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公开(公告)号:US20130045568A1
公开(公告)日:2013-02-21
申请号:US13654824
申请日:2012-10-18
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Kengo AKIMOTO
IPC: H01L21/336
CPC classification number: H01L29/7869 , H01L27/1225 , H01L29/45 , H01L29/78606
Abstract: Electric characteristics and reliability of a thin film transistor are impaired by diffusion of an impurity element into a channel region. The present invention provides a thin film transistor in which aluminum atoms are unlikely to be diffused to an oxide semiconductor layer. A thin film transistor including an oxide semiconductor layer including indium, gallium, and zinc includes source or drain electrode layers in which first conductive, layers including aluminum as a main component and second conductive layers including a high-melting-point metal material are stacked. An oxide semiconductor layer 113 is in contact with the second conductive layers and barrier layers including aluminum oxide as a main component, whereby diffusion of aluminum atoms to the oxide semiconductor layer is suppressed.
Abstract translation: 薄膜晶体管的电特性和可靠性受到杂质元素扩散到沟道区域的损害。 本发明提供一种薄膜晶体管,其中铝原子不可能扩散到氧化物半导体层。 包括铟,镓和锌的氧化物半导体层的薄膜晶体管包括源极或漏极电极层,其中以包含铝为主要成分的第一导电层和包括高熔点金属材料的第二导电层被堆叠。 氧化物半导体层113与包括氧化铝作为主要成分的第二导电层和阻挡层接触,从而抑制铝原子向氧化物半导体层的扩散。
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公开(公告)号:US20240371985A1
公开(公告)日:2024-11-07
申请号:US18776570
申请日:2024-07-18
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Shunpei YAMAZAKI , Hidekazu MIYAIRI , Kengo AKIMOTO , Kojiro SHIRAISHI
IPC: H01L29/66 , H01L21/46 , H01L27/12 , H01L29/786
Abstract: It is an object to provide a semiconductor device including a thin film transistor with favorable electric properties and high reliability, and a method for manufacturing the semiconductor device with high productivity. In an inverted staggered (bottom gate) thin film transistor, an oxide semiconductor film containing In, Ga, and Zn is used as a semiconductor layer, and a buffer layer formed using a metal oxide layer is provided between the semiconductor layer and a source and drain electrode layers. The metal oxide layer is intentionally provided as the buffer layer between the semiconductor layer and the source and drain electrode layers, whereby ohmic contact is obtained.
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公开(公告)号:US20240321903A1
公开(公告)日:2024-09-26
申请号:US18678215
申请日:2024-05-30
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Masayuki SAKAKURA , Yoshiaki OIKAWA , Shunpei YAMAZAKI , Junichiro SAKATA , Masashi TSUBUKU , Kengo AKIMOTO , Miyuki HOSOBA
IPC: H01L27/12 , G02F1/1343 , G02F1/1345 , G02F1/1368
CPC classification number: H01L27/124 , G02F1/134309 , G02F1/13454 , G02F1/1368 , H01L27/1225 , H01L27/1255 , G02F2202/10
Abstract: The semiconductor device includes a driver circuit portion including a driver circuit and a pixel portion including a pixel. The pixel includes a gate electrode layer having a light-transmitting property, a gate insulating layer, a source electrode layer and a drain electrode layer each having a light-transmitting property provided over the gate insulating layer, an oxide semiconductor layer covering top surfaces and side surfaces of the source electrode layer and the drain electrode layer and provided over the gate electrode layer with the gate insulating layer therebetween, a conductive layer provided over part of the oxide semiconductor layer and having a lower resistance than the source electrode layer and the drain electrode layer, and an oxide insulating layer in contact with part of the oxide semiconductor layer.
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公开(公告)号:US20230187453A1
公开(公告)日:2023-06-15
申请号:US18106072
申请日:2023-02-06
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Shunpei YAMAZAKI , Kengo AKIMOTO , Shigeki KOMORI , Hideki UOCHI , Rihito WADA , Yoko CHIBA
IPC: H01L27/12 , G02F1/1339 , G02F1/1345 , H01L29/417 , H01L29/786 , H01L29/66 , H10K59/131 , H01L29/04 , H01L29/24
CPC classification number: H01L27/1225 , G02F1/13392 , G02F1/13458 , H01L29/41733 , H01L29/7869 , H01L29/66969 , H10K59/131 , H01L27/124 , H01L29/04 , H01L29/24 , G09G2300/0804 , G02F1/13398 , H10K50/82
Abstract: A display device includes a pixel portion in which a pixel electrode layer is arranged in a matrix, and an inverted staggered thin film transistor having a combination of at least two kinds of oxide semiconductor layers with different amounts of oxygen is provided corresponding to the pixel electrode layer. In the periphery of the pixel portion in this display device, a pad portion is provided to be electrically connected to a common electrode layer formed on a counter substrate through a conductive layer made of the same material as the pixel electrode layer. One objection of our invention to prevent a defect due to separation of a thin film in various kinds of display devices is realized, by providing a structure suitable for a pad portion provided in a display panel.
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公开(公告)号:US20230170345A1
公开(公告)日:2023-06-01
申请号:US18101642
申请日:2023-01-26
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Shunpei YAMAZAKI , Kengo AKIMOTO , Shigeki KOMORI , Hideki UOCHI , Tomoya FUTAMURA , Takahiro KASAHARA
IPC: H01L27/02 , H01L27/12 , G02F1/133 , G02F1/1345 , H01L29/786
CPC classification number: H01L27/0251 , H01L27/0266 , H01L27/1225 , H01L27/124 , G02F1/13306 , G02F1/1345 , G02F1/13452 , G02F1/133 , H01L29/7869
Abstract: A protective circuit includes a non-linear element which includes a gate electrode, a gate insulating layer covering the gate electrode, a first oxide semiconductor layer overlapping with the gate electrode over the gate insulating layer, a channel protective layer overlapping with a channel formation region of the first oxide semiconductor layer, and a pair of a first wiring layer and a second wiring layer whose end portions overlap with the gate electrode over the channel protective layer and in which a conductive layer and a second oxide semiconductor layer are stacked. Over the gate insulating layer, oxide semiconductor layers with different properties are bonded to each other, whereby stable operation can be performed as compared with Schottky junction. Thus, the junction leakage can be reduced and the characteristics of the non-linear element can be improved.
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公开(公告)号:US20230085495A1
公开(公告)日:2023-03-16
申请号:US17989861
申请日:2022-11-18
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Shunpei YAMAZAKI , Junichiro SAKATA , Masashi TSUBUKU , Kengo AKIMOTO , Miyuki HOSOBA , Masayuki SAKAKURA , Yoshiaki OIKAWA
IPC: H01L21/477 , H01L27/12 , H01L29/66 , H01L21/02 , G02F1/1333 , G02F1/1368 , H01L29/786
Abstract: An object is to provide a display device with excellent display characteristics, where a pixel circuit and a driver circuit provided over one substrate are formed using transistors which have different structures corresponding to characteristics of the respective circuits. The driver circuit portion includes a driver circuit transistor in which a gate electrode layer, a source electrode layer, and a drain electrode layer are formed using a metal film, and a channel layer is formed using an oxide semiconductor. The pixel portion includes a pixel transistor in which a gate electrode layer, a source electrode layer, and a drain electrode layer are formed using an oxide conductor, and a semiconductor layer is formed using an oxide semiconductor. The pixel transistor is formed using a light-transmitting material, and thus, a display device with higher aperture ratio can be manufactured.
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公开(公告)号:US20220417484A1
公开(公告)日:2022-12-29
申请号:US17779717
申请日:2020-12-14
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Kengo AKIMOTO , Seiko INOUE , Daichi MISHIMA
Abstract: Color filters are used for color images obtained using imaging devices such as conventional image sensors. Imaging elements with color filters are sold, and an appropriate combination of the imaging element and a lens or the like is incorporated in an electronic device. Only providing a color filter to overlap a light-receiving region of an image sensor reduces the amount of light reaching the light-receiving region.
An imaging system of the present invention includes a solid-state imaging element without a color filter, a storage device, and a learning device. As a selection standard for reducing the amount of learning data, in an HSV color space, saturation is used, and selection is performed so that the saturation has optimal distribution. When colorization disclosed in this specification is performed, the colorization and object highlight processing can be performed at the same time.-
公开(公告)号:US20220393035A1
公开(公告)日:2022-12-08
申请号:US17886643
申请日:2022-08-12
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Hajime KIMURA , Kengo AKIMOTO , Masashi TSUBUKU , Toshinari SASAKI
IPC: H01L29/786 , G09G3/36 , H01L27/12
Abstract: A display device including a pixel having a memory. The pixel includes at least a display element, a capacitor, an inverter, and a switch. The switch is controlled with a signal held in the capacitor and a signal output from the inverter so that voltage is supplied to the display element. The inverter and the switch can be constituted by transistors with the same polarity. A semiconductor layer included in the pixel may be formed using a light-transmitting material. Moreover, a gate electrode, a drain electrode, and a capacitor electrode may be formed using a light-transmitting conductive layer. The pixel is formed using a light-transmitting material in such a manner, whereby the display device can be a transmissive display device while including a pixel having a memory.
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公开(公告)号:US20220237275A1
公开(公告)日:2022-07-28
申请号:US17615257
申请日:2020-06-09
Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Inventor: Shigeru TAMAKI , Kengo AKIMOTO , Hiromichi GODO , Koki INOUE , Yoshitaka DOZEN , Shunpei YAMAZAKI
Abstract: An authentication system for an electronic device with a high security level is provided. The authentication system includes a data retention means that accumulates first data related to a state of the electronic device being used by a first user registered in advance and generates a first data group, a first authentication means that authenticates a second user operating the electronic device as the first user and releases a locked state, a data acquisition means that acquires second data related to a state of the electronic device being used by the second user in a state where the locked state is released, and a second authentication means that authenticates the second user as the first user on the basis of the first data group and the second data and sets the electronic device to the locked state when the second user is not authenticated. The data retention means has a function of deleting the oldest first data of the plurality of pieces of the first data included in the first data group.
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公开(公告)号:US20220231056A1
公开(公告)日:2022-07-21
申请号:US17717277
申请日:2022-04-11
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Shunpei YAMAZAKI , Kengo AKIMOTO , Shigeki KOMORI , Hideki UOCHI , Tomoya FUTAMURA , Takahiro KASAHARA
IPC: H01L27/12 , G02F1/1368 , H01L29/786 , H01L29/66
Abstract: A protective circuit includes a non-linear element, which includes a gate electrode, a gate insulating layer covering the gate electrode, a pair of first and second wiring layers whose end portions overlap with the gate electrode over the gate insulating layer and in which a second oxide semiconductor layer and a conductive layer are stacked, and a first oxide semiconductor layer which overlaps with at least the gate electrode and which is in contact with the gate insulating layer, side face portions and part of top face portions of the conductive layer and side face portions of the second oxide semiconductor layer in the first wiring layer and the second wiring layer. Over the gate insulating layer, oxide semiconductor layers with different properties are bonded to each other, whereby stable operation can be performed as compared with Schottky junction. Thus, the junction leakage can be decreased and the characteristics of the non-linear element can be improved.
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