摘要:
In one example embodiment, a semiconductor system includes a first chip configured to generate first temperature information of the first chip, the first temperature information being based on at least one temperature measurement using at least one first temperature sensor. The semiconductor system further includes a second chip including a second temperature sensor configured to be controlled based on at least the first temperature information.
摘要:
A semiconductor memory device capable of synchronous/asynchronous operation and data input/output method thereof are provided. The semiconductor memory device includes a memory cell array, a peripheral circuit configured to write data to a cell in the memory cell array and to read data from the cell, and a bypass control unit configured to control a late write operation and a bypass operation of the peripheral circuit according to mode conversion of the semiconductor memory device. Accordingly, data coherency can be maintained. In addition, dummy cycle time that may occur during the mode conversion can be prevented by generating a mode conversion signal only in response to toggling of a clock signal.
摘要:
Provided are a level shifter and a semiconductor device having an OFF-chip driver (OCD) using the same. The level shifter includes a plurality of series connected logic gates receiving a first-state input signal having a first power supply voltage level and generating a level-shifted first-state output signal having a second power supply voltage level. The logic gates receive as power supply voltages at least one intermediate power supply voltage having at least one voltage level intermediate between the first power supply voltage level and the second power supply voltage level, and an intermediate power supply voltage applied to the present logic gate is equal to or higher than an intermediate power supply voltage applied to the previous logic gate.
摘要:
A semiconductor memory device which includes an internal voltage generator circuit for adjusting an external power supply voltage and generating first and second internal power supply voltages. The first internal power supply voltage is supplied to a memory cell array via a first power supply line, and the second internal power supply voltage is supplied to a peripheral circuit via a second power supply line. A control circuit controls the internal voltage generator circuit so that the levels of the first and second internal power supply voltages vary depending on a mode of operation.
摘要:
Ferroelectric memory devices contain an array of ferroelectric memory cells therein and control circuits for enabling the performance of nondestructive read operations. The memory cells of a device contain a ferroelectric memory cell and each memory cell contains a ferroelectric capacitor having a first electrode electrically coupled to a plate line and an access transistor electrically coupled in series between a bit line and a second electrode of the ferroelectric capacitor. A decoder circuit is also provided. The decoder circuit is electrically coupled to the access transistor of the memory cell by a word line and performs the function of, among other things, turning on the access transistor during a read time interval. According to a preferred aspect of the present invention, a pulse generator circuit is provided for initiating nondestructive reading of a quiescent polarization state of the ferroelectric capacitor by applying a single read pulse to the plate line to sweep a polarization state of the ferroelectric capacitor along a noncoercive portion of its hysteresis curve, during the read time interval. A sense amplifier circuit is also provided. The sense amplifier circuit also has a first input electrically coupled to the bit line and a second input electrically coupled to a reference signal line. The sense amplifier performs the function of driving the bit line to a first potential which represents the quiescent polarization state of the ferroelectric capacitor, preferably before termination of the single read pulse.
摘要:
The speed gap between rise and fall times of a buffer biased by a power supply having a power supply voltage, the speed gap varying in a first manner with respect to the power supply voltage and in a second manner inverse to the first manner with respect to a bias current supplied to the buffer, is controlled by generating the bias current such that the bias current varies inversely with respect to the power supply voltage, thereby compensating for fluctuations in the power supply voltage and maintaining the speed gap within a predetermined range when the power supply voltage is greater than a power supply voltage threshold level. The buffer may include a bias transistor controlling the bias current, with the bias current controlled by regulating the differential voltage applied to a control electrode of the bias transistor with an inverse voltage regulator including a control voltage generator for generating a control voltage varying directly with respect to the power supply voltage when the power supply voltage is less than the power supply voltage threshold level and remaining at a control voltage set point level when the power supply voltage is greater than the power supply voltage threshold level, a current feedback regulator for varying the feedback current directly with respect to the power supply voltage, and an output voltage generator for generating the differential voltage from the feedback current and the control voltage such that when the control voltage is at the control voltage set point level, the differential voltage varies inversely with respect to the feedback current.
摘要:
A method of operating a memory device includes: generating an internal read command in response to a received masked write command, the internal read command being generated one of (i) during a write latency associated with the received masked write command, (ii) after receipt of a first bit of masked write data among a plurality of bits of masked write data, and (iii) in synchronization with a rising or falling edge of a clock signal received with an address signal corresponding to the masked write command; reading, in response to the internal read command, a plurality of bits of data stored in a plurality of memory cells, the plurality of memory cells corresponding to the address signal; and storing, in response to an internal write command, the plurality of bits of masked write data in the plurality of memory cells.
摘要:
A method of operating a memory device includes: generating an internal read command in response to a received masked write command, the internal read command being generated one of (i) during a write latency associated with the received masked write command, (ii) after receipt of a first bit of masked write data among a plurality of bits of masked write data, and (iii) in synchronization with a rising or falling edge of a clock signal received with an address signal corresponding to the masked write command; reading, in response to the internal read command, a plurality of bits of data stored in a plurality of memory cells, the plurality of memory cells corresponding to the address signal; and storing, in response to an internal write command, the plurality of bits of masked write data in the plurality of memory cells.
摘要:
Provided are a level shifter and a semiconductor device having an OFF-chip driver (OCD) using the same. The level shifter includes a plurality of series connected logic gates receiving a first-state input signal having a first power supply voltage level and generating a level-shifted first-state output signal having a second power supply voltage level. The logic gates receive as power supply voltages at least one intermediate power supply voltage having at least one voltage level intermediate between the first power supply voltage level and the second power supply voltage level, and an intermediate power supply voltage applied to the present logic gate is equal to or higher than an intermediate power supply voltage applied to the previous logic gate.
摘要:
A programmable impedance control circuit for use in a semiconductor device having an impedance range shifting function prevents or substantially reduces an impedance detection failure based on an environment change. An impedance detector includes a first array driver, a second array driver, and an impedance matching transistor array and a range shifting transistor array independently controlled by the first and second array drivers. A comparator each compares first and second output voltage levels of the impedance detector with an array reference voltage, and outputs an up/down signal as the comparison result. A counter performs an up/down counting in response to the up/down signal, and outputs control code data. A range shifting circuit monitors a counting output of the counter and so generates range shifting data. Whereby, even if there is an environment change on a manufacturing process, power source voltage or operating temperature, etc., an impedance matching and correction operation can be performed without a waste of impedance matching transistor array and control code.