Widefield microscope illumination system and widefield illumination method
    72.
    发明授权
    Widefield microscope illumination system and widefield illumination method 有权
    宽幅显微镜照明系统和广场照明方法

    公开(公告)号:US09239456B2

    公开(公告)日:2016-01-19

    申请号:US14111759

    申请日:2012-04-11

    申请人: Jonas Foelling

    发明人: Jonas Foelling

    摘要: A widefield microscope illumination system and a method for illumination, the system having a microscope objective with an optical objective axis, an illumination light source sending widefield illumination light along illumination beam paths having corresponding illumination axes along which the illumination light penetrates into the microscope objective through illumination light entry sites located within a predetermined illumination light entry area, a spatially resolving light detector detecting detected light sent from an illuminated sample through the microscope objective along a detected light beam path, and an automatic illumination light beam path manipulation device, controlled by a control system, which is arranged in front of the microscope objective in relation to the direction of the illumination light beam path, and by which illumination light beam path manipulation device the illumination axes are automatically movable at time intervals to a plurality of illumination light entry sites.

    摘要翻译: 一种宽幅显微镜照明系统和一种照明方法,该系统具有具有光学物镜轴的显微镜物镜,照明光源沿着具有对应的照明轴的照明光束路径发送宽场照明光,照明光线沿着该照明轴照射到显微镜物镜中 位于预定照明光入射区域内的照明光进入位置,沿着检测到的光束路径检测从被照射的样品通过显微镜物镜发送的检测光的空间分辨光检测器,以及自动照明光束路径操纵装置, 控制系统,其布置在相对于照明光束路径的方向在显微镜物镜的前方,并且照明光束路径操纵装置的照明轴可以以时间间隔自动地移动到多个照明l 入境点。

    External beam delivery system using catadioptric objective with aspheric surfaces
    73.
    发明授权
    External beam delivery system using catadioptric objective with aspheric surfaces 有权
    使用具有非球面表面的反射折射物镜的外光束输送系统

    公开(公告)号:US08896917B2

    公开(公告)日:2014-11-25

    申请号:US12737062

    申请日:2009-06-15

    摘要: An inspection system including a catadioptric objective that facilitates dark-field inspection is provided. The objective includes an outer element furthest from the specimen having an outer element partial reflective surface oriented toward the specimen, an inner element nearest the specimen having a center lens comprising an inner element partial reflective surface oriented away from the specimen, and a central element positioned between the outer lens and the inner lens. At least one of the outer element, inner element, and central element has an aspheric surface. The inner element is spatially configured to facilitate dark-field inspection of the specimen.

    摘要翻译: 提供了一种包括有助于暗视野检查的反折射目标的检查系统。 该目的包括离样品最远的外部元件,其具有朝向试样的外部元件部分反射表面,最靠近试样的内部元件具有中心透镜,该中心透镜包括远离试样取向的内部元件部分反射表面, 在外透镜和内透镜之间。 外部元件,内部元件和中心元件中的至少一个具有非球面。 内部元件在空间上构造以便于对样品进行暗视场检查。

    MICROSCOPE SYSTEM AND ILLUMINATION INTENSITY ADJUSTING METHOD
    74.
    发明申请
    MICROSCOPE SYSTEM AND ILLUMINATION INTENSITY ADJUSTING METHOD 有权
    微观系统和照明强度调节方法

    公开(公告)号:US20130077159A1

    公开(公告)日:2013-03-28

    申请号:US13615561

    申请日:2012-09-13

    申请人: Yosuke TANI

    发明人: Yosuke TANI

    IPC分类号: G02B21/12 G02B21/10

    CPC分类号: G02B21/125

    摘要: A microscope system and an illumination intensity adjusting method that can automatically adjust an illumination intensity when a bright-field illumination system and a dark-field illumination system are simultaneously used are provided. The microscope system includes: a stage on which a specimen is placed; an objective lens that converges observation light from at least the specimen S on the stage; a bright-field illumination unit configured to emit bright-field illumination light that is illumination light aperture to the specimen for a bright-field observation; a dark-field illumination unit configured to emit dark-field illumination light that is illumination light aperture to the specimen for a dark-field observation; and an illumination intensity control unit configured to adjust an illumination intensity of at least one of the bright-field illumination light and the dark-field illumination light according to the illumination intensity of the other one.

    摘要翻译: 提供一种显微镜系统和照明强度调节方法,其能够在同时使用亮场照明系统和暗场照明系统时自动调节照明强度。 显微镜系统包括:放置试样的阶段; 将来自至少样本S的观察光收敛在舞台上的物镜; 一个明场照明单元,被配置为向所述样本发射作为照明光孔的明场照明光进行明视场观察; 暗场照明单元,被配置为发射暗场照明光,所述暗场照明光是对所述样本进行暗视场观察的照明光孔; 以及照明强度控制单元,被配置为根据另一个的照明强度来调整所述亮场照明光和所述暗视场照明光中的至少一个的照明强度。

    Device and method for inspecting an object
    75.
    发明申请
    Device and method for inspecting an object 失效
    用于检查物体的装置和方法

    公开(公告)号:US20050259245A1

    公开(公告)日:2005-11-24

    申请号:US10524687

    申请日:2003-08-21

    摘要: The invention relates to a device and method for inspecting an object (2) involving the use of a bright field illumination beam path (4) of a bright field light source (5), said beam path being formed so that it passes through the projection optics (3), and involving the use or a dark field illumination beam path (6) of a dark field light source (7), this beam path being formed so that it also passes through the projection optics (3). The object (2) can be projected by the projection optics (3) onto the least one detector (8), and the object (2) is simultaneously illuminated by both light sources (5, 7). In order to simultaneously detect bright field images and dark field images without involving complicated filtering operations, the inventive device or method for inspecting an object (2) is characterized in that the light used for the dark field illumination is pulsed and in that the pulse intensity of the light used for the dark field illumination is greater by at least one order of magnitude than the intensity of the continuous light, which is used for the bright field illumination, during a pulsed interval.

    摘要翻译: 本发明涉及一种用于检查涉及使用明场光源(5)的亮场照明光束路径(4)的物体(2)的装置和方法,所述光束路径被形成为使得其通过突起 光学器件(3),并且涉及暗场光源(7)的使用或暗场照明光束路径(6),该光束路径被形成为使得其也穿过投影光学器件(3)。 物体(2)可以被投影光学器件(3)投影到最少一个检测器(8)上,物体(2)同时被两个光源(5,7)照射。 为了同时检测亮场图像和暗场图像而不涉及复杂的滤波操作,本发明的用于检测物体(2)的装置或方法的特征在于用于暗场照明的光是脉冲的,并且脉冲强度 用于暗场照明的光比在脉冲间隔期间用于亮场照明的连续光的强度至少大一个数量级。

    Microscope illumination device and adapter therefor
    76.
    发明申请
    Microscope illumination device and adapter therefor 有权
    显微镜照明装置及适配器

    公开(公告)号:US20050237605A1

    公开(公告)日:2005-10-27

    申请号:US11106819

    申请日:2005-04-15

    CPC分类号: G02B21/12 G02B21/10 G02B21/16

    摘要: An illumination system for a microscope, including a light source for generating light to illuminate a sample for microscopic observation, at least one collimating lens for collimating light generated by the light source, and a darkfield condenser for receiving collimated light and directing a hollow cone of light onto the sample under observation. The system optionally includes an adapter for enhancing economy of light transmission from the light source to the specimen, the adapter having a centrally disposed spacer and a plurality of optical fibers surrounding the spacer, to generate a hollow cylinder of light for transmission to the darkfield condenser. The system provides improved resolution and contrast, and is well suited for adaptation to fluorescence microscopy techniques.

    摘要翻译: 一种用于显微镜的照明系统,包括用于产生用于照明用于显微镜观察的样品的光的光源,至少一个用于准直光源产生的光的准直透镜,以及用于接收准直光的暗场冷凝器, 在观察下点亮样品。 该系统可选地包括用于增强从光源到样本的光透射的经济性的适配器,适配器具有居中设置的间隔物和围绕间隔物的多个光纤,以产生中空圆柱形的光以传输到暗场冷凝器 。 该系统提供改进的分辨率和对比度,并且非常适合于适应荧光显微镜技术。

    Optical probe having an imaging apparatus
    77.
    发明授权
    Optical probe having an imaging apparatus 失效
    具有成像装置的光学探头

    公开(公告)号:US6153873A

    公开(公告)日:2000-11-28

    申请号:US81989

    申请日:1998-05-20

    摘要: An imaging apparatus includes a collection of optical elements arranged in a predetermined sequence and cooperable to define a dark-field optical arrangement and a bright-field optical arrangement. The dark-field optical arrangement and a bright-field optical arrangement may be defined along the same or different optical path(s). At least one of the optical elements is operative to enable at least one of the dark field or the bright-field optical arrangements. In a first embodiment said one optical element is movable from a first to a second position to enable either the dark-field or the bright-field optical arrangement. In a second embodiment said one optical element is operable to enable simultaneously both the dark-field and the bright-field optical arrangements. Both opaque objects and phase objects in a fluid stream are able to be detected and quantified.

    摘要翻译: 一种成像装置包括以预定顺序布置的光学元件的集合,并且可配合以定义暗视场光学布置和亮场光学布置。 可以沿相同或不同的光路限定暗场光学布置和亮场光学布置。 光学元件中的至少一个可操作以使得暗场或明场光学布置中的至少一个能够实现。 在第一实施例中,所述一个光学元件可从第一位置移动到第二位置,以使得能够进行暗场或亮场光学布置。 在第二实施例中,所述一个光学元件可操作以同时实现暗场和亮场光学布置。 能够检测和量化流体流中的不透明物体和相位物体。

    Illuminating apparatus for a microscope
    78.
    发明授权
    Illuminating apparatus for a microscope 失效
    显微镜照明装置

    公开(公告)号:US5517353A

    公开(公告)日:1996-05-14

    申请号:US248210

    申请日:1994-05-24

    IPC分类号: G02B7/16 G02B21/12 G02B21/06

    CPC分类号: G02B21/125 G02B7/16

    摘要: An illuminating apparatus for a microscope provided with a revolver capable of selecting one of a plurality of objective lenses and inserting it into an observation optical path comprises an illuminating light source for illuminating a sample, a power source for supplying electric power to the illuminating light source, and a control device responsive to the changeover of the revolver from one of the objective lenses to another to stop the supply of electric power to the illuminating light source.

    摘要翻译: 一种具有能够选择多个物镜中的一个物镜并将其插入到观察光路中的左轮手枪的显微镜照明装置,包括用于照射样本的照明光源,向照明光源供给电力的电源 以及控制装置,其响应于从所述物镜之一切换到所述左轮手枪以停止向所述照明光源的电力供应。

    Operation microscope
    79.
    发明授权
    Operation microscope 失效
    操作显微镜

    公开(公告)号:US4783159A

    公开(公告)日:1988-11-08

    申请号:US31523

    申请日:1987-03-26

    摘要: An operation microscope in which the optical axis of the illumination optical system is in alignment with the optical axis of the objective lens of the observation optical system and the illumination rays pass along the optical axis of the objective lens. Due to this construction, it is possible to sufficiently illuminate the deep parts of diseased tissue in, for example, a cataract operation, and very easy to confirm whether or not any part of the lens remains in the capsula lentis after the removal of the lens of the eye.

    摘要翻译: 照明光学系统的光轴与观察光学系统的物镜的光轴对准并且照射光沿着物镜的光轴的操作显微镜。 由于这种结构,可以在例如白内障手术中充分地照射患病组织的深部,并且非常容易地确认在移除透镜后透镜的任何部分是否保留在薄膜囊中 的眼睛。