Abstract:
The present invention provides a semiconductor device protective structure. The structure comprises a die with contact metal balls formed thereon electrically coupling with a print circuit board. A back surface of the die is directly adhered on a substrate and a first buffer layer is formed on the substrate. The substrate is configured over a second buffer layer such that the second buffer layer substantially encompasses the whole substrate to decrease damage to the substrate when the side of the substrate is collided with an external object.
Abstract:
The present invention discloses a structure of package comprising: a substrate with a die receiving through hole; a base attached on a lower surface of the substrate; a die disposed within the die receiving through hole and attached on the base; a dielectric layer formed on the die and the substrate; a re-distribution layer (RDL) formed on the dielectric layer and coupled to the die; a protection layer formed over the RDL; and pluralities of pads formed on the protection layer and coupled to the RDL. The RDL is made from an alloy comprising Ti/Cu/Au alloy or Ti/Cu/Ni/Au alloy.
Abstract translation:本发明公开了一种包装体的结构,其特征在于,包括:具有模头的通孔的基板; 基底,其附接在所述基底的下表面上; 模具,设置在模具接收通孔内并附接在基座上; 形成在所述管芯和所述基板上的电介质层; 在所述电介质层上形成并耦合到所述管芯的再分布层(RDL); 形成在RDL上的保护层; 以及形成在保护层上并耦合到RDL的多个焊盘。 RDL由包含Ti / Cu / Au合金或Ti / Cu / Ni / Au合金的合金制成。
Abstract:
The present invention provides a semiconductor device protective structure. The structure comprises a die with contact metal balls formed thereon electrically coupling with a print circuit board. A back surface of the die is directly adhered on a substrate and a first buffer layer is formed on the substrate. The substrate is configured over a second buffer layer such that the second buffer layer substantially encompasses the whole substrate to decrease damage to the substrate when the side of the substrate is collided with an external object.
Abstract:
The present invention provides a structure of memory card comprising a substrate with a die receiving cavity formed within an upper surface of the substrate and a through hole structure formed there through, traces formed within the substrate; a first die disposed within the die receiving cavity; a first dielectric layer formed on the first die and the substrate; a first re-distribution layer (RDL) formed on the first dielectric layer, wherein the first RDL is coupled to the first die and the traces; a second dielectric layer formed over the first RDL; a second die disposed on the second dielectric layer; a third dielectric layer formed over the second dielectric layer and the second die; a second RDL formed on the third dielectric layer, wherein the second RDL is coupled to the second die and the first RDL; a forth dielectric layer formed over the second RDL; a third die formed over the forth dielectric layer and coupled to the second RDL; a fifth dielectric layer formed around the third die; and a plastic cover enclosed the first, second and third dice.
Abstract:
The present invention provides a semiconductor device protective structure. The structure comprises a die with contact metal balls formed thereon electrically coupling with a print circuit board. A back surface of the die is directly adhered on a substrate and a first buffer layer is formed on the substrate. The substrate is configured over a second buffer layer such that the second buffer layer substantially encompasses the whole substrate to decrease damage to the substrate when the side of the substrate is collided with an external object.
Abstract:
The present invention provides a semiconductor device protective structure. The structure comprises a die with contact metal balls formed thereon electrically coupling with a print circuit board. A back surface of the die is directly adhered on a substrate and a first buffer layer is formed on the substrate. The substrate is configured over a second buffer layer such that the second buffer layer substantially encompasses the whole substrate to decrease damage to the substrate when the side of the substrate is collided with an external object.
Abstract:
The present invention provides an image sensor module structure comprising a substrate with a die receiving cavity formed within an upper surface of the substrate and conductive traces within the substrate and a die having a micro lens disposed within the die receiving cavity. A dielectric layer is formed on the die and the substrate, a re-distribution conductive layer (RDL) is formed on the dielectric layer, wherein the RDL is coupled to the die and the conductive traces and the dielectric layer has an opening to expose the micro lens. A lens holder is attached on the substrate and the lens holder has a lens attached an upper portion of the lens holder. A filter is attached between the lens and the micro lens. The structure further comprises a passive device on the upper surface of the substrate within the lens holder.
Abstract:
The present invention discloses a structure of package comprising: a substrate with a die receiving through hole; a base attached on a lower surface of the substrate; a die disposed within the die receiving through hole and attached on the base; a dielectric layer formed on the die and the substrate; a re-distribution layer (RDL) formed on the dielectric layer and coupled to the die; a protection layer formed over the RDL; and pluralities of pads formed on the protection layer and coupled to the RDL. The RDL is made from an alloy comprising Ti/Cu/Au alloy or Ti/Cu/Ni/Au alloy.
Abstract translation:本发明公开了一种包装体的结构,其特征在于,包括:具有模头的通孔的基板; 基底,其附接在所述基底的下表面上; 模具,设置在模具接收通孔内并附接在基座上; 形成在所述管芯和所述基板上的电介质层; 在所述电介质层上形成并耦合到所述管芯的再分布层(RDL); 形成在RDL上的保护层; 以及形成在保护层上并耦合到RDL的多个焊盘。 RDL由包含Ti / Cu / Au合金或Ti / Cu / Ni / Au合金的合金制成。