Abstract:
A processor module socket accommodates processor modules of different sizes with adapters that align smaller-sized modules so that module pins align with desired contact points. The largest supported processor module engages with the socket in a conventional manner without the use of an adapter. Smaller processor modules engage within an adapter that in turn engages in the socket in a manner similar to the largest supported processor module. The contact points of the socket support different sized processor modules by keying logical functions based upon the type of processor module installed in the socket.
Abstract:
A function of an integrated circuit is selectively disabled by mechanical intervention at a module that contains the integrated circuit, such as drilling a hole through the module, cutting a slot in the module or burning a hole with a laser through the laser. Mechanical destruction of the module at a predetermined spot disrupts a function enable signal that is otherwise provide through wires of the module to a connection with the integrated circuit. Without the function enable signal from the module wires to the integrated circuit connector, the function associated with the function enable signal cannot run on the integrated circuit.
Abstract:
For testing whether an optical fiber is properly connected to a device, a beam of light is output to the optical fiber. An intensity is detected of light reflected by the device back through the optical fiber in response to the beam of light. In response to the detected intensity, a determination is made of whether the optical fiber is properly connected to the device.
Abstract:
Reference plane voids with a strip segment for improving transmission line integrity over vias permits routing critical signal paths over vias, while increasing via insertion capacitance only slightly. The transmission line reference plane defines voids above (or below) signal-bearing plated-through holes (PTHs) that pass through a rigid substrate core, so that the signals are not degraded by an impedance mismatch that would otherwise be caused by shunt capacitance from the top (or bottom) of the signal-bearing PTHs to the transmission line reference plane. In order to provide increased routing density, signal paths are routed over the voids, but disruption of the signal paths by the voids is prevented by including a conductive strip through the voids that reduces the coupling to the signal-bearing PTHs and maintains the impedance of the signal path conductor.
Abstract:
A circuit and a method for detecting noise events in a system with time variable operating points is provided. A switched capacitor filter comprising a plurality of capacitor units, samples a first voltage to determine an average of a set of voltage measurements, forming an average voltage. A filter control unit controls the plurality of capacitor units in the switched capacitor filter. A comparing unit compares the average voltage to the first voltage to form a comparison. A signaling unit generates a signal to instruct circuits in a processor to initiate actions to keep the first voltage from drooping below a threshold level in response to the comparison.
Abstract:
A microelectronic package having integrated circuits is provided. The microelectronic package includes multiple dielectric laminate layers, copper circuitry between the dielectric laminate layers where the copper circuitry includes circuit traces, and ball grid arrays/land grid arrays operatively connected to the copper circuitry such that conduction occurs. Further, proximate to the connection of the copper circuitry and the ball grid arrays/land grid arrays, a protective copper tongue is below an extension of the circuit traces, such that the protective copper tongue prevents the circuit traces from being affected by cracking propagated in the dielectric laminate layers or the ball grid arrays/land grid arrays.
Abstract:
A method and system for applying multiple voltage droop detection and instruction throttling instances with customized thresholds across semiconductor chips. Environmental parameters are detected for various locations on a chip, and timing margins are determined for each location on the chip. An acceptable voltage droop for each location is determined based on the environmental parameters and the timing margins for the corresponding location. A droop threshold is then determined for each location based on the corresponding acceptable voltage droop determined for the corresponding location.
Abstract:
Reference plane voids with a strip segment for improving transmission line integrity over vias permits routing critical signal paths over vias, while increasing via insertion capacitance only slightly. The transmission line reference plane defines voids above (or below) signal-bearing plated-through holes (PTHs) that pass through a rigid substrate core, so that the signals are not degraded by an impedance mismatch that would otherwise be caused by shunt capacitance from the top (or bottom) of the signal-bearing PTHs to the transmission line reference plane. In order to provide increased routing density, signal paths are routed over the voids, but disruption of the signal paths by the voids is prevented by including a conductive strip through the voids that reduces the coupling to the signal-bearing PTHs and maintains the impedance of the signal path conductor.
Abstract:
A method and system for applying multiple voltage droop detection and instruction throttling instances with customized thresholds across semiconductor chips. Environmental parameters are detected for various locations on a chip, and timing margins are determined for each location on the chip. An acceptable voltage droop for each location is determined based on the environmental parameters and the timing margins for the corresponding location. A droop threshold is then determined for each location based on the corresponding acceptable voltage droop determined for the corresponding location.
Abstract:
An apparatus and method are provided for monitoring the voltage available in each domain of multiple voltage domains of a partitioned electronic chip. The apparatus comprises a single conductive link coupled to the chip, and further comprises a domain selection network having a single output and a plurality of switchable inputs, the output being connected to the single conductive link, and two inputs being connected to monitor respective voltage levels of two of the plurality of voltage domains. A control mechanism is disposed to operate the selection network, in order to selectively connect one of the inputs to the single conductive link, and a sensor device external to the electronic chip is connected to measure the monitored respective voltage levels of two of the plurality of voltage domains using the single conductive link.