to increase cutoff frequency. The device includes a field insulating layer that covers a drain region, delimits an active area with an opening, houses a body region in the active area, and houses a source region in the body region. A portion of the body region between drain and source regions forms a channel region. A polycrystalline silicon structure extends along the edge of the opening, partially on the field insulating and active layers. The polycrystalline silicon structure includes a gate region extending along a first portion of the edge on the channel region and partially surrounding the source region and a non-operative region extending along a second portion of the edge, electrically insulated and at a distance from the gate region.
Abstract:
A method for controlling a vehicle semi-active suspension system comprising at least one suspension, providing for: detecting vehicle dynamic quantities during the vehicle ride; using the detected dynamic quantities, determining an index of ride comfort and an index of roadholding; applying a weight factor to the index of ride comfort and to the index of roadholding and, based on a Sky Hook control model, determining a target damping force characteristics for the at least one suspension of the suspension system; controlling the at least one suspension to put the respective damping force characteristics in accordance with the calculated target damping force characteristics. The weight factor is calculated dynamically during the vehicle ride, by means of a fuzzy calculation on the detected vehicle dynamic quantities.
Abstract:
A charge pump for a nonvolatile memory, having a clock generator circuit supplying an output clock signal; a phase generator circuit receiving the output clock signal, and supplying phase signals; and a voltage booster circuit receiving a supply voltage supplied from outside to the nonvolatile memory and the aforesaid phase signals, and supplying a read voltage higher than the supply voltage. The clock generator circuit includes a comparator receiving the read voltage and a reference voltage, and supplying a selection signal indicating the outcome of the comparison between the read and reference voltages; and a multiplexer receiving a first input clock signal having a pre-set frequency, a second input clock signal having a frequency correlated to the transition frequency of the addresses supplied to the nonvolatile memory, and the selection signal, and supplying the aforesaid output clock signal.
Abstract:
A process for manufacturing components in a multi-layer wafer, including the steps of: providing a multi-layer wafer comprising a first semiconductor material layer, a second semiconductor material layer (, and a dielectric material layer arranged between the first and the second semiconductor material layer; and removing the first semiconductor material layer initially by mechanically thinning the first semiconductor material layer, so as to form a residual conductive layer, and subsequently by chemically removing the residual conductive layer. In one application, the multi-layer wafer is bonded to a first wafer of semiconductor material, with the second semiconductor material layer facing the first wafer, after micro-electromechanical structures have been formed in the second semiconductor material layer of the multi-layer wafer.
Abstract:
A pulse programming method for a non-volatile memory device includes: addressing memory cells to be programmed within the device by selecting corresponding hierarchic decoder transistors; biasing the gate terminals of the memory cells; and programming the memory cells by applying a voltage pulse, regulated by a bias circuit, to the drain terminals of the memory cells. Advantageously, the programming method further comprises a step of precharging an internal node of the bias circuit before starting the programming step, the internal node being connected to a parasitic capacitance of the memory device.
Abstract:
Management of Test Access Port functions of a plurality of components arranged on a single chip by selectively driving the TAP function of each of the components with respective clocks, whilst the further signals for driving the TAP function are used in a shared mode among the various components. Preferably, associated with the aforesaid clocks is a pull-down function for selectively blanking the respective clocks in conditions of non-use. In a preferred way, the aforesaid dedicated clocks are generated on board the chip.
Abstract:
The present invention concerns a bootstrap circuit in DC/DC static converters comprising first current generator means controlled to close in function of a first signal and a recharge circuit of a capacitor. The bootstrap circuit has the characteristic of comprising second current generator means controlled to close with a second signal synchronous with the first signal, the second signal has times and modalities such to send to the capacitor recharge currents such to compensate the discharge of the capacitor itself.