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公开(公告)号:US06630844B1
公开(公告)日:2003-10-07
申请号:US09887686
申请日:2001-08-22
申请人: Yan Chong , Chiakang Sung , Bonnie Wang , Khai Nguyen , Joseph Huang , Xiaobao Wang , Philip Pan , In Whan Kim , Gopi Rangan , Tzung-Chin Chang , Surgey Y. Shumarayev , Thomas H. White
发明人: Yan Chong , Chiakang Sung , Bonnie Wang , Khai Nguyen , Joseph Huang , Xiaobao Wang , Philip Pan , In Whan Kim , Gopi Rangan , Tzung-Chin Chang , Surgey Y. Shumarayev , Thomas H. White
IPC分类号: H03K190175
CPC分类号: H03K3/356008 , G01R19/155 , G06F1/24 , G06F1/28 , G06F1/3203 , H03K17/223
摘要: A supply voltage detection circuit determines when the voltage for any one of the power supply signals received by an integrated circuit device is below its steady state level, as may occur during a hot socket condition when the device is inserted in or removed from a powered-on system. A first detection circuit determines when the first supply voltage level is below its steady state level, and a second detection circuit determines when the second supply voltage level is below its steady state level. A logic circuit provides a detected condition signal that disables current flow through an input/output terminal associated with the supply voltage detection circuit. The circuit is able to rapidly detect hot socket conditions for a wide range of power supply signal; levels, including low supply signal levels, while limiting leakage current effects.
摘要翻译: 电源电压检测电路确定由集成电路装置接收的任何一个电源信号的电压何时低于其稳定状态电平,这可能是在插座状态期间可能发生的, 在系统上。 第一检测电路确定第一电源电压何时低于其稳态电平,第二检测电路确定第二电源电压何时低于其稳态电平。 逻辑电路提供检测条件信号,其禁止通过与电源电压检测电路相关联的输入/输出端子的电流流动。 该电路能够快速检测广泛的电源信号的热插座状况; 电平,包括低电平信号电平,同时限制漏电流效应。
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公开(公告)号:US09711189B1
公开(公告)日:2017-07-18
申请号:US13209307
申请日:2011-08-12
申请人: Bonnie I. Wang , Chiakang Sung , Xiaobao Wang , Yan Chong , Joseph Huang , Khai Nguyen , Pradeep Nagarajan
发明人: Bonnie I. Wang , Chiakang Sung , Xiaobao Wang , Yan Chong , Joseph Huang , Khai Nguyen , Pradeep Nagarajan
IPC分类号: G11C5/14 , G11C11/4074
CPC分类号: G11C5/147 , G11C11/4074 , G11C19/00 , G11C29/021 , G11C29/028
摘要: A buffer circuit with an adjustable reference voltage is presented. The buffer circuit with adjustable reference voltage has an input buffer circuit that is connected to a data input and a reference voltage. The output of the input buffer circuit is connected an eye monitor circuit that generates a transition signal based on a number of transitions of an output of the input buffer circuit. The output from the eye monitor circuit is that processed by a calibration control circuit that transmits a selection signal to a multiplexer. The multiplexer selects a level of the reference voltage based on the selection signal from the calibration control circuit.
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公开(公告)号:US08575957B2
公开(公告)日:2013-11-05
申请号:US13324354
申请日:2011-12-13
申请人: Philip Pan , Chiakang Sung , Joseph Huang , Yan Chong , Bonnie I. Wang
发明人: Philip Pan , Chiakang Sung , Joseph Huang , Yan Chong , Bonnie I. Wang
IPC分类号: G06F7/38 , H03K19/173
CPC分类号: H03K19/017581 , H03K19/17744
摘要: Method and circuitry for implementing high speed multiple-data-rate interface architectures for programmable logic devices. The invention partitions I/O pins and their corresponding registers into independent multiple-data rate I/O modules each having at least one pin dedicated to the strobe signal DQS and others to DQ data signals. The modular architecture facilitates pin migration from one generation of PLDs to the next larger generation.
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公开(公告)号:US08565034B1
公开(公告)日:2013-10-22
申请号:US13249954
申请日:2011-09-30
申请人: Sean Shau-Tu Lu , Joseph Huang , Yan Chong , Pradeep Nagarajan , Chiakang Sung
发明人: Sean Shau-Tu Lu , Joseph Huang , Yan Chong , Pradeep Nagarajan , Chiakang Sung
CPC分类号: G11C7/22 , G06F13/1689
摘要: Integrated circuits may include memory interface circuitry operable to communicate with system memory. The memory interface circuitry may receive data and data strobe signals from system memory during read operations. The memory interface circuitry may include de-skew circuitry and dynamic variation compensation circuitry. The de-skew circuitry may be configured during calibration procedures to reduce skew between the data and data strobe signals. The dynamic variation compensation circuitry may be used in real time to compensate for variations in operating conditions. The dynamic variation compensation circuitry may include a phase generation circuit operable to generate data strobe signals having different phases, an edge detection circuit operable to detect leading/trailing edge failures, a control circuit operable to control a counter, and an adjustable delay circuit that is controlled by the counter and that is operable to properly position the data signal with respect to its corresponding data strobe signal.
摘要翻译: 集成电路可以包括可操作以与系统存储器通信的存储器接口电路。 存储器接口电路可以在读取操作期间从系统存储器接收数据和数据选通信号。 存储器接口电路可以包括去偏移电路和动态变化补偿电路。 可以在校准过程期间配置去偏移电路,以减少数据和数据选通信号之间的偏差。 可以实时地使用动态变化补偿电路来补偿操作条件的变化。 动态变化补偿电路可以包括可产生具有不同相位的数据选通信号的相位产生电路,可操作以检测前沿/后沿故障的边缘检测电路,可操作以控制计数器的控制电路和可调延迟电路, 由计数器控制,并且可操作以相对于其对应的数据选通信号适当地定位数据信号。
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公开(公告)号:US08305121B1
公开(公告)日:2012-11-06
申请号:US13168499
申请日:2011-06-24
申请人: Joseph Huang , Chiakang Sung , Philip Pan , Yan Chong , Andy L. Lee , Brian D. Johnson
发明人: Joseph Huang , Chiakang Sung , Philip Pan , Yan Chong , Andy L. Lee , Brian D. Johnson
IPC分类号: H03L7/00
CPC分类号: H03L7/0812 , G11C7/22 , G11C7/222 , H03L7/0805
摘要: A programmable memory interface circuit includes a programmable DLL delay chain, a phase offset control circuit and a programmable DQS delay chain. The DLL delay chain uses a set of serially connected delay cells, a programmable switch, a phase detector and a digital counter to generate a coarse phase shift control setting. The coarse phase shift control setting is then used to pre-compute a static residual phase shift control setting or generate a dynamic residual phase shift control setting, one of which is chosen by the phase offset control circuit to be added to or subtracted from the coarse phase shift control setting to generate a fine phase shift control setting. The coarse and fine phase shift control settings work in concert to generate a phase-delayed DQS signal that is center-aligned to its associated DQ signals.
摘要翻译: 可编程存储器接口电路包括可编程DLL延迟链,相位偏移控制电路和可编程DQS延迟链。 DLL延迟链使用一组串行连接的延迟单元,可编程开关,相位检测器和数字计数器来产生粗略的相移控制设置。 然后,粗略的相移控制设置用于预先计算静态残留相移控制设置或生成动态残留相移控制设置,其中一个由相位偏移控制电路选择以被加到或从粗略 相移控制设置,以产生精细的相移控制设置。 粗调和精细相移控制设置一致地产生相位延迟的DQS信号,其中心对准其相关联的DQ信号。
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公开(公告)号:US20120106264A1
公开(公告)日:2012-05-03
申请号:US13349228
申请日:2012-01-12
申请人: Yan Chong , Bonnie I. Wang , Chiakang Sung , Joseph Huang , Michael H.M. Chu
发明人: Yan Chong , Bonnie I. Wang , Chiakang Sung , Joseph Huang , Michael H.M. Chu
CPC分类号: G11C7/22 , G11C7/1066 , G11C7/222
摘要: Circuits, methods, and apparatus for memory interfaces that compensate for skew between a clock signal and DQ/DQS signals that may be caused by a fly-by routing topology. The skew is compensated by clocking the DQ/DQS signals with a phase delayed clock signal, where the phase delay has been calibrated. In one example calibration routine, a clock signal is provided to a receiving device. A DQ/DQS signal is also provided and the timing of their reception compared. A delay of the DQ/DQS signal is changed incrementally until the DQ/DQS signal is aligned with the clock signal at the receiving device. This delay is then used during device operation to delay a signal that clocks registers providing the DQ/DQS signals. Each DQ/DQS group can be aligned to the clock, or the DQS and DQ signals in a group may be independently aligned to the clock at the receiving device.
摘要翻译: 用于存储器接口的电路,方法和装置,其补偿可能由飞越路由拓扑引起的时钟信号和DQ / DQS信号之间的偏差。 通过使用相位延迟时钟信号对DQ / DQS信号进行时钟补偿,其中相位延迟已校准。 在一个示例性校准例程中,向接收设备提供时钟信号。 还提供了DQ / DQS信号,并将其接收的定时进行比较。 DQ / DQS信号的延迟逐渐改变,直到DQ / DQS信号与接收设备的时钟信号对齐。 然后在器件操作期间使用该延迟来延迟提供DQ / DQS信号的寄存器的信号。 每个DQ / DQS组可以与时钟对齐,或者组中的DQS和DQ信号可以独立地对准接收器件上的时钟。
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公开(公告)号:US20110221497A1
公开(公告)日:2011-09-15
申请号:US13019277
申请日:2011-02-01
申请人: Yan Chong , Joseph Huang , Chiakang Sung , Eric Choong-Yin Chang , Peter Boyle , Adam J. Wright
发明人: Yan Chong , Joseph Huang , Chiakang Sung , Eric Choong-Yin Chang , Peter Boyle , Adam J. Wright
CPC分类号: H03K5/135 , G01R31/3016 , G01R31/31725 , G01R31/318516 , H03K5/14 , H03K5/1504
摘要: Delay associated with each of two signals along respective transmission paths is accurately measured using a delay measurement circuit that is fabricated in situ on the actual device where the circuitry for propagating the two signals is fabricated. Thus, the measured delay associated with each of the two signals is subject to the same fabrication-dependent attributes that affect the actual circuitry through which the two signals will be propagated during operation of the device. The skew between the two signals is quantified as the difference in the measured delays. Coarse and fine delay modules are defined within the transmission path of each of the two signals. Based on the measured skew between the two signals, the coarse and fine delay modules are appropriately set to compensate for the skew. The appropriately settings for the coarse and fine delay modules can be stored in non-volatile memory elements.
摘要翻译: 使用延迟测量电路精确测量与各传输路径中的两个信号中的每一个相关的延迟,该延迟测量电路在实际设备上制造,其中制造用于传播两个信号的电路。 因此,与两个信号中的每一个相关联的测量的延迟受到影响在设备操作期间两个信号将被传播的实际电路的相同制造相关属性。 两个信号之间的偏差被量化为测量延迟的差。 在两个信号中的每一个的传输路径内定义粗略和精细的延迟模块。 基于两个信号之间的测量偏差,粗调和精细延迟模块被适当地设置以补偿偏斜。 粗略和精细延迟模块的适当设置可以存储在非易失性存储器元件中。
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公开(公告)号:US07969215B1
公开(公告)日:2011-06-28
申请号:US12467681
申请日:2009-05-18
申请人: Joseph Huang , Chiakang Sung , Philip Pan , Yan Chong , Andy L. Lee , Brian D. Johnson
发明人: Joseph Huang , Chiakang Sung , Philip Pan , Yan Chong , Andy L. Lee , Brian D. Johnson
IPC分类号: H03L7/00
CPC分类号: H03L7/0812 , G11C7/22 , G11C7/222 , H03L7/0805
摘要: A programmable memory interface circuit includes a programmable DLL delay chain, a phase offset control circuit and a programmable DQS delay chain. The DLL delay chain uses a set of serially connected delay cells, a programmable switch, a phase detector and a digital counter to generate a coarse phase shift control setting. The coarse phase shift control setting is then used to pre-compute a static residual phase shift control setting or generate a dynamic residual phase shift control setting, one of which is chosen by the phase offset control circuit to be added to or subtracted from the coarse phase shift control setting to generate a fine phase shift control setting. The coarse and fine phase shift control settings work in concert to generate a phase-delayed DQS signal that is center-aligned to its associated DQ signals.
摘要翻译: 可编程存储器接口电路包括可编程DLL延迟链,相位偏移控制电路和可编程DQS延迟链。 DLL延迟链使用一组串行连接的延迟单元,可编程开关,相位检测器和数字计数器来产生粗略的相移控制设置。 然后,粗略的相移控制设置用于预先计算静态残留相移控制设置或生成动态残留相移控制设置,其中一个由相位偏移控制电路选择以被加到或从粗略 相移控制设置,以产生精细的相移控制设置。 粗调和精细相移控制设置一致地产生相位延迟的DQS信号,其中心对准其相关联的DQ信号。
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公开(公告)号:US20110074477A1
公开(公告)日:2011-03-31
申请号:US12642502
申请日:2009-12-18
申请人: Pradeep Nagarajan , Yan Chong , Chiakang Sung , Joseph Huang
发明人: Pradeep Nagarajan , Yan Chong , Chiakang Sung , Joseph Huang
IPC分类号: H03L7/06
CPC分类号: H03L7/0814 , H03K5/134 , H03K5/1565 , H03K2005/00065
摘要: A feedback loop circuit includes a phase detector and delay circuits. The phase detector generates an output signal based on a delayed periodic signal. The delay circuits are coupled in a delay chain that delays the delayed periodic signal. Each of the delay circuits comprises variable delay blocks and fixed delay blocks that are coupled to form at least two delay paths for an input signal through the delay circuit to generate a delayed output signal. Delays of the variable delay blocks in the delay circuits vary based on the output signal of the phase detector. Each of the delay circuits reroutes the input signal through a different one of the delay paths to generate the delayed output signal based on the output signal of the phase detector during operation of the feedback loop circuit. Each of the variable delay blocks and the fixed delay blocks is inverting.
摘要翻译: 反馈回路包括相位检测器和延迟电路。 相位检测器基于延迟周期信号产生输出信号。 延迟电路在延迟链中耦合,延迟链延迟了延迟的周期信号。 每个延迟电路包括可变延迟块和固定延迟块,其被耦合以形成用于通过延迟电路的输入信号的至少两个延迟路径以产生延迟的输出信号。 延迟电路中的可变延迟块的延迟基于相位检测器的输出信号而变化。 每个延迟电路通过不同的一个延迟路径重新路由输入信号,以在反馈回路电路的操作期间基于相位检测器的输出信号产生延迟的输出信号。 每个可变延迟块和固定延迟块都是反相的。
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公开(公告)号:US07321518B1
公开(公告)日:2008-01-22
申请号:US10757928
申请日:2004-01-15
申请人: Joseph Huang , Chiakang Sung , Philip Pan , Yan Chong
发明人: Joseph Huang , Chiakang Sung , Philip Pan , Yan Chong
IPC分类号: G11C7/00 , G11C29/00 , G06F7/38 , H03K19/177
CPC分类号: H03K19/1776 , G11C29/802 , G11C2229/726 , H03K19/17764
摘要: An integrated circuit (IC) includes a redundancy feature. The redundancy feature is provided by a redundancy circuitry within the IC. The redundancy circuitry is configured to provide the redundancy by using a decoder circuitry. The decoder circuitry receives and decodes coded defect information from a set of circuit elements adapted to provide the coded defect information.
摘要翻译: 集成电路(IC)包括冗余特征。 冗余特性由IC内的冗余电路提供。 冗余电路被配置为通过使用解码器电路来提供冗余。 解码器电路从适于提供编码缺陷信息的一组电路元件接收并解码编码的缺陷信息。
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