SYSTEM AND METHOD FOR MULTI-APPLICATION SOCKET
    61.
    发明申请
    SYSTEM AND METHOD FOR MULTI-APPLICATION SOCKET 失效
    多应用插座的系统和方法

    公开(公告)号:US20120120576A1

    公开(公告)日:2012-05-17

    申请号:US12945111

    申请日:2010-11-12

    Inventor: Roger D. Weekly

    CPC classification number: H05K7/1061 G06F1/183 H01L2924/15311

    Abstract: A processor module socket accommodates processor modules of different sizes with adapters that align smaller-sized modules so that module pins align with desired contact points. The largest supported processor module engages with the socket in a conventional manner without the use of an adapter. Smaller processor modules engage within an adapter that in turn engages in the socket in a manner similar to the largest supported processor module. The contact points of the socket support different sized processor modules by keying logical functions based upon the type of processor module installed in the socket.

    Abstract translation: 处理器模块插座可容纳具有不同尺寸的处理器模块,适配器可对准较小尺寸的模块,使模块引脚与所需的接触点对准。 最大的支持的处理器模块以常规方式与插座接合,而不使用适配器。 较小的处理器模块接合在适配器中,该适配器又以类似于最大支持的处理器模块的方式进入插座。 插座的接点通过根据安装在插座中的处理器模块的类型键入逻辑功能来支持不同大小的处理器模块。

    SYSTEM AND METHOD FOR INTEGRATED CIRCUIT MODULE TAMPERPROOF MODE PERSONALIZATION
    62.
    发明申请
    SYSTEM AND METHOD FOR INTEGRATED CIRCUIT MODULE TAMPERPROOF MODE PERSONALIZATION 失效
    用于集成电路模块防篡改模式个性化的系统和方法

    公开(公告)号:US20120081142A1

    公开(公告)日:2012-04-05

    申请号:US12894325

    申请日:2010-09-30

    Inventor: Roger D. Weekly

    CPC classification number: H01L27/0203 B23K26/38 B23K2101/38

    Abstract: A function of an integrated circuit is selectively disabled by mechanical intervention at a module that contains the integrated circuit, such as drilling a hole through the module, cutting a slot in the module or burning a hole with a laser through the laser. Mechanical destruction of the module at a predetermined spot disrupts a function enable signal that is otherwise provide through wires of the module to a connection with the integrated circuit. Without the function enable signal from the module wires to the integrated circuit connector, the function associated with the function enable signal cannot run on the integrated circuit.

    Abstract translation: 集成电路的功能通过在包含集成电路的模块上的机械干预来选择性地禁用,例如在模块中钻孔,切割模块中的槽或通过激光器用激光烧孔。 在预定点处的模块的机械破坏破坏了另外通过模块的导线与集成电路的连接提供的功能使能信号。 没有功能使能信号从模块导线到集成电路连接器,与功能使能信号相关的功能不能在集成电路上运行。

    Reference plane voids with strip segment for improving transmission line integrity over vias
    64.
    发明授权
    Reference plane voids with strip segment for improving transmission line integrity over vias 失效
    具有带段的参考平面空隙,以改善通孔上的传输线完整性

    公开(公告)号:US07821796B2

    公开(公告)日:2010-10-26

    申请号:US12015543

    申请日:2008-01-17

    Abstract: Reference plane voids with a strip segment for improving transmission line integrity over vias permits routing critical signal paths over vias, while increasing via insertion capacitance only slightly. The transmission line reference plane defines voids above (or below) signal-bearing plated-through holes (PTHs) that pass through a rigid substrate core, so that the signals are not degraded by an impedance mismatch that would otherwise be caused by shunt capacitance from the top (or bottom) of the signal-bearing PTHs to the transmission line reference plane. In order to provide increased routing density, signal paths are routed over the voids, but disruption of the signal paths by the voids is prevented by including a conductive strip through the voids that reduces the coupling to the signal-bearing PTHs and maintains the impedance of the signal path conductor.

    Abstract translation: 具有用于改善通孔上的传输线完整性的带段的参考平面空隙允许在通孔上路由关键信号路径,同时仅通过插入电容略微增加。 传输线参考平面定义了通过刚性衬底芯的信号承载电镀通孔(PTH)上方(或下方)的空隙,使得信号不会被阻抗失配降级,否则会由分流电容引起 信号承载PTH的顶部(或底部)到传输线参考平面。 为了提供增加的布线密度,信号路径被布置在空隙上,但是通过将导电条包括通过空隙来防止由空隙引起的信号路径的破坏,从而减小与信号承载PTH的耦合并维持 信号路径导体。

    Statistical switched capacitor droop sensor for application in power distribution noise mitigation
    65.
    发明授权
    Statistical switched capacitor droop sensor for application in power distribution noise mitigation 有权
    统计开关电容器下垂传感器,用于配电噪声抑制

    公开(公告)号:US07818599B2

    公开(公告)日:2010-10-19

    申请号:US11869186

    申请日:2007-10-09

    CPC classification number: G06F1/28

    Abstract: A circuit and a method for detecting noise events in a system with time variable operating points is provided. A switched capacitor filter comprising a plurality of capacitor units, samples a first voltage to determine an average of a set of voltage measurements, forming an average voltage. A filter control unit controls the plurality of capacitor units in the switched capacitor filter. A comparing unit compares the average voltage to the first voltage to form a comparison. A signaling unit generates a signal to instruct circuits in a processor to initiate actions to keep the first voltage from drooping below a threshold level in response to the comparison.

    Abstract translation: 提供了一种用于检测具有时间可变操作点的系统中的噪声事件的电路和方法。 一种开关电容滤波器,包括多个电容器单元,对第一电压进行采样,以确定一组电压测量的平均值,形成平均电压。 滤波器控制单元控制开关电容滤波器中的多个电容器单元。 比较单元将平均电压与第一电压进行比较以形成比较。 信号单元产生信号以指示处理器中的电路响应于比较而发起动作以使第一电压不会下降到低于阈值水平。

    Application of multiple voltage droop detection and instruction throttling instances with customized thresholds across a semiconductor chip
    67.
    发明授权
    Application of multiple voltage droop detection and instruction throttling instances with customized thresholds across a semiconductor chip 失效
    在半导体芯片上应用具有定制阈值的多个电压下降检测和指令节流实例

    公开(公告)号:US07599808B2

    公开(公告)日:2009-10-06

    申请号:US11848380

    申请日:2007-08-31

    Inventor: Roger D. Weekly

    CPC classification number: G06F1/3203 G06F1/28 G06F1/305 G06F1/3237 Y02D10/128

    Abstract: A method and system for applying multiple voltage droop detection and instruction throttling instances with customized thresholds across semiconductor chips. Environmental parameters are detected for various locations on a chip, and timing margins are determined for each location on the chip. An acceptable voltage droop for each location is determined based on the environmental parameters and the timing margins for the corresponding location. A droop threshold is then determined for each location based on the corresponding acceptable voltage droop determined for the corresponding location.

    Abstract translation: 一种用于跨半导体芯片应用具有定制阈值的多个电压下降检测和指令调节实例的方法和系统。 检测芯片上各个位置的环境参数,并为芯片上的每个位置确定定时裕度。 基于相应位置的环境参数和定时裕度来确定每个位置的可接受电压下降。 然后基于为相应位置确定的相应的可接受电压下降,为每个位置确定下垂阈值。

    Reference Plane Voids with Strip Segment for Improving Transmission Line Integrity over Vias
    68.
    发明申请
    Reference Plane Voids with Strip Segment for Improving Transmission Line Integrity over Vias 失效
    参考平面空隙带条段,用于提高传输线完整性在通孔上

    公开(公告)号:US20090184784A1

    公开(公告)日:2009-07-23

    申请号:US12015543

    申请日:2008-01-17

    Abstract: Reference plane voids with a strip segment for improving transmission line integrity over vias permits routing critical signal paths over vias, while increasing via insertion capacitance only slightly. The transmission line reference plane defines voids above (or below) signal-bearing plated-through holes (PTHs) that pass through a rigid substrate core, so that the signals are not degraded by an impedance mismatch that would otherwise be caused by shunt capacitance from the top (or bottom) of the signal-bearing PTHs to the transmission line reference plane. In order to provide increased routing density, signal paths are routed over the voids, but disruption of the signal paths by the voids is prevented by including a conductive strip through the voids that reduces the coupling to the signal-bearing PTHs and maintains the impedance of the signal path conductor.

    Abstract translation: 具有用于改善通孔上的传输线完整性的带段的参考平面空隙允许在通孔上路由关键信号路径,同时仅通过插入电容略微增加。 传输线参考平面定义了通过刚性衬底芯的信号承载电镀通孔(PTH)上方(或下方)的空隙,使得信号不会被阻抗失配降级,否则会由分流电容引起 信号承载PTH的顶部(或底部)到传输线参考平面。 为了提供增加的布线密度,信号路径被布置在空隙上,但是通过将导电条包括通过空隙来防止由空隙引起的信号路径的破坏,从而减小与信号承载PTH的耦合并维持 信号路径导体。

    Apparatus and method for selectively monitoring multiple voltages in an IC or other electronic chip
    70.
    发明授权
    Apparatus and method for selectively monitoring multiple voltages in an IC or other electronic chip 失效
    用于选择性地监测IC或其他电子芯片中的多个电压的装置和方法

    公开(公告)号:US07469199B2

    公开(公告)日:2008-12-23

    申请号:US11278848

    申请日:2006-04-06

    CPC classification number: G01R19/16552

    Abstract: An apparatus and method are provided for monitoring the voltage available in each domain of multiple voltage domains of a partitioned electronic chip. The apparatus comprises a single conductive link coupled to the chip, and further comprises a domain selection network having a single output and a plurality of switchable inputs, the output being connected to the single conductive link, and two inputs being connected to monitor respective voltage levels of two of the plurality of voltage domains. A control mechanism is disposed to operate the selection network, in order to selectively connect one of the inputs to the single conductive link, and a sensor device external to the electronic chip is connected to measure the monitored respective voltage levels of two of the plurality of voltage domains using the single conductive link.

    Abstract translation: 提供了一种用于监视分区电子芯片的多个电压域的每个域中可用电压的装置和方法。 该装置包括耦合到芯片的单个导电链路,并且还包括具有单个输出和多个可切换输入的域选择网络,该输出连接到单个导电链路,并且两个输入端被连接以监视相应的电压电平 的多个电压域中的两个。 设置控制机构以操作选择网络,以便选择性地将输入中的一个连接到单个导电链路,并且连接到电子芯片外部的传感器装置以测量所监测的多个 电压域使用单个导电链路。

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